Webcasts http://mwrf.com/taxonomy/term/6612/more en Tips for Successfully Integrating and Passing WLAN Regulatory Tests http://mwrf.com/webinar/tips-successfully-integrating-and-passing-wlan-regulatory-tests <div class="field-deck"> Sponsored by Tektronix </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Tektronix-Webinar-04082014.jpg?1395250988" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, April 8, 2014 - <span class="date-display-start">14:00</span><span class="date-display-separator"> - </span><span class="date-display-end">15:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><img alt="Robin Jackman" src="https://event.on24.com/event/76/68/19/rt/1/logo/register/robin_jackman85x110.jpg" /></p> <p><span class="style3"><strong>Robin Jackman</strong></span><br /> <span class="style3">Senior Application Engineer<br /> Tektronix</span></p> </div> </fieldset> <div class="node-body webinar-body">Live Webinar: April 8, 2014 at 2 p.m. ET / 11 a.m. PT | If you’re integrating a WLAN radio into your design, you probably have questions on how to pass compliance tests for FCC regulations. Surprisingly, only 1 in 10 engineers pass the first time. And failing is expensive and translates to project delays.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/tips-successfully-integrating-and-passing-wlan-regulatory-tests" target="_blank">read more</a></p> Webcasts Wed, 19 Mar 2014 17:24:00 +0000 23661 at http://mwrf.com MIPI Physical Layer Transmitter Test Solutions http://mwrf.com/webinar/mipi-physical-layer-transmitter-test-solutions <div class="field-deck"> Sponsored by Agilent Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Agilent-Webinar-04022014.jpg?1393878741" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, April 2, 2014 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">17:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><span style="font-size:12pt"><strong>Hosted By:</strong></span><br /> <img alt="Hosted by: Electronic Design and Microwaves &amp; RF" border="0" height="100" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2014/HostedBy-ED_MWRF.png" width="450" /></p> <!-- SPEAKER BIO 1 PHOTO --> <p><span style="font-size:12pt"><strong>Presented By:</strong></span></p> <p><img alt="Min-jie Chong" src="http://event.on24.com/event/73/08/48/rt/1/logo/lobby/chong_85x100.jpg" /></p> <p><span style="font-size:11pt; font-weight:700;">Min-jie Chong</span><br /> <span style="font-size:10.5pt;">Product Manager for Mobile Interface<br /> and Storage Test Solutions</span><br /> <span style="font-size:10.5pt;"><strong>Agilent Technologies</strong></span></p> </div> </fieldset> <div class="node-body webinar-body">Live Webinar: April 2, 2014 at 1 p.m. ET / 10 a.m. PT | New physical standards are being developed by Mobile Industry Processor Interface (MIPI) Alliance standards body, which standardizes interfaces for mobile applications and designs. Additional capabilities and data rate extensions will be added to the existing D-PHY and M-PHY specifications to push the performance envelope. A new C-PHY specification will also be created, which is based on a new 3-wire multi-level signaling scheme to achieve higher performance through higher bits/symbol. If you are developing or validating the transmitters of these new MIPI physical layers, you'll want to attend this webcast to understand the new test challenges as well as the solutions. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/mipi-physical-layer-transmitter-test-solutions" target="_blank">read more</a></p> Webcasts Mon, 03 Mar 2014 20:13:00 +0000 23101 at http://mwrf.com Simulation-Measurement Workflow for DDR Compliance http://mwrf.com/webinar/simulation-measurement-workflow-ddr-compliance <div class="field-deck"> Sponsored By: Agilent Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Agilent-Webinar-03272014.jpg?1392305537" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, March 27, 2014 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-time-description"> 1-Hour Webcast </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-cost"> <span>Cost:&nbsp;</span> Free </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><span style="font-size:12pt"><strong>Hosted By:</strong></span><br /> <img alt="Hosted by: Electronic Design and Microwaves &amp; RF" border="0" height="100" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2014/HostedBy-ED_MWRF.png" width="450" /></p> <p><span style="font-size:12pt"><strong>Presented By:</strong></span></p> <p><img alt="Steve Chen" src="https://event.on24.com/event/74/43/67/rt/1/logo/register/ed_chen_steve.jpg" /></p> <p class="style71"><span style="font-size:10.5pt;">Steve Chen</span><br /> <span class="style71">R&amp;D Section Manager</span><br /> <span class="style71"><strong>Agilent Technologies</strong></span></p> </div> </fieldset> <div class="node-body webinar-body">Live Webinar: March 27, 2014 at 1 p.m. ET / 10 a.m. PT | This webcast discusses Agilent DDR3 and DDR4 compliance test applications using both pre-silicon simulated waveforms and post-silicon measured waveforms, with emphasis on correlating simulation with measurement. We will describe a methodology for simulating the full path from memory controller to DRAM solder ball. A simulation-measurement correlation methodology called “Waveform Bridge” is discussed where DQ and DQS waveforms in both pre-layout and post-layout simulations are used to feed a DDR compliance test app.