Pete Hulbert
 Write for Microwaves & RF
1 results found for Pete Hulbert, displaying items 1 - 1

August 2008   [Test & Measurement]
Use Pulse I-V Testing To Characterize RF Devices
Pulsed current-voltage (I-V) testing is becoming an invaluable method for evaluating the performance and reliability of semiconductor devices. The measurement approach is relatively cost effective and avoids the negative effects of self-heating and transient trapped charges, which can result in misleading test results. And pulsed I-V testing provides the accurate device data needed for improved computeraided- engineering (CAE) software models. ...