• Back Issues >
  • Top Stories of the Week >
  • April 29, 2024 - MWRF Today
  • April 29, 2024 - MWRF Today

    164118996 © Audrius Merfeldas | Dreamstime.com
    Components

    RF Components Form the Backbone of the Wireless Infrastructure

    April 29, 2024
    The incredibly complex and crowded spectrum would be unmanageable without the RF devices and components that populate the circuit boards in systems supporting its functionality...
    Products of the Week

    Products of the Week: April 29, 2024

    April 29, 2024
    Here's this week's selection of some of the most interesting new products that have been launched of late.
    Active components

    Good Vibrations: MEMS Sensor Grabs Voice Commands

    April 24, 2024
    See Knowles’s V2S200D digital voice-vibration sensor demoed in digital stethoscopes and automotive apps.
    Silicon Labs
    IOT

    Efficient Wireless SoC Built for Energy-Harvesting Apps

    April 24, 2024
    The xG22E family of wireless SoCs from Silicon Labs is its first family designed for battery-free, energy-harvesting applications.
    Test & Measurement

    Test's Evolution Mirrors the Wireless World (Download)

    April 16, 2024
    Members can download this free Microwaves & RF eBook that addresses test and measurement topics.

    More content from April 29, 2024 - MWRF Today

    Arctic Semiconductor
    Wireless

    Low-Power 4x4 RF Transceiver Handles Up/Down Conversions

    March 22, 2024
    The all-in-one transceiver performs multi-stage upconversion and downconversion from RF to digital and vice versa from 600 MHz to 7.2 GHz.
    Promo 2 Rhode
    Test & Measurement

    Oscilloscope or Analyzer? Choosing the Right Instrument for Your App

    March 24, 2022
    Can an oscilloscope replace an analyzer in microwave/mmWave applications? What are the limitations of an oscilloscope, and where does the signal and spectrum analyzer remain the...
    Image
    Analyzers

    The Evolution of Harmonic Load Pull

    Dec. 9, 2014
    Harmonic load-pull tuners are important systems for characterizing power transistors and amplifiers and finding the impedances needed for gaining optimum performance levels.