Test & Measurement http://mwrf.com/taxonomy/term/6787/more en Microwaves & RF’s Products of the Week (4/24-4/30) http://mwrf.com/test-measurement/microwaves-rf-s-products-week-424-430 <div class="node-body gallery-body">Whether you are looking for amplifier modules or power dividers, Microwaves & RF has you covered. Here are some of the latest products to help optimize your applications, devices, and systems.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/microwaves-rf-s-products-week-424-430" target="_blank">read more</a></p> http://mwrf.com/test-measurement/microwaves-rf-s-products-week-424-430#comments Active components Analog semiconductors Automotive Commercial Components Defense Image Galleries Industrial Medical Mixed-signal semiconductors Mobile Passive components Products Semiconductors Systems Test & Measurement Test & Measurement - analyzers Test & Measurement - generators Tue, 26 Apr 2016 17:15:00 +0000 44111 at http://mwrf.com DisplayPort 1.3 over Type-C: Taming the Gotchas! http://mwrf.com/webinar/displayport-13-over-type-c-taming-gotchas <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/ED-MWRF_Keysight_53webinar_595x335.gif?1461262724" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, May 3, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="400"> <tbody> <tr> <td width="105"><img height="100" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2015/07/ED_Fetz.jpg" style="padding-bottom:10px;" /></td> <td width="295"> <p><strong>Brian Fetz</strong><br /> Marketing Manager<br /> <strong>Keysight Technologies, Inc.</strong></p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">VESA released the first type C connector alternate mode specification shortly after the USB-IF released its power delivery and type C specifications, by tailoring the DP1.3 specification to the new connector. This presentation will provide an overview of how the alternate mode works for DisplayPort and discuss in depth the implications of the type C specification and how it changes the testing approach to DisplayPort.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/displayport-13-over-type-c-taming-gotchas" target="_blank">read more</a></p> Test & Measurement Test & Measurement - analyzers Webcasts Thu, 21 Apr 2016 18:06:00 +0000 43961 at http://mwrf.com Testing Wireless Power Transfer Designs http://mwrf.com/webinar/testing-wireless-power-transfer-designs <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/EDMWRF_Keysight_511webinar_595x335.gif?1461263188" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, May 11, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="400"> <tbody> <tr> <td width="105"><img height="100" src="http://electronicdesign.com/site-files/electronicdesign.com/files/uploads/2015/07/JohnniePic.jpg" style="padding-bottom:10px;" /></td> <td width="295"> <p><strong>Johnnie Hancock</strong><br /> Product Manager<br /> <strong>Keysight Technologies, Inc.</strong></p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Charging battery-operated devices from something as small as a smart watch to as large as an electric-powered bus have traditionally been accomplished with charging cables and AC/DC power adapters of various sizes. However, battery-operated devices are quickly becoming untethered today with the rapid adoption of wireless charging technology. There are two major wireless charging technologies based on either magnetic induction or magnetic resonance. Products based on either or both of these technologies must meet stringent standards.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/testing-wireless-power-transfer-designs" target="_blank">read more</a></p> Test & Measurement Test & Measurement - analyzers Webcasts Thu, 21 Apr 2016 18:06:00 +0000 43971 at http://mwrf.com Gallery: Long Island RF/Microwave Symposium http://mwrf.com/active-components/gallery-long-island-rfmicrowave-symposium <div class="node-body gallery-body">The Upsky Long Island Hotel recently hosted the Long Island RF/Microwave Symposium & Exhibits. In addition to several presentations, the event featured a number of exhibitors eager to display their products.