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/simulation-measurement-workflow-ddr-compliance" target="_blank">read more</a></p> Webcasts Thu, 13 Feb 2014 15:15:00 +0000 22731 at http://mwrf.com Do You Have What it Takes to Test HDMI 2.0? http://mwrf.com/webinar/do-you-have-what-it-takes-test-hdmi-20 <div class="field-deck"> Sponsored By: Agilent Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Agilent-Webinar-03122014.jpg?1392304310" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, March 12, 2014 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">17:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><span style="font-size:12pt"><strong>Presented By:</strong></span><br /> <img alt="Hosted by: Electronic Design and Microwaves &amp; RF" border="0" height="100" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2014/HostedBy-ED_MWRF.png" width="450" /></p> </div> </fieldset> <div class="node-body webinar-body">Live Webinar: March 12, 2014 at 1 p.m. ET/10am PT | In this webcast, we will provide an HDMI 2.0 technical overview as well as cover the latest physical layer testing requirements for HDMI 2.0 as well as the previous specification (HDMI 1.4b). Join us to learn about the new testing requirements and what it takes to stay ahead of HDMI physical layer testing challenges.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/do-you-have-what-it-takes-test-hdmi-20" target="_blank">read more</a></p> Webcasts Thu, 13 Feb 2014 14:33:00 +0000 22721 at http://mwrf.com Endless Application Possibilities with Near Field Communication (NFC) http://mwrf.com/webinar/endless-application-possibilities-near-field-communication-nfc <div class="field-deck"> Sponsored By: Digi-Key and Texas Instruments </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-DigiKey-TI-02272014.jpg?1391524734" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, February 27, 2014 - <span class="date-display-start">10:00</span><span class="date-display-separator"> - </span><span class="date-display-end">17:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><span style="font-size:12pt"><strong>Presented By:</strong></span></p> <p><img src="https://event.on24.com/event/74/40/52/rt/1/logo/register/ed_ulrichdenk.jpg" /></p> <p><span style="font-size:10.5pt">Ulrich Denk</span><br /> <span class="style71">NFC Product Manager<br /> <strong>Texas Instruments</strong></span></p> </div> </fieldset> <div class="node-body webinar-body">Live Webinar: February 27, 2014 at 10 a.m. ET/ 7 a.m. PT | Gone are the days of setting up wireless connectivity manually. Near Field Communication (NFC) technology is taking off, and the proliferation of smart phones, tablets and notebooks is driving the integration of NFC into many other end products and devices. These applications include contactless, mobile payments; Bluetooth / Wi-Fi device pairing; and advanced sensor transponders which communicate through NFC. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/endless-application-possibilities-near-field-communication-nfc" target="_blank">read more</a></p> Webcasts Tue, 04 Feb 2014 14:35:00 +0000 22371 at http://mwrf.com SFP+ and 10GBASE-KR Transmitter Compliance Using Real-time and Sampling Oscilloscopes http://mwrf.com/webinar/sfp-and-10gbase-kr-transmitter-compliance-using-real-time-and-sampling-oscilloscopes <div class="field-deck"> Sponsored By: Agilent Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Agilent-Webinar-02192014.jpg?1391456895" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, February 19, 2014 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">18:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><span class="style3"><strong>Presented By:</strong></span></p> <table border="0" width="550"> <tbody> <tr valign="top"> <td align="left" width="225"> <p><img src="https://event.on24.com/event/73/07/07/rt/1/logo/register/ed_alexbailes.jpg" /></p> <p><span class="style3"><strong>Alex Bailes</strong><br /> Product Manager for Ethernet and Wireline Applications<br /> Agilent Technologies, Inc.</span></p> </td> <td align="left" width="225"> <p><img src="https://event.on24.com/event/73/07/07/rt/1/logo/register/ed_bobhasenick.jpg" /></p> <p><span class="style3"><strong>Bob Hasenick</strong><br /> Technical Consultant<br /> Agilent Technologies, Inc.</span></p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">As cloud computing and data centers expand more and more network hardware will need to be interconnected through fiber and backplane connections. The SFF-8431 and IEEE 802.3ap specifications keep these technologies humming through tight tolerances that are required from all SFP+ and 10GBASE-KR applications.