Jean-Jacques DeLisle

Jean-Jacques
DeLisle

Jean-Jacques DeLisle
Technical Editor

Jean-Jacques graduated from the Rochester Institute of Technology, where he completed his Master of Science in Electrical Engineering. In his studies, Jean-Jacques focused on Control Systems Design, Mixed-Signal IC Design, and RF Design. His research focus was in smart-sensor platform design for RF connector applications for the telecommunications industry. During his research, Jean-Jacques developed a passion for the field of RF/microwaves and expanded his knowledge by doing R&D for the telecommunications industry. Journalism was always a passion of Jean-Jacques’ as well. He enjoyed writing for RIT’s university publication in addition to working on white papers, patents, and technical articles.

Jean-Jacques is excited to cover the latest trends in research, technology, and products. He is also determined to help engineers gain access to information services, which will aid in the design process while preventing many engineers from having to "reinvent the wheel"--a problem that is so common to the field.

Articles
IoT Wireless Convergence Sparks Testing Challenges
In support of fast-growing wireless markets, test equipment manufacturers are embracing highly modular and adaptable measurement instruments designed to speed through multiple-device test scenarios.
Top Methods for Measuring 5 Common Signal-Corrupting Distortions
Nonlinearity and distortion have created interference and system level challenges with RF/microwave equipment since the first transmissions. With the latest high-speed wireless technologies, understanding and mitigating distortions is critical to reducing signal degradation.
Portable Wireless Products Drive Filter Miniaturization
4G LTE and the proliferation of handheld wireless standards are pushing filter designers to shrink filter packages without sacrificing performance.
Signal and Spectrum Analyzers Flex Bandwidth and Memory
Meeting the needs of electronic warfare, telecommunications, and automated test, signal and spectrum analyzers are reaching new heights of performance, features, and footprint.
Network analyzer
How Not to Break your Network Analyzer
Proper technique can ensure that a highly sensitive and expensive instrument is put to use making quality measurements instead of sitting on a repair bench.
RF Design Made Simple
With more industries than ever leveraging RF technologies, it is essential for many to have at least a fundamental understanding of RF design basics.
13 Key Considerations for Aerospace RF/Microwave Devices
From outgassing to accelerated aging through temperature extremes, RF/microwave components must be built to last in harsh aerospace environments.
Differential Group Delay Modules Aid Instantaneous Microwave Measurements
Researchers from Singapore experimentally demonstrated a frequency range and resolution adjustable microwave measurement technique using photonic technologies.
Tunable Optoelectronic Oscillators Enable Arbitrary Waveform Generators
Using a tunable optoelectronic oscillator, researchers were able to develop an arbitrary waveform generator.
BST
Barium Strontium Titanate Tunes Variable Patch Antenna Reflectarrays
Researchers from the University of Central Florida developed a tunable reflect array in the Ka and X bands using barium strontium titanate technology.
6 Degrees of Microwave and RF/Microwave Switch Separation
RF and microwave switches enable automated test, antenna array, and filter applications that would otherwise require extensive redundant systems.
Diamonds are a GaN PA’s Best Friend
For power amplifiers and resistors, thermal-conduction bottlenecks are limiting device performance. CVD diamond has the potential to overcome these challenges and release the potential of GaN and thin-film resistive technologies.
Why Does The Internet of Things Need Different Wireless Standards?
Though a variety of wireless standards may be necessary to complete a range of Internet of Things solutions, their growing numbers make it difficult to choose the right one.
What’s the Difference Between IEEE 802.11af and 802.11ah?
Although IEEE 802.11af and 802.11ah are both sub-1-GHz standards, they are designed to fill different niches in upcoming IoT and wireless-backhaul applications.
7 Ways to Attack Dynamic-Range Measurement Threats
Dynamic range is a limiting factor for many of the latest testing and measurement applications.
Whitepapers

IMD Measurements with IMDView: MS4640B Series Vector Network Analyzer
Sponsored by Anritsu
Download this white paper


How to Select an Analog Signal Generator
Sponsored by Rohde & Schwarz
Download this white paper

Webcasts

MIPI - Overcome Test Challenges to Ensure Interoperability for your PHY
June 23, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


Automating Semiconductor and Power Semiconductor Device Testing
June 24, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


Successfully Make Power and AC Line Disturbance Measurements
June 25, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

 

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