Testing RF/microwave/millimeter-wave devices under a wide operation range for characterization can be time consuming and error prone. Fortunately, companies are forging software/hardware solutions to aid and even automate this process....More
The task of testing and characterizing RF/microwave/millimeter-wave devices is growing increasingly more complex and time consuming. These new devices need to be characterized so that statistical models can be developed for sophisticated system and circuit design software.
Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs....More
Get Your Personal Wi-Fi Poster for your Desk or Lab! Get access to this new educational Wi-Fi standards poster. All aspects of 802.11 Wi-Fi physical layer and transmitter measurements are covered:...More
Aircraft manufacturers can no longer afford the total costs associated with airframe microwave assemblies that fail because of rigorous installation and the extreme conditions of aerospace. W. L. Gore & Associates evaluated the performance of...More
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements Sponsored by Agilent Technologies Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies Download this white paper