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/sfp-and-10gbase-kr-transmitter-compliance-using-real-time-and-sampling-oscilloscopes" target="_blank">read more</a></p> Webcasts Mon, 03 Feb 2014 19:40:00 +0000 22361 at http://mwrf.com Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements http://mwrf.com/webinar/fixture-de-embedding-techniques-28-gbs-transmitter-measurements <div class="field-deck"> Sponsored by: Agilent Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Agilent-Webinar-01232014.jpg?1389387361" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, January 23, 2014 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">18:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table> <tbody> <tr> <td> <p><strong>Hosted By:</strong><br /> <img border="0" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2013/12/ed-mwrf-hosted-400.png" /></p> </td> </tr> </tbody> </table> <table width="405"> <tbody> <tr> <td valign="top" width="200"> <p><strong>Presented By:</strong></p> <p><img alt="image" border="0" src="https://event.on24.com/event/73/50/63/rt/1/logo/register/ed_robertsleigh.jpg" /></p> <p><b><span style="font-size:10.5pt">Rob Sleigh</span></b><br /> <span class="style71">Product Marketing Engineer</span><br /> <span class="style71"><b>Agilent Technologies</b></span></p> </td> <td valign="top" width="200"> <p><strong>Presented By:</strong></p> <p><img alt="image" border="0" src="https://event.on24.com/event/73/50/63/rt/1/logo/register/ed_heidibarnes.jpg" /></p> <p><b><span style="font-size:10.5pt">Heidi Barnes</span></b><br /> <span class="style71">Senior Application Engineer</span><br /> <span class="style71"><b>Agilent EEsof EDA</b></span></p> </td> </tr> <tr> <td colspan="2" width="400"> <p><img alt="image" border="0" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2014/01/webinar-speaker-JackC-200.jpg" width="80px" /></p> <p><b><span style="font-size:10.5pt">Jack Carrel</span></b><br /> <span class="style71">Application Engineer</span><br /> <span class="style71"><b>Xilinx</b></span></p> </td> </tr> </tbody> </table> <p>&nbsp;</p> </div> </fieldset> <div class="node-body webinar-body">Live Webinar: January 23, 2014 at 1 p.m. ET/10am PT | Gone are the days when IC pins were accessible and when bit rates were low enough that the probe loading was negligible. Today’s high density BGA packages and multi-gigabit/s data rates present twin challenges to signal integrity engineers who want to measure the eye diagram at the IC solder bump. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/fixture-de-embedding-techniques-28-gbs-transmitter-measurements" target="_blank">read more</a></p> Webcasts Mon, 30 Dec 2013 20:01:00 +0000 21381 at http://mwrf.com The Fundamentals of Fast Pulsed IV Measurement http://mwrf.com/webinar/fundamentals-fast-pulsed-iv-measurement <div class="field-deck"> Hosted By: Electronic Design & MicroWaves & RF | Sponsored By: Agilent Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Agilent-Webinar-01092014.jpg?1387381121" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, January 9, 2014 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">18:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table> <tbody> <tr> <td> <p><strong>Hosted By:</strong><br /> <img border="0" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2013/12/ed-mwrf-hosted-400.png" /></p> </td> </tr> </tbody> </table> <table width="405"> <tbody> <tr> <td valign="top" width="200"> <p><strong>Presented By:</strong></p> <p><img alt="image" border="0" height="100" src="http://www.penton.com/webcasts/ED_AlanHeadshot10292013.jpg" width="80" /></p> <p><b><span style="font-size:10.5pt">Alan Wadsworth</span></b><br /> <span class="style71">Market Development Manager</span><br /> <span class="style71"><b>Agilent Technologies</b></span></p> </td> <td valign="top" width="200"> <p><strong>Moderated By:</strong></p> <p><img alt="image" border="0" height="100" src="http://www.penton.com/webcasts/tuite.jpg" width="90" /></p> <p><b><span style="font-size:10.5pt">Don Tuite</span></b><br /> <span class="style71">Editor </span><br /> <span class="style71"><b><i>Electronic Design</i></b></span></p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Live Webinar: January 9, 2014 at 1 p.m. ET | In this webcast Agilent Technologies will cover all of the basics of fast pulsed IV measurement including: • An overview of pulsed measurement solution options • The pros and cons of DC probes versus RF probes for on-wafer measurement • Proper structure design practices to optimize on-wafer measurements • General tips and tricks to improve high-speed measurement results • Examples of high-speed IV measurement applications (NBTI/PBTI, RTS noise, etc.