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Date & Time
- On-Demand Webinar
Dr. Donald A. Gajewski, Manager of Reliability and Failure Analysis, Cree Power & RF Advanced Devices
Damian McCann, Director of Engineering, M/A-Com
Mark Murphy, Director of Marketing for RF Power products, NXP
Dean White (BSEE & MSEE), Defense, Aerospace and
Foundry Business Development Sr. Manager
Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance, and reliability. Compared to where it stood a decade ago, GaN has made tremendous improvements in reliability in particular. Those improvements have allowed it to take an increasingly prominent role in a lot of microwave and RF applications.
In a webcast round table, a panel of expert speakers will cover the state of GaN reliability today while - judging by the current state of the art and R & D - predicting where it will go in the future. Among the issues that will be covered are dependence on temperature and/ or voltage and circuit reliability concerns and how foundry enhancements are tackling them.