Two New “Power of X” app notes on LTE-Advanced Physical Layer Design & Test and Testing DigRF Interfaces

Sponsored by Agilent Technologies

Agilent's X Platforms let engineers bring innovative, higher-performing designs to market faster. Agilent has two new "Power of X" application notes "Solutions for LTE-Advanced Physical Layer Design and Test" and "Solutions for Testing DigRF Interfaces". Get greater insight into how to use signal generation and analysis to overcome challenges associated with carrier aggregation, as well as, how to quickly and efficiently characterize your digital wireless devices. Download these app notes now.

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New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
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