Jack Browne

Jack
Browne
Technical Contributor,
Microwaves & RF

Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Articles
IMS 2015 Welcomes Women in Microwaves, STEM, & Young Professionals
At IMS 2015, the Women in Microwaves (WIM), a subset of the Women in Engineering (WIE) group, is hoping to boost the number of female engineers in the microwave and RF industry.
2015 IMS Products on Parade: Part 2
These products are just a sampling of those that will be on display at the upcoming 2015 IMS Exhibition in Phoenix, Ariz.
2015 IMS Products on Parade: Part 1
These products are just a sampling of those that will be on display at the upcoming 2015 IMS Exhibition in Phoenix, Ariz.
Cavalcade of Cutting-Edge Products Invades 2015 IMS
The exhibition area is open for slightly less than three days, and visitors can easily spend all of their time just scouring the sections of the show floor and the companies devoted to CAE software or to test equipment.
Welcome to IMS 2015: Finding Your Way Around the Symposium
Microwave Week is rapidly approaching, again providing the opportunity to reaffirm outstanding relationships, explore the smorgasbord of microwave products/services, and dive into the latest and greatest technologies that the microwave industry has produced.
Instruments Team for Affordable Analysis
Several new instruments, including a VNA and a line of high-speed oscilloscopes, help simplify measurements through 33 GHz.
Transcorder Tackles 50 MHz to 6 GHz

Measuring RF/microwave signal activity is not always easy because of the changing nature of those signals, especially when the activity may be irregular or inconsistent. Yet, it is often necessary to have some form of record of a particular signal, especially when characterizing or documenting the activity of different wireless systems.

Power Analyzer Integrates Scope
This compact instrument combines a power analyzer with a digital oscilloscope to effectively measure AC and DC voltage, current, and power.
Remtec
Packaging and Substrate Solutions Gain Ground
A firm specializing in packaging and substrate design and manufacturing has added to its capabilities.
Power Divider Spans 12 to 18 GHz
A line of broadband power dividers includes model with low loss for applications from 12 to 18 GHz.
High CV Tantalum Cap Has Low Profile
A line of lead-free capacitors is supplied in a low-profile package.
Guerilla RF
LNAs Emerge from New Supplier
A pair of low-noise amplifiers offers high gain and low noise figures at frequencies through 3800 MHz.
Custom MMIC
GaAs Low-Noise Amp Boosts 17 to 27 GHz
This low-power LNA chip is capable of 24-dB gain and 1.3-dB typical noise figure from 17 to 27 GHz.
KRYTAR
Directional Coupler Connects 6.0 to 26.5 GHz
A broadband stripline directional coupler offers 6-dB coupling from 6.0 to 26.5 GHz.
ARRA
Broadband Phase Shifter Adjusts DC to 18 GHz
This broadband phase shifter provide low-loss control of phase from DC to 18 GHz.
Whitepapers

How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements​
Sponsored by Keysight Technologies
Download this white paper


Testing S-Parameters on Pulsed Radar Power Amplifier Modules​
Sponsored by Rohde & Schwarz
Download this white paper

 

 

 

Webcasts

Perform Power Supply Frequency Response Analysis using an Oscilloscope
May 19, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


PAM-4 Transmitter and Receiver Design Characterization Solutions
May 21, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


DisplayPort 1.3 – PHY Layer Test Requirements
May 27, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model
May 28, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

Connect With Us

Sponsored Introduction Continue on to (or wait seconds) ×