Jean-Jacques DeLisle


Jean-Jacques DeLisle
Technical Editor

Jean-Jacques graduated from the Rochester Institute of Technology, where he completed his Master of Science in Electrical Engineering. In his studies, Jean-Jacques focused on