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/fundamentals-fast-pulsed-iv-measurement" target="_blank">read more</a></p> Webcasts Wed, 18 Dec 2013 15:31:00 +0000 21041 at http://mwrf.com GaN Roundtable: Doherty Amplifiers and GaN Device Technology http://mwrf.com/webinar/gan-roundtable-doherty-amplifiers-and-gan-device-technology <div class="field-deck"> Sponsored by: TriQuint, Freescale, MACOM & Cree </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-GaN-Roundtable-Cree-freescale-macom-triquint-OnDemand2.jpg?1387381520" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, December 17, 2013 - <span class="date-display-start">15:28</span><span class="date-display-separator"> - </span><span class="date-display-end">15:29</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> On-Demand Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><strong>The Panel:</strong></p> <table border="0" cellpadding="2" cellspacing="0" width="100%"> <tbody> <tr> <td colspan="2" width="350px"> <img align="left" hspace="5" src="http://mwrf.com/site-files/mwrf.com/files/uploads/2013/12/nfriedrich.jpg" /><b><a class="bioTitle" name="bio18193028">Moderated by: Nancy Friedrich</a></b><br /> Editor in Chief, MicroWaves &amp; RF</td> </tr> </tbody> </table> <table border="0" cellpadding="2" cellspacing="0" width="100%"> <tbody> <tr> <td width="350px"> <img align="left" hspace="5" src="http://event.on24.com/event/68/13/76/rt/1/speakerbios/speakerbios_customHTML1_1/mwrf_krvavac.jpg" /><b><a class="bioTitle" name="bio18193028">Enver Krvavac</a></b><br /> Design Manager for Freescale&rsquo;s RF Advanced Development Technology group.</td> <td width="350px"> <img align="left" hspace="5" src="http://event.on24.com/event/68/13/76/rt/1/speakerbios/speakerbios_customHTML1_2/mwrf_mziehl.jpg" /><b><a class="bioTitle" name="bio18193029">Michael Ziehl </a></b><br /> Director of Technical Marketing for MACOM</td> </tr> <tr> <td> <img border="0" height="5" src="http://wcc.on24.com/eventManager/images/clear.gif" width="1" /></td> </tr> </tbody> </table> <table border="0" cellpadding="2" cellspacing="0" width="100%"> <tbody> <tr> <td width="350px"> <img align="left" hspace="5" src="http://event.on24.com/event/68/13/76/rt/1/speakerbios/speakerbios_customHTML1_3/mwrf_jeffgengler.jpg" /><b><a class="bioTitle" name="bio18710794">Jeff Gengler </a></b><br /> Base Station Applications Engineering Manager forTriQuint</td> <td width="350px"> <img align="left" hspace="5" src="http://event.on24.com/event/68/13/76/rt/1/speakerbios/speakerbios_customHTML1_4/mwrf_simonwood.jpg" /><b><a class="bioTitle" name="bio18710825">Simon Wood</a></b><br /> Manager of RF Product Development at Cree</td> </tr> </tbody> </table> <p>&nbsp;</p> </div> </fieldset> <div class="node-body webinar-body">Featuring presenters from some of the leading GaN manufacturers in the microwave industry, this webcast roundtable will provide the latest information on GaN power transistors and ICs and how they are driving Doherty-amplifier performance for wireless communications and many other applications. Learn about the state of the art in today’s Doherty amplifiers and the GaN devices that are making these enhanced performance levels possible. This roundtable also will give you a chance to find out what lies ahead for both Doherty amplifiers and GaN device technology.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/gan-roundtable-doherty-amplifiers-and-gan-device-technology" target="_blank">read more</a></p> Webcasts Tue, 17 Dec 2013 20:28:00 +0000 21031 at http://mwrf.com Using Logic Analysis to Find Root Cause of Digital Design Errors http://mwrf.com/webinar/using-logic-analysis-find-root-cause-digital-design-errors <div class="field-deck"> Sponsored by: Agilent Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Agilent-Webinar-OnDemand_4.jpg?1387293080" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, December 17, 2013 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">17:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><span class="style3"><span class="style11">Presented By:</span><br /> <strong><img alt="" border="1" height="100" src="https://event.on24.com/event/70/56/42/rt/1/logo/register/ed_frieden.jpg" width="80" /></strong><br /> <span class="style11">Brad Frieden</span><br /> <span class="style3">Digital Debug Solutions Product Planner<br /> Oscilloscope and Protocol Division<br /> Agilent Technologies</span></span></p> </div> </fieldset> <div class="node-body webinar-body">This Webcast will explore how the root-cause of functional and timing errors can be easily found by using a logic analyzer early in the debug process. Learn how to observe bus-level signal integrity to get a quick overview of possible design violations involving wide parallel buses. Different techniques will be shown to help you accelerate your digital system debug and validation process.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/using-logic-analysis-find-root-cause-digital-design-errors" target="_blank">read more</a></p> Webcasts Wed, 30 Oct 2013 18:57:00 +0000 19441 at http://mwrf.com