Gustavo Leizerovich

Gustavo
Leizerovich
Articles
Achieve First-Pass LTCC Design Success With DFM
Understanding the effects of process and component variations can help in constructing LTCC circuit designs that deliver desired performance levels in spite of those variations.
Whitepapers

IMD Measurements with IMDView: MS4640B Series Vector Network Analyzer
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How to Select an Analog Signal Generator
Sponsored by Rohde & Schwarz
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Webcasts

MIPI - Overcome Test Challenges to Ensure Interoperability for your PHY
June 23, 2015 @ 1pm EST
Sponsored by Keysight Technologies
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Automating Semiconductor and Power Semiconductor Device Testing
June 24, 2015 @ 1pm EST
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Successfully Make Power and AC Line Disturbance Measurements
June 25, 2015 @ 1pm EST
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