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  • Mar 27, 2014
    webinar

    Simulation-Measurement Workflow for DDR Compliance

    Live Webinar: March 27, 2014 at 1 p.m. ET / 10 a.m. PT | This webcast discusses Agilent DDR3 and DDR4 compliance test applications using both pre-silicon simulated waveforms and post-silicon measured waveforms, with emphasis on correlating simulation with measurement. We will describe a methodology for simulating the full path from memory controller to DRAM solder ball. A simulation-measurement correlation methodology called “Waveform Bridge” is discussed where DQ and DQS waveforms in both pre-layout and post-layout simulations are used to feed a DDR compliance test app....More
  • Mar 12, 2014
    webinar

    Do You Have What it Takes to Test HDMI 2.0?

    Live Webinar: March 12, 2014 at 1 p.m. ET/10am PT | In this webcast, we will provide an HDMI 2.0 technical overview as well as cover the latest physical layer testing requirements for HDMI 2.0 as well as the previous specification (HDMI 1.4b). Join us to learn about the new testing requirements and what it takes to stay ahead of HDMI physical layer testing challenges....More
  • Feb 27, 2014
    webinar

    Endless Application Possibilities with Near Field Communication (NFC)

    Live Webinar: February 27, 2014 at 10 a.m. ET/ 7 a.m. PT | Gone are the days of setting up wireless connectivity manually. Near Field Communication (NFC) technology is taking off, and the proliferation of smart phones, tablets and notebooks is driving the integration of NFC into many other end products and devices. These applications include contactless, mobile payments; Bluetooth / Wi-Fi device pairing; and advanced sensor transponders which communicate through NFC....More
  • Feb 19, 2014
    webinar

    SFP+ and 10GBASE-KR Transmitter Compliance Using Real-time and Sampling Oscilloscopes

    As cloud computing and data centers expand more and more network hardware will need to be interconnected through fiber and backplane connections. The SFF-8431 and IEEE 802.3ap specifications keep these technologies humming through tight tolerances that are required from all SFP+ and 10GBASE-KR applications....More
  • Jan 23, 2014
    webinar

    Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements

    Live Webinar: January 23, 2014 at 1 p.m. ET/10am PT | Gone are the days when IC pins were accessible and when bit rates were low enough that the probe loading was negligible. Today’s high density BGA packages and multi-gigabit/s data rates present twin challenges to signal integrity engineers who want to measure the eye diagram at the IC solder bump....More
  • Jan 9, 2014
    webinar

    The Fundamentals of Fast Pulsed IV Measurement

    Live Webinar: January 9, 2014 at 1 p.m. ET | In this webcast Agilent Technologies will cover all of the basics of fast pulsed IV measurement including: • An overview of pulsed measurement solution options • The pros and cons of DC probes versus RF probes for on-wafer measurement • Proper structure design practices to optimize on-wafer measurements • General tips and tricks to improve high-speed measurement results • Examples of high-speed IV measurement applications (NBTI/PBTI, RTS noise, etc....More
  • Dec 17, 2013
    webinar

    GaN Roundtable: Doherty Amplifiers and GaN Device Technology

    Featuring presenters from some of the leading GaN manufacturers in the microwave industry, this webcast roundtable will provide the latest information on GaN power transistors and ICs and how they are driving Doherty-amplifier performance for wireless communications and many other applications. Learn about the state of the art in today’s Doherty amplifiers and the GaN devices that are making these enhanced performance levels possible. This roundtable also will give you a chance to find out what lies ahead for both Doherty amplifiers and GaN device technology....More
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