Frdric Fernez

Frdric
Fernez
Articles
Method Measures Device Power And Gain
This approach eliminates many problems encountered when measuring the saturated power of RF transistors and RF ICs under pulsed conditions.
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Increase Power Amplifier Test Throughput with the Keysight PXIe Vector Signal Generator and Analyzers
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Poster Worldwide Spectrum Allocations
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Achieving Excellent Spectrum Analysis Results Using Innovative Noise, Image and Spur Suppression Techniques
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