Jean-Jacques DeLisle


Jean-Jacques graduated from the Rochester Institute of Technology, where he completed his Master of Science in Electrical Engineering. In his studies, Jean-Jacques focused on Control Systems Design, Mixed-Signal IC Design, and RF Design. His research focus was in smart-sensor platform design for RF connector applications for the telecommunications industry. During his research, Jean-Jacques developed a passion for the field of RF/microwaves and expanded his knowledge by doing R&D for the telecommunications industry.

Ambient RF Energy Supports Wireless Sensors
Investigators from the U.S., Canada, and Spain study far-field, low-power-density energy-harvesting technology to enable self-sustaining wireless platforms.
Organic Substrates Aid Ultra-Miniaturization of WLAN Receiver
Using chip-last embedded actives and passives in low-loss organic substrates, researchers from the Georgia Institute of Technology are able to implement an ultra-thin WLAN Rx module.
Printing Wireless IoT Sensors
Researchers from Toulouse, France, use inkjet printers to deposit carbon nanotubes on paper and other organic substrates, thus enabling IoT smart skins and zero-power electronics.
LTE Device Testing: from Theory to Measurement
As more mobile devices are being equipped with LTE technology, understanding both theory and practical measurement techniques is necessary for everyone from troubleshooting technicians to design engineers.
Enhance Active Load-Pull and Doherty PAs
Doherty PAs are becoming more common as modulation schemes increase in peak-to-average-power ratio. Using load-pull to optimize a Doherty PA design can lower device power levels and increase the PA design’s efficiency.
How to EM Simulate Large and Complex Objects
To reduce costly trial and error troubleshooting and speed design cycles, EM simulators are using specialized methods, software, and hardware techniques. These features enable them to provide significant details into the EM behavior of massive objects and simulation environments.
Inside Track with Aaron Partridge, SiTime
SiTime's founder and chief scientist discusses how MEMS timing solutions are opening the doors to low-cost RF and a plethora of Internet of Things devices.
Man and Machine: Bonded Together with RF Glue
By embracing cost-sensitive and integrated approaches, unmanned systems, COTS, DASs/small cells, and test are opening doors to technology previously only seen in science fiction.
A Closer Look at RF Power Measurements
Because measuring RF/microwave power is one of the most commonly used methods of understanding system performance, detailed knowledge of how power measurements are made is key to successfully interpreting measurement results.
Signal-Generation Advances Support Electronic Warfare’s Evolution
As technology barriers are torn down to enable complex digital, analog, and RF integrated systems, software-defined radios and intelligently controlled radios are entering the battlespace as the next generation of EW technologies.
InP Resonant Tunneling Diodes Drop LNA Noise Figure
By using resonant tunneling diodes in a negative-differential-conductance-style LNA, researchers from the Korea Advanced Institute of Science and Technology (KAIST) were able to reach a high gain-to-DC power ratio with a very low noise figure.
MIMO Radar Could Outperform Phased-Array Radar
In Sweden, researchers studied the potential benefits of spatially diverse MIMO radar compared to standard phased-array radar.
De-Embed Parasitics from Millimeter-Wave ICs
Using a half-thru transmission-line method, researchers from Grenoble, France, were able to accurately de-embed pad-interconnect and parasitic effects at millimeter-wave frequencies.
Cascade-distributed amplifier
Tips for Biasing MMIC Amplifiers
Not all applications can be served by pre-biased MMIC amplifiers. As a result, knowing the proper techniques to bias a variety of amplifier types could ease the transition to using MMIC components.
Multi-test mainframe
Cut the Cost of Wireless Manufacturing Test
With the increase in electronic devices that incorporate wireless technology, reducing the time and cost of test is of ever greater importance and an even more significant challenge.
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