GaN Roundtable: The State of GaN Reliability Today

    Date & Time

  • This webinar is now available On-Demand.
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    Event Type

  • On-Demand Webinar

Speakers

Presenters:


Dr. Donald A. Gajewski, Manager of Reliability and Failure Analysis Cree Power & RF Advanced Devices

Damian McCann, Director of Engineering, M/A-Com

Mark Murphy, Director of Marketing for RF Power products, NXP

Dean White BSEE & MSEE), Defense, Aerospace and Foundry Business Development Sr. Manager TriQuint

 

 

Description

Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance, and reliability. Compared to where it stood a decade ago, GaN has made tremendous improvements in reliability in particular. Those improvements have allowed it to take an increasingly prominent role in a lot of microwave and RF applications.

In a webcast round table, a panel of expert speakers will cover the state of GaN reliability today while - judging by the current state of the art and R & D - predicting where it will go in the future. Among the issues that will be covered are dependence on temperature and/ or voltage and circuit reliability concerns and how foundry enhancements are tackling them.

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