David Ballo

Articles by David Ballo
Eliminate Fixture Effects On Device Measurements
When performing measurements on high-frequency devices that require a test fixture, some useful techniques such as de-embedding and port extensions can improve overall VNA test accuracy.
Making Source-Corrected Noise-Figure Measurements
Noise limits the sensitivity of a receiver and degrades the performance of a transmitter.Both R&D and production environments rely on several time-honored approaches to evaluate component noise in terms of noise figure. They now have an additional ...
Network Analyzers Simplify Mixer Test
By offering coverage through 67 GHz and a new method for characterizing mixers, these analyzers eliminate many measurement challenges for higher-frequency designs.

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GaN Roundtable: The State of GaN Reliability Today

Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.

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New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
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Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
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