David Ballo

David
Ballo
Articles
Eliminate Fixture Effects On Device Measurements
When performing measurements on high-frequency devices that require a test fixture, some useful techniques such as de-embedding and port extensions can improve overall VNA test accuracy.
Making Source-Corrected Noise-Figure Measurements
Noise limits the sensitivity of a receiver and degrades the performance of a transmitter.Both R&D and production environments rely on several time-honored approaches to evaluate component noise in terms of noise figure. They now have an additional ...
Network Analyzers Simplify Mixer Test
By offering coverage through 67 GHz and a new method for characterizing mixers, these analyzers eliminate many measurement challenges for higher-frequency designs.
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How to Select an Analog Signal Generator
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MIPI - Overcome Test Challenges to Ensure Interoperability for your PHY
June 23, 2015 @ 1pm EST
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Automating Semiconductor and Power Semiconductor Device Testing
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Successfully Make Power and AC Line Disturbance Measurements
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