Jack Sifri

Jack
Sifri
Articles
X-Parameters Aid MMIC Design
Models based on X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.
RF Design Environment Closes Verification Gap
When integrated with industry-standard IC schematic and layout tools, this powerful suite of RF design and verification programs can improve the efficiency of the integrated-circuit design process.
Whitepapers

Adding EMI Pre-compliance Testing to the Product Development Process is Cost-effective Insurance
Sponsored by Keysight Technologies
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New! Wi-Fi Standards Poster
Sponsored by Tektronix
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Reducing Life Cycle Costs with Reliable Airframe Microwave Assemblies
Sponsored by WL Gore
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Webcasts

Breakthrough Insight into DDR4/LPDDR4 Memory Greater Than 2400 Mb/s
January 13, 2015 @ 1:00pm EST
Sponsored by Keysight Technologies

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Overcoming Test Challenges of 100Gb Ethernet and Beyond
January 15, 2015 @ 1:00pm EST
Sponsored by Keysight Technologies

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RF Measurements You Didn't Know Your Oscilloscope Could Make
January 21, 2015 @ 1:00pm EST
Sponsored by Keysight Technologies

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