White Paper http://mwrf.com/taxonomy/term/6611/more en Modern VNA Test Solutions Improve On-Wafer Measurement Efficiency http://mwrf.com/test-measurement-analyzers/modern-vna-test-solutions-improve-wafer-measurement-efficiency <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using vector network analyzers, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/modern-vna-test-solutions-improve-wafer-measurement-efficiency" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/modern-vna-test-solutions-improve-wafer-measurement-efficiency#comments Test & Measurement - analyzers White Paper Tue, 21 Oct 2014 14:12:00 +0000 29361 at http://mwrf.com Does Your Design Match Your Test? http://mwrf.com/white-paper/does-your-design-match-your-test <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Characterizing passive and active RF components, while matching the test results to the design simulations, is a challenge throughout the industry. Matching test results to design values requires a very high degree of accuracy, repeatability, and usability all leading to absolute confidence in the performed measurements and their results. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/does-your-design-match-your-test" target="_blank">read more</a></p> http://mwrf.com/white-paper/does-your-design-match-your-test#comments White Paper Wed, 15 Oct 2014 14:25:00 +0000 29221 at http://mwrf.com Effectively Maintaining and Troubleshooting Military Communication Systems Application Note http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">This application note focuses on the “what” and “how” of effective testing in pursuit of optimum performance in military communication systems. Two examples will highlight what’s possible: field test and verification of radar systems; and testing of VHF/UHF radios. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat" target="_blank">read more</a></p> http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 20:03:00 +0000 29081 at http://mwrf.com Radar Fundamentals Poster http://mwrf.com/test-measurement/radar-fundamentals-poster <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">Check out the core elements of radar test; radar block diagram, basic equations, military nomenclature, pulse compression techniques, radar-frequency letter bands and the latest Keysight radar equipment. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/radar-fundamentals-poster" target="_blank">read more</a></p> http://mwrf.com/test-measurement/radar-fundamentals-poster#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 19:59:00 +0000 29071 at http://mwrf.com Satellite Test Essentials Poster http://mwrf.com/test-measurement/satellite-test-essentials-poster <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">This colorful and informative poster graphs atmospheric absorption of mm waves, shows frequency allocations, noise power ratio and calculations for link budget along with the latest satellite test solutions from Keysight. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/satellite-test-essentials-poster" target="_blank">read more</a></p> http://mwrf.com/test-measurement/satellite-test-essentials-poster#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 19:00:00 +0000 29061 at http://mwrf.com A New Paradigm for Mid-Lifecycle Design Changes http://mwrf.com/active-components/new-paradigm-mid-lifecycle-design-changes <div class="field-deck"> Sponsored by: Sparton </div> <div class="node-body article-body">For decades, replacing key components during the mid-lifecycle design refresh was seen as simply too costly and burdensome. Changes had to wait until the next generation. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/new-paradigm-mid-lifecycle-design-changes" target="_blank">read more</a></p> http://mwrf.com/active-components/new-paradigm-mid-lifecycle-design-changes#comments Active components Systems White Paper Tue, 30 Sep 2014 18:10:00 +0000 28771 at http://mwrf.com Load Pull Validation of Large Signal Cree GaN Field Effect Transistor (FET) Model http://mwrf.com/active-components/load-pull-validation-large-signal-cree-gan-field-effect-transistor-fet-model <div class="field-deck"> Sponsored by: Cree </div> <div class="node-body article-body">To reduce power amplifier design iterations and development costs, RF design engineers require large signal models for RF power transistors, validated with measured performance parameters, to provide fast, accurate evaluation of amplifier designs using simulation tools.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/load-pull-validation-large-signal-cree-gan-field-effect-transistor-fet-model" target="_blank">read more</a></p> http://mwrf.com/active-components/load-pull-validation-large-signal-cree-gan-field-effect-transistor-fet-model#comments Active components White Paper Tue, 16 Sep 2014 18:53:00 +0000 28541 at http://mwrf.com Modern Architecture Advances Vector Network Analyzer Performance http://mwrf.com/test-measurement-analyzers/modern-architecture-advances-vector-network-analyzer-performance <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/modern-architecture-advances-vector-network-analyzer-performance" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/modern-architecture-advances-vector-network-analyzer-performance#comments Test & Measurement - analyzers Test & Measurement - generators White Paper Fri, 08 Aug 2014 13:05:00 +0000 27601 at http://mwrf.com Making the Most of Power Amplifier Measurements http://mwrf.com/white-paper/making-most-power-amplifier-measurements <div class="field-deck"> Sponsored by: National Instruments </div> <div class="node-body article-body">Evaluating RF/microwave power amplifier performance requires an assortment of tests as well as the right equipment to perform those measurements quickly and accurately. Power amplifiers (PAs) are designed to boost the levels of many different types of signals in communications and other systems and are vital components in these systems.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/making-most-power-amplifier-measurements" target="_blank">read more</a></p> http://mwrf.com/white-paper/making-most-power-amplifier-measurements#comments White Paper Mon, 04 Aug 2014 14:12:00 +0000 27591 at http://mwrf.com New 5G White Paper: Evolutionary & Disruptive Visions Towards Ultra High Capacity Networks http://mwrf.com/white-paper/new-5g-white-paper-evolutionary-disruptive-visions-towards-ultra-high-capacity-networks <div class="node-body article-body"><p><img alt="" src="/site-files/mwrf.com/files/uploads/2014/07/Keysight_Signature_Pref_Color.png" style="width: 200px; height: 71px; float: right; margin: 5px;" />With many groups now beginning to consider the drivers for 5th Generation wireless networks, this timely document includes contributions from 20 IWPC member organizations from around the world and aims to advance certain understandings and concepts for adoption in wireless systems to be deployed beyond the year 2020. &nbsp; This 89 page document covers a broad range of 5G topics with emphasis on mm-wave.</p></div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/new-5g-white-paper-evolutionary-disruptive-visions-towards-ultra-high-capacity-networks" target="_blank">read more</a></p> http://mwrf.com/white-paper/new-5g-white-paper-evolutionary-disruptive-visions-towards-ultra-high-capacity-networks#comments White Paper Thu, 31 Jul 2014 16:40:00 +0000 27511 at http://mwrf.com