Frdric Fernez

Frdric
Fernez
Articles
Method Measures Device Power And Gain
This approach eliminates many problems encountered when measuring the saturated power of RF transistors and RF ICs under pulsed conditions.
Whitepapers

Adding EMI Pre-compliance Testing to the Product Development Process is Cost-effective Insurance
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New! Wi-Fi Standards Poster
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Reducing Life Cycle Costs with Reliable Airframe Microwave Assemblies
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Power Integrity Measurements – Choosing the Right Tools
February 26, 2015 @ 1pm EST
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USB 3.1 - Gen2 10Gbps Receiver Test Challenges
March 11, 2015 @ 1pm EST
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