Jean-Jacques DeLisle


Jean-Jacques DeLisle
Technical Editor

Jean-Jacques graduated from the Rochester Institute of Technology, where he completed his Master of Science in Electrical Engineering. In his studies, Jean-Jacques focused on Control Systems Design, Mixed-Signal IC Design, and RF Design. His research focus was in smart-sensor platform design for RF connector applications for the telecommunications industry. During his research, Jean-Jacques developed a passion for the field of RF/microwaves and expanded his knowledge by doing R&D for the telecommunications industry. Journalism was always a passion of Jean-Jacques’ as well. He enjoyed writing for RIT’s university publication in addition to working on white papers, patents, and technical articles.

Jean-Jacques is excited to cover the latest trends in research, technology, and products. He is also determined to help engineers gain access to information services, which will aid in the design process while preventing many engineers from having to "reinvent the wheel"--a problem that is so common to the field.

Signal and Spectrum Analyzers Flex Bandwidth and Memory
Meeting the needs of electronic warfare, telecommunications, and automated test, signal and spectrum analyzers are reaching new heights of performance, features, and footprint.
Network analyzer
How Not to Break your Network Analyzer
Proper technique can ensure that a highly sensitive and expensive instrument is put to use making quality measurements instead of sitting on a repair bench.
RF Design Made Simple
With more industries than ever leveraging RF technologies, it is essential for many to have at least a fundamental understanding of RF design basics.
13 Key Considerations for Aerospace RF/Microwave Devices
From outgassing to accelerated aging through temperature extremes, RF/microwave components must be built to last in harsh aerospace environments.
Differential Group Delay Modules Aid Instantaneous Microwave Measurements
Researchers from Singapore experimentally demonstrated a frequency range and resolution adjustable microwave measurement technique using photonic technologies.
Tunable Optoelectronic Oscillators Enable Arbitrary Waveform Generators
Using a tunable optoelectronic oscillator, researchers were able to develop an arbitrary waveform generator.
Barium Strontium Titanate Tunes Variable Patch Antenna Reflectarrays
Researchers from the University of Central Florida developed a tunable reflect array in the Ka and X bands using barium strontium titanate technology.
6 Degrees of Microwave and RF/Microwave Switch Separation
RF and microwave switches enable automated test, antenna array, and filter applications that would otherwise require extensive redundant systems.
Diamonds are a GaN PA’s Best Friend
For power amplifiers and resistors, thermal-conduction bottlenecks are limiting device performance. CVD diamond has the potential to overcome these challenges and release the potential of GaN and thin-film resistive technologies.
Why Does The Internet of Things Need Different Wireless Standards?
Though a variety of wireless standards may be necessary to complete a range of Internet of Things solutions, their growing numbers make it difficult to choose the right one.
What’s the Difference Between IEEE 802.11af and 802.11ah?
Although IEEE 802.11af and 802.11ah are both sub-1-GHz standards, they are designed to fill different niches in upcoming IoT and wireless-backhaul applications.
7 Ways to Attack Dynamic-Range Measurement Threats
Dynamic range is a limiting factor for many of the latest testing and measurement applications.
6 Technologies and Techniques to Know for Measuring Noise Figure
For noise-parameter and noise-figure measurements, tradeoffs can be made between cost, time, frequency, and quality, depending upon the test equipment available.
MMIC Quadruples Frequencies into Millimeter-Wave Bands
For 5G to be realized, circuit designs must aid current technologies in reaching the millimeter-wave bands cost-effectively without minimizing performance.
Linear-Beam-Based RF Amplifiers Suffer From Electron Emittance
With higher-frequency operation, the effects of electron-beam emittance are a more significant concern for RF/microwave devices.

How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements​
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Testing S-Parameters on Pulsed Radar Power Amplifier Modules​
Sponsored by Rohde & Schwarz
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Perform Power Supply Frequency Response Analysis using an Oscilloscope
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PAM-4 Transmitter and Receiver Design Characterization Solutions
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DisplayPort 1.3 – PHY Layer Test Requirements
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Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model
May 28, 2015 @ 1pm EST
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