Few have contributed as much to the RF/microwave industryin particular, to the advancement of measurement science as Roger Pollard. Roger, who passed away last December, was a devoted volunteer to the IEEE and to the Automatic RF Techniques Group (ARFTG), always in pursuit of the measurement truth (accuracy). A retired Dean of the faculty of engineering for the University of Leeds (where he supervised 56 successful Ph.D. candidates), he also served as a consultant for Agilent Technologies, guiding the firm's development of linear and nonlinear vector network analyzers (VNAs).

Roger touched many within the IEEE MTT-S and ARFTG, and within the industry in general. Appropriately, a special session at the 2012 IMS (Convention Center room 511CF, 1:50-3:50 p.m.), chaired by retired Agilent "VNA meister" John Barr, will pay tribute to his many contributions to this industry.