Jack Sifri

Jack
Sifri
Articles
X-Parameters Aid MMIC Design
Models based on X-parameters can provide insights into the linear and nonlinear behavior of key components in wireless systems, including power amplifiers and mixers.
RF Design Environment Closes Verification Gap
When integrated with industry-standard IC schematic and layout tools, this powerful suite of RF design and verification programs can improve the efficiency of the integrated-circuit design process.
Whitepapers

Speed Time to Market with Consistent Measurements from R&D through Manufacturing
Sponsored by Keysight Technologies
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2015 Back to Basics DVD-Modern Measurement Fundamentals
Sponsored by Keysight Technologies
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The Continuing Adventures of CMOS Technology - Power and Linearity at Microwave Frequencies
August 20, 2015 @ 2 pm EST
Sponsored by Peregrine Semiconductor
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