August 2008 [Test & Measurement] Use Pulse I-V Testing To Characterize RF Devices Pulsed current-voltage (I-V) testing is becoming an invaluable method for evaluating the performance and reliability of semiconductor devices. The measurement approach is relatively cost effective and avoids the negative effects of self-heating and transient trapped charges, which can result in misleading test results. And pulsed I-V testing provides the accurate device data needed for improved computeraided- engineering (CAE) software models. ... |
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