White Paper http://mwrf.com/taxonomy/term/6611/more en Integration and Operational Guidelines for MEMS-Based Inertial Systems: Applications that include magnetometers http://mwrf.com/active-components/integration-and-operational-guidelines-mems-based-inertial-systems-applications-in <div class="field-deck"> Sponsored by: Sparton </div> <div class="node-body article-body">High-performance inertial systems provide accurate platform heading information in a variety of applications and operational environments. However, the magnetometers used are susceptible to measurement distortion in the presence of any magnetic material. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/integration-and-operational-guidelines-mems-based-inertial-systems-applications-in" target="_blank">read more</a></p> http://mwrf.com/active-components/integration-and-operational-guidelines-mems-based-inertial-systems-applications-in#comments Active components Systems White Paper Mon, 30 Mar 2015 21:46:00 +0000 32891 at http://mwrf.com SWaP-C and Why Your Component Partner Matters http://mwrf.com/active-components/swap-c-and-why-your-component-partner-matters <div class="field-deck"> Sponsored by: Sparton </div> <div class="node-body article-body">How can you get maximum SWaP-C benefit with minimal fuss? By choosing the right contract manufacturer. Read our white paper to learn why SWaP-C matters, the challenges involved, and techniques for ensuring that you choose the right partner for your project.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/swap-c-and-why-your-component-partner-matters" target="_blank">read more</a></p> http://mwrf.com/active-components/swap-c-and-why-your-component-partner-matters#comments Active components Systems White Paper Mon, 30 Mar 2015 21:46:00 +0000 32901 at http://mwrf.com Envelope Tracking and Digital Pre-Distortion Test Solution for RF Amplifiers http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">An increasing number of power amplifiers (PA) support the envelope tracking (ET) technology in order to reduce power consumption and improve efficiency. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers" target="_blank">read more</a></p> http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32781 at http://mwrf.com Power Added Efficiency Measurement http://mwrf.com/active-components/power-added-efficiency-measurement <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Besides the four s-parameters, hot-s22 and stability, the Power Added Efficiency (PAE) is a key parameter for amplifier which represents how efficient the amplifier converts DC energy to RF energy.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/power-added-efficiency-measurement" target="_blank">read more</a></p> http://mwrf.com/active-components/power-added-efficiency-measurement#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32791 at http://mwrf.com Testing S-Parameters on Pulsed Radar Power Amplifier Modules http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">In many cases, devices need to be characterized using pulsed instead of CW signals. Be it for on-wafer measurement of power amplifiers, where heat sinks are difficult or even impossible to implement, for power amplifier modules for pulsed radar systems or other applications. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules" target="_blank">read more</a></p> http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32801 at http://mwrf.com Design FAQ: GaN Reaches into a Spectrum of Markets http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets <div class="field-deck"> Sponsored by: Qorvo </div> <div class="node-body article-body">What types of GaN devices are available in the RF market today? With any semiconductor technology, proper thermal management is important to the overall reliability of the device.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets" target="_blank">read more</a></p> http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets#comments White Paper Fri, 13 Mar 2015 16:32:00 +0000 32581 at http://mwrf.com Simulating Radar System Performance http://mwrf.com/defense/simulating-radar-system-performance <div class="field-deck"> Sponsored by: National Instruments </div> <div class="node-body article-body">As radar technology continues to evolve and expand, radar design requires effective simulation of a myriad of waveform modifications needed for different systems.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/defense/simulating-radar-system-performance" target="_blank">read more</a></p> http://mwrf.com/defense/simulating-radar-system-performance#comments Components Defense White Paper Thu, 26 Feb 2015 19:36:00 +0000 31911 at http://mwrf.com Lowering the Cost of Wireless Manufacturing Test http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">This white paper covers the basics of non-signaling test from 10 MHz to 6 GHz, the technology models of implementing a non-signaling test setup, approaches to lowering the overall test cost, as well as turnkey chipset-specific calibration and verification solution.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31861 at http://mwrf.com Neighbor Cell Detection Test http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">With more and more radio technologies introduced, as well as the concept of HetNet, the testing for mobile devices becomes ever increasingly complex. A cellular phone’s neighbor cell detection capability is important to its overall performance, not only for mobility behavior such as re-selection and handover but also for cellular-assisted location estimation.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31871 at http://mwrf.com Understanding Carrier Aggregation http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">This paper discusses Carrier Aggregation (CA) evolution in HSPA and LTE Networks, the implication on the architecture and the User Equipment. It also discusses the testing method to </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31881 at http://mwrf.com