Trusted Resource for the Working RF Engineer
Search MWRF
Home
Product Directory
Topics
Note Pad
electronica 2008
EuMW 2008
Back Issues
RF Blogs
Military Electronics
Subscribe
News
Online News
Design Features
Web Seminars
PartFinder
Whitepapers
Microwave Legends
Newsletter
WebConnect
RF Design
RSS
RSS
Sponsored Links
 |
August 2008 [Test & Measurement] Use Pulse I-V Testing To Characterize RF Devices Pulsed current-voltage (I-V) testing is becoming an invaluable method for evaluating the performance and reliability of semiconductor devices. The measurement approach is relatively cost effective and avoids the negative effects of self-heating and transient trapped charges, which can result in misleading test results. And pulsed I-V testing provides the accurate device data needed for improved computeraided- engineering (CAE) software models. ... |
|
||||||
Sponsored Links
Resources
Electronic Design