Technologies http://mwrf.com/taxonomy/term/6596/more en Clock Source Kills Jitter to 1.25 GHz http://mwrf.com/mixed-signal-semiconductors/clock-source-kills-jitter-125-ghz <div class="node-body article-body">This circuit distributes timing signals with minimal noise and jitter for analog and digital applications. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/mixed-signal-semiconductors/clock-source-kills-jitter-125-ghz" target="_blank">read more</a></p> http://mwrf.com/mixed-signal-semiconductors/clock-source-kills-jitter-125-ghz#comments Analog Devices Commercial Defense Industrial Mixed-signal semiconductors Fri, 19 Dec 2014 04:43:00 +0000 30531 at http://mwrf.com A Closer Look at RF Power Measurements http://mwrf.com/test-measurement-analyzers/closer-look-rf-power-measurements <div class="field-deck"> Because measuring RF/microwave power is one of the most commonly used methods of understanding system performance, detailed knowledge of how power measurements are made is key to successfully interpreting measurement results. </div> <div class="node-body article-body">Because measuring RF/microwave power is one of the most commonly used methods of understanding system performance, detailed knowledge of how power measurements are made is key to successfully interpreting measurement results.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/closer-look-rf-power-measurements" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/closer-look-rf-power-measurements#comments Automotive Commercial Defense Energy Industrial Medical Mobile RF Essentials Robotics Test & Measurement - analyzers Thu, 18 Dec 2014 21:00:00 +0000 30401 at http://mwrf.com Signal-Generation Advances Support Electronic Warfare’s Evolution http://mwrf.com/test-measurement-generators/signal-generation-advances-support-electronic-warfare-s-evolution <div class="field-deck"> As electronic threats grow and the electronic-warfare environment becomes more complex, new methods of generating and controlling EW signals are needed to maintain a modern war-force. </div> <div class="node-body article-body">As technology barriers are torn down to enable complex digital, analog, and RF integrated systems, software-defined radios and intelligently controlled radios are entering the battlespace as the next generation of EW technologies.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-generators/signal-generation-advances-support-electronic-warfare-s-evolution" target="_blank">read more</a></p> http://mwrf.com/test-measurement-generators/signal-generation-advances-support-electronic-warfare-s-evolution#comments Active components Defense Systems Test & Measurement - generators Thu, 18 Dec 2014 19:54:00 +0000 30411 at http://mwrf.com GaN HEMT Packs C-Band Power http://mwrf.com/active-components/gan-hemt-packs-c-band-power <div class="node-body article-body">This high-power transistor provides 200 W output power from 4.4 to 5.0 GHz.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/gan-hemt-packs-c-band-power" target="_blank">read more</a></p> http://mwrf.com/active-components/gan-hemt-packs-c-band-power#comments Cree Active components Commercial Defense Industrial Thu, 18 Dec 2014 17:14:00 +0000 30521 at http://mwrf.com MIMO Testing: The Good and the Bad http://mwrf.com/test-measurement/mimo-testing-good-and-bad <div class="field-byline"> Alessandro Scannavini, RF Engineer, Microwave Vision </div> <div class="field-deck"> The growing demand for bandwidth is increasing the requirements for MIMO technology, and thus the testing of MIMO devices. </div> <div class="node-body article-body">As MIMO devices are increasingly sought to solve throughput demand problem, more antennas are being included in the device design. This complexity is augmenting the value of automated methods for performing MIMO test.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/mimo-testing-good-and-bad" target="_blank">read more</a></p> http://mwrf.com/test-measurement/mimo-testing-good-and-bad#comments Commercial Test & Measurement Test & Measurement - analyzers Test & Measurement - generators Wed, 17 Dec 2014 16:48:00 +0000 30541 at http://mwrf.com InP Resonant Tunneling Diodes Drop LNA Noise Figure http://mwrf.com/active-components/inp-resonant-tunneling-diodes-drop-lna-noise-figure <div class="node-body article-body">By using resonant tunneling diodes in a negative-differential-conductance-style LNA, researchers from the Korea Advanced Institute of Science and Technology (KAIST) were able to reach a high gain-to-DC power ratio with a very low noise figure.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/inp-resonant-tunneling-diodes-drop-lna-noise-figure" target="_blank">read more</a></p> http://mwrf.com/active-components/inp-resonant-tunneling-diodes-drop-lna-noise-figure#comments Active components Automotive Commercial Defense Energy Industrial Medical Mobile Robotics Mon, 15 Dec 2014 19:47:00 +0000 30501 at http://mwrf.com MIMO Radar Could Outperform Phased-Array Radar http://mwrf.com/active-components/mimo-radar-could-outperform-phased-array-radar <div class="node-body article-body">In Sweden, researchers studied the potential benefits of spatially diverse MIMO radar compared to standard phased-array radar.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/mimo-radar-could-outperform-phased-array-radar" target="_blank">read more</a></p> http://mwrf.com/active-components/mimo-radar-could-outperform-phased-array-radar#comments Active components Defense Mon, 15 Dec 2014 19:26:00 +0000 30511 at http://mwrf.com De-Embed Parasitics from Millimeter-Wave ICs http://mwrf.com/test-measurement-analyzers/de-embed-parasitics-millimeter-wave-ics <div class="node-body article-body">Using a half-thru transmission-line method, researchers from Grenoble, France, were able to accurately de-embed pad-interconnect and parasitic effects at millimeter-wave frequencies.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/de-embed-parasitics-millimeter-wave-ics" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/de-embed-parasitics-millimeter-wave-ics#comments Automotive Commercial Defense Energy Industrial Medical Mobile Robotics Test & Measurement - analyzers Mon, 15 Dec 2014 16:17:00 +0000 30491 at http://mwrf.com Tips for Biasing MMIC Amplifiers http://mwrf.com/active-components/tips-biasing-mmic-amplifiers <div class="node-body article-body">Not all applications can be served by pre-biased MMIC amplifiers. As a result, knowing the proper techniques to bias a variety of amplifier types could ease the transition to using MMIC components.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/tips-biasing-mmic-amplifiers" target="_blank">read more</a></p> http://mwrf.com/active-components/tips-biasing-mmic-amplifiers#comments Active components Automotive Commercial Defense Energy Industrial Medical Mobile Robotics Mon, 15 Dec 2014 15:29:00 +0000 30471 at http://mwrf.com <p>The significant benefit of a cascade-distributed amplifier is the increased operational bandwidth derived from the duplicated cell of two FETs connected source to drain.</p> Cut the Cost of Wireless Manufacturing Test http://mwrf.com/test-measurement-analyzers/cut-cost-wireless-manufacturing-test <div class="node-body article-body">With the increase in electronic devices that incorporate wireless technology, reducing the time and cost of test is of ever greater importance and an even more significant challenge.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/cut-cost-wireless-manufacturing-test" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/cut-cost-wireless-manufacturing-test#comments Commercial Industrial Test & Measurement - analyzers Mon, 15 Dec 2014 15:14:00 +0000 30481 at http://mwrf.com <p>Using a multi-test mainframe could enable wireless manufacturers to test several devices simultaneously, ultimately lowering manufacturing cost and test time.</p>