David Ballo

David
Ballo
Articles
Eliminate Fixture Effects On Device Measurements
When performing measurements on high-frequency devices that require a test fixture, some useful techniques such as de-embedding and port extensions can improve overall VNA test accuracy.
Making Source-Corrected Noise-Figure Measurements
Noise limits the sensitivity of a receiver and degrades the performance of a transmitter.Both R&D and production environments rely on several time-honored approaches to evaluate component noise in terms of noise figure. They now have an additional ...
Network Analyzers Simplify Mixer Test
By offering coverage through 67 GHz and a new method for characterizing mixers, these analyzers eliminate many measurement challenges for higher-frequency designs.
Whitepapers

How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements​
Sponsored by Keysight Technologies
Download this white paper


Testing S-Parameters on Pulsed Radar Power Amplifier Modules​
Sponsored by Rohde & Schwarz
Download this white paper

 

 

 

Webcasts

Perform Power Supply Frequency Response Analysis using an Oscilloscope
May 19, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


PAM-4 Transmitter and Receiver Design Characterization Solutions
May 21, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


DisplayPort 1.3 – PHY Layer Test Requirements
May 27, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model
May 28, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

Connect With Us

Sponsored Introduction Continue on to (or wait seconds) ×