Frdric Fernez

Frdric
Fernez
Articles
Method Measures Device Power And Gain
This approach eliminates many problems encountered when measuring the saturated power of RF transistors and RF ICs under pulsed conditions.
Whitepapers

How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements​
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Testing S-Parameters on Pulsed Radar Power Amplifier Modules​
Sponsored by Rohde & Schwarz
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Perform Power Supply Frequency Response Analysis using an Oscilloscope
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Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model
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