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/gallery-long-island-rfmicrowave-symposium" target="_blank">read more</a></p> http://mwrf.com/active-components/gallery-long-island-rfmicrowave-symposium#comments Active components Commercial Image Galleries Passive components Products Semiconductors Test & Measurement Thu, 21 Apr 2016 14:39:00 +0000 43951 at http://mwrf.com Engineering Principles Kids Are Exploring at the USA Science Fair (.PDF Download) http://mwrf.com/datasheet/engineering-principles-kids-are-exploring-usa-science-fair-pdf-download <div class="field-image-promo"> <a href="/datasheet/engineering-principles-kids-are-exploring-usa-science-fair-pdf-download" class="imagecache imagecache-med_crop imagecache-linked imagecache-med_crop_linked"><img alt="" src="http://mwrf.com/site-files/mwrf.com/files/imagecache/med_crop/datasheets/thumbnails/Capture.JPG" title="" height="200" width="355" class="imagecache imagecache-med_crop" /></a> </div> <div class="node-body datasheet-body">This handout is designed to help students (young and old) see the basic engineering principles of things they use, play with, drive, or enjoy in their daily lives.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/datasheet/engineering-principles-kids-are-exploring-usa-science-fair-pdf-download" target="_blank">read more</a></p> Active components Passive components Semiconductors Test & Measurement Gold Wed, 13 Apr 2016 18:05:00 +0000 43741 at http://mwrf.com Multi-Tone Testing Multiplies Test Solutions http://mwrf.com/test-measurement/multi-tone-testing-multiplies-test-solutions <div class="node-body article-body">This application note discusses the use of multi-tone testing, which can offer a range of test benefits.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/multi-tone-testing-multiplies-test-solutions" target="_blank">read more</a></p> http://mwrf.com/test-measurement/multi-tone-testing-multiplies-test-solutions#comments AR RF/MW Instrumentation Commercial Defense Industrial Test & Measurement Fri, 08 Apr 2016 19:13:00 +0000 43581 at http://mwrf.com Spotlight on New Products at IMS 2016 http://mwrf.com/test-measurement/spotlight-new-products-ims-2016 <div class="field-deck"> A large portion of a small industry is set to show its hardware, software, and test equipment at this year’s IMS exhibition in San Francisco’s Moscone Center. </div> <div class="node-body article-body">Over 600 exhibitors plan to show everything from the tiniest devices to the most elegant test systems at the 2016 IMS Exhibition in San Francisco’s Moscone Center.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/spotlight-new-products-ims-2016" target="_blank">read more</a></p> http://mwrf.com/test-measurement/spotlight-new-products-ims-2016#comments Active components Commercial Defense Events Industrial Passive components Semiconductors Software Systems Test & Measurement Wed, 06 Apr 2016 13:49:00 +0000 43431 at http://mwrf.com Welcome to IMS 2016 http://mwrf.com/events/welcome-ims-2016 <div class="field-deck"> Microwave Week will come to San Francisco this year, showcasing the very best of the RF/microwave industry. </div> <div class="node-body article-body">Microwave Week will come to San Francisco this year, showcasing the very best of the RF/microwave industry.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/events/welcome-ims-2016" target="_blank">read more</a></p> http://mwrf.com/events/welcome-ims-2016#comments Components Events Software Test & Measurement Tue, 05 Apr 2016 13:40:00 +0000 43381 at http://mwrf.com Optimizing IP3 and ACPR Measurements http://mwrf.com/white-paper/optimizing-ip3-and-acpr-measurements <div class="field-deck"> Sponsored by National Instruments </div> <div class="node-body article-body">Learn techniques to improve your instrument’s ability to measure intermodulation distortion, third-order intercept, and adjacent channel power ratio.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/optimizing-ip3-and-acpr-measurements" target="_blank">read more</a></p> http://mwrf.com/white-paper/optimizing-ip3-and-acpr-measurements#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 31 Mar 2016 18:02:00 +0000 43101 at http://mwrf.com Spectrum Analysis Fundamentals http://mwrf.com/white-paper/spectrum-analysis-fundamentals <div class="field-deck"> Sponsored by National Instruments </div> <div class="node-body article-body">Review the basics of spectrum analysis including the various signal analyzer architectures from single stage to superheterodyne. Also discover how to adjust VSA settings for optimal measurement performance.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/spectrum-analysis-fundamentals" target="_blank">read more</a></p> http://mwrf.com/white-paper/spectrum-analysis-fundamentals#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 31 Mar 2016 18:02:00 +0000 43111 at http://mwrf.com