Jack Browne

Jack
Browne
Technical Contributor,
Microwaves & RF

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Articles
Keithley Portable Measures Power to 6 GHz
Model 3500 is a portable RF power meter designed for field and laboratory measurements. The instrument, which operates from 10 MHz to 6 GHz, offers a simple user interface with clear liquid-crystal-display (LCD) screen. The power sensor and display ...
Agilent Adds HDMI Measurement Solution
Agilent Technologies has dveloped an integrated sink, source, and cable test solution for the new High-Definition Multimedia Interface (HDMI) 1.3 standard. The system is used for manual and automated HDMI physical-layer compliance tests, as well as for ...
Single-Box System Calibrates Cellular Handsets
The E6601A all-in-one measurement system in a box from Agilent Technologies is aimed at calibrating mobile cellular handsets in manufacturing environments. Based on the Windows XP operating system from Microsoft, the single instrument features a wide ...
CTIA, Wi-FI Alliance Agree On Cell Phone Testing
The Wi-Fi Alliance and CTIA(R)- The Wireless Association have combined on a test document for laboratory tests that provide RF performance mapping for cell phones in a mixed-network environment. The test program is designed to drive the widespread ...
Fast Signal Analyzers Cut Noise to 26.5 GHz
The model N9020A MXA signal analyzer family from Agilent Technologies includes is designed for measurements on wireless devices using complex modulation formats. The instrument series includes models covering 20 Hz to 3.6 GHz, 20 Hz to 8.4 GHz, 20 Hz to ...
BAE, NI, and Phase Matrix Team On SI Solutions
BAE Systems, National Instruments, and Phase Matrix have announced a joint initiative to develop a PXI-Express-based synthetic instrument (SI) for military and commercial RF/microwave applications. Phase Matrix is currently developing a family of ...
Real-Time Analyzers Grab 110-MHz BW
The latest Real-Time Spectrum Analyzers from Tektronix, the 9-kHz to 6.2-GHz model RSA6106A and 9-kHz-to-14-GHz model RSA6114A offer advanced triggering capabilities with the power of capturing instantaneous bandwidths as wide as 110 MHz while ...
ARMMS Announces Next Test Conference
The ARMMS RF and Microwave Society will hold its next measurement conference on Monday and Tuesday, November 6-7, 2006, at Harben House, Tickford Street, Newport Pagnell, Buckinghamshire, England. The planned program includes papers such as "Large signal ...
Portable Analyzer Scans 4-GHz Range
Model 9102 is a portable spectrum analyzer from Boonton Electronics with frequency range of 100 kHz to 4 GHz and resolution-bandwidth filters ranging from 100 Hz to 1 MHz. It has a DANL of typically -130 dBm to 1 GHz and -135 dBm from 1 to 4 GHz. The ...
Instruments Combine Meters and Sensors
The LB4XX Series USB power sensors from LadyBug Technologies LLC combine a power sensor and detector electronics for making power measurements from 10 MHz to 10 GHz. The tiny instruments are just 2.25 inches long but measure power levels from -65 to +20 ...
Tiny Instruments Combine Power Meter And Sensor
These little measuring instruments pack a great deal of capability and accuracy into a package that saves space and money over conventional power meters and sensors.
Test System In A Box Cuts Wireless Measurement Costs
Time is money in wireless production testing. Every second of test time adds to the cost of a cellular telephone. To save time and money, the E6601A wireless test set is as much as 30 percent faster than other wireless production test sets and ...
Next-Generation Instruments Speed Wireless Testing
These new test instruments take aim at the needs of the production line with blazing measurement speed that doesnt compromise performance.
RFID Is Not Just For Wal-Mart
The DoD has used active RFID technology for more than a decade.
GaN Transistors Reach For High Power And Linearity
These high-power transistors take advantage of the high power density and high-voltage capabilities of GaN to deliver generous output-power levels at key wireless frequencies.
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