This application note describes the measurement and analysis of cross channel skew in multichannel high speed digitizers over short and long durations to sub-picosecond scales. Two measurement techniques using the Agilent M9703A High Speed Digitizer are described and compared.
Advertisement
Achieve channel to channel coherency while accelerating test throughput for radar, satellite beam forming, MIMO and high energy applications
Advertisement
Advertisement
Webcasts
GaN Roundtable: The State of GaN Reliability Today
Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.
Advertisement
Whitepapers
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
Download this white paper
Advertisement
Advertisement
Advertisement
Advertisement
Advertisement
Advertisement