Frdric Fernez

Frdric
Fernez
Articles
Method Measures Device Power And Gain
This approach eliminates many problems encountered when measuring the saturated power of RF transistors and RF ICs under pulsed conditions.
Whitepapers

Speed Time to Market with Consistent Measurements from R&D through Manufacturing
Sponsored by Keysight Technologies
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2015 Back to Basics DVD-Modern Measurement Fundamentals
Sponsored by Keysight Technologies
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Webcasts

The Continuing Adventures of CMOS Technology - Power and Linearity at Microwave Frequencies
August 20, 2015 @ 2 pm EST
Sponsored by Peregrine Semiconductor
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