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  • Sep 1, 2015

    Advanced Measurement and Analysis using InfiniiVision X-Series Oscilloscopes

    Once you are able to identify and isolate a signal error in your design, what are some techniques you can employ to determine the root cause? Learn how Keysight oscilloscopes can help you analyze signals and hunt down the culprit of various common signal integrity issues in your designs....More
  • Aug 20, 2015

    The Continuing Adventures of CMOS Technology - Power and Linearity at Microwave Frequencies

    Since its invention in 1963, complementary metal–oxide–semiconductor (CMOS) technology has been the underdog of technologies and has had to prove itself against incumbent technologies. Leveraging the simple, yet capital-intensive concept of gate length scaling, CMOS has continued to take over markets once thought owned by the entrenched technologies....More
  • Jul 23, 2015

    How to Use a SERDES Channel Simulator for PAM-4 Simulations and Analysis

    As people use more and more apps on their phones, tablets, computers, and IoT devices, the network needed to deliver the data is constantly being upgraded. PAM-4 signaling is a leading contender for implementing the 56G lane data rate which will enable 400G links and fuel the next upgrade in network bandwidth....More
  • Jun 24, 2015

    Automating Semiconductor and Power Semiconductor Device Testing

    Automating semiconductor and power semiconductor (including wide band gap) device testing presents a number of measurement challenges. In addition to hardware issues such as cabling, fixturing and instrument synchronization, developing the necessary software to integrate everything together can be a daunting task. Keysight and its solution partners can help you meet these unique test challenges, from the development of a turnkey solution to the re-engineering of an existing platform....More
  • Jun 25, 2015

    Successfully Make Power and AC Line Disturbance Measurements

    If you are developing or evaluating products or devices that use AC or DC power conversion technology, there are a variety of power measurements of interest. In addition to measuring the standard power parameters such as watts, VA, VAR, power factor, crest factor, and efficiency, evaluating the response of your device to AC line disturbances such as surges, sags, brownouts, cycle dropouts, and transients is critical....More
  • Jun 16, 2015

    Tips and Techniques for Making the Best Oscilloscope Measurements

    Learn how to get the most out of your oscilloscope measurements. When debugging or validating your design, it is important to understand both the measurement capabilities of your oscilloscope and the different factors that influence the effectiveness of specific measurements....More
  • Jun 17, 2015

    Validate PCIe® Power Saving with L1 Substate Analysis

    Today's PCI Express designs must consider power efficiency in order to meet the low power needs of many PCIe® based computing devices. Optimizing designs for divergent applications requires complete protocol insight into the trade-off of performance versus power consumption....More
  • Jun 18, 2015

    Optimizing Battery Run and Charge Times of Today’s Mobile Wireless Devices

    Today’s smart mobile wireless devices have amazing capabilities enabling to perform a myriad of advanced applications. However, their power consumption has grown considerably as a result. Providing acceptable battery run-time is more important than ever, and, with much larger batteries, providing an acceptable charging time has now become another top priority....More
  • Jun 23, 2015

    MIPI – Overcome Test Challenges to Ensure Interoperability for your PHY

    Various physical layer standards are developed by Mobile Industry Processor Interface (MIPI) Alliance standards body to address performance and power requirements in mobile applications. With physical data rates extended to 4.5 Gb/s for D-PHY, 11.6 Gb/s for M-PHY and 2.5 GSym/s for C-PHY, signal integrity will be critical to guarantee interoperability....More
  • May 28, 2015

    Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model

    For multigigabit data links in data centers, opto-electronic links are replacing traditional copper, which has severe attenuation at high frequencies. In this webcast we present an efficient way to model such links....More
  • May 27, 2015

    DisplayPort 1.3 – PHY Layer Test Requirements

    The Video Electronics Standards Association (VESA) has released the latest DisplayPort specification v1.3, and with it comes new capabilities and an increase in data rates. As data rates increase the margins decrease in your link and in your validation processes while the complexity in the test process increases....More
  • May 19, 2015

    Perform Power Supply Frequency Response Analysis using an Oscilloscope

    Today’s power supplies are much more than full-wave rectifiers with filtered outputs. DC-to-DC converters such as switch mode power supplies (SMPS), step-down linear regulators, and LDOs, include negative feedback networks and amplifiers for precise regulation....More
  • May 13, 2015

    MIPI Physical Layer Standards and Receiver Test Solutions

    The MIPI Alliance supports the mobile industry by establishing standard interfaces for mobile devices. Demand for higher aggregate bandwidth is satisfied with increased data rate ranges of existing D- and M-PHY interfaces, as well as the new C-PHY interface, that offers multiple bit transmission per unit interval....More
  • Apr 29, 2015

    Phase Noise Measurement Techniques

    Phase noise can be a limiting parameter on system performance of many types of systems. As radar precision and communication data rates (and correspondingly, modulation complexity) have increased, low phase noise oscillators and instrumentation to accurately measure has never been more important....More

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The Continuing Adventures of CMOS Technology - Power and Linearity at Microwave Frequencies
August 20, 2015 @ 2 pm EST
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