Jack Browne

Jack
Browne
Technical Contributor,
Microwaves & RF

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Articles
RFID Is Not Just For Wal-Mart
The DoD has used active RFID technology for more than a decade.
GaN Transistors Reach For High Power And Linearity
These high-power transistors take advantage of the high power density and high-voltage capabilities of GaN to deliver generous output-power levels at key wireless frequencies.
Technology Cancels Cellular Interferenc
TensorComms Interference Cancellation Technology (ICT) provides wireless operators with increased capacity, improved data rates, and greater spectral efficiency.
Handheld Analyzer Scans 4-GHz Spectrum
This battery-powered spectrum analyzer provides full-sized functionality from 100 kHz to 4 GHz for testing and commissioning base stations and broadcast facilities.
Frequency Synthesizers Supply Stable Signals
Specifiers have an expansive choice of products when selecting a frequency synthesizer, with a wide range of different form factors, performance levels, and price tags.
September 7, 2006 Newsletter
============================== Microwaves & RF UPDATE MWRF - www.mwrf.com September 7, 2006 ============================== Greetings and welcome to your personal copy of PlanetEE's Microwaves and RF UPDATE e-newsletter. Please see below for ...
Keithley Offers Course On Remote Testing
Keithley Instruments is offering a two-day course on September 14 and 15, 2006 in Cleveland, OH on the use of National Instruments' LabVIEW software for remote control of multiple-vendor test instruments, "Optimizing Remote Control of Instruments in a ...
Noise Com Develops HD Radio Signal Generator
Noise Com recently ntroduced the DSG9000 series of digital signal generators, a product line certified by iBiquity Digital Corporation (the sole developer and licenser of digital HD Radio technology) to provide test signals for HD Radio (TM) in both AM ...
EMI Test Receiver Includes FFT Capabilities
Rohde & Schwarz recently introduced the ESU family of CISPR16-1-1 compliant electromagnetic-interference (EMI) receivers with Fast Fourier Transform (FFT) time-domain scan capabilities. While traditional EMI measurements are time and labor intensive, the ...
TETRA Radio Testers Check Battery Usage
Aeroflex has developed a TETRA Energy Economy Mode (EEM) for its 3900 series analog and digital TETRA digital radio test sets. Option 114 enables flexible testing of TETRA handheld mobile radios by allowing operators to configure battery test scenarios ...
Free Application Note Aids Switch Selection
A free application note from Agilent Technologies, "Selecting the Right Switch Technology for Your Application," simplifies the job of finding a solid-state switch for measurement applications. The 12-page note reviews the key performance specifications ...
Keithley Sponsors LXI Consortium PlugFest
The LXI Consortium's most recent PlugFest (July 25-27, Cleveland, OH) featured more than 50 attendees and included real-world testing of products meeting Class A and Class B LXI requirements. Products for Class A include time synchronization via the IEEE ...
August 24, 2006 Newsletter
============================== Microwaves & RF UPDATE MWRF - www.mwrf.com August 24, 2006 ============================== Greetings and welcome to your personal copy of PlanetEE's Microwaves and RF UPDATE e-newsletter. Please see below for ...
Crosstalk: An Interview with Microphase Corp.'s Necdet "Ned" Ergul
MRF: Why did you start the company?Ergul: In 1952, I joined Belco Research Laboratories in Newark, NJ in their filter group because I had always been interested in microwave electronics. I was a project leader charged with development of ...
Spectrum Analyzer Doubles As Phase-Noise Test Set
This new line of analyzers provides all the tools and performance of a dedicated phase-noise test set with superb spectrum-analysis capabilities through 50 GHz.
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