It was a pesky problem: the highaccuracy EM analysis of circuits with ports placed internal to the circuit (instead of on the edge). These internal ports would be used to connect surface-mount devices (SMDs) or include transistors inside an RF IC. Much ...
Modeling and analysis performed with a suite of planar three-dimensional electromagnetic (EM) simulation tools simplifies the design of RFID tags.
GaN Roundtable: The State of GaN Reliability Today
Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements Sponsored by Agilent Technologies Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies Download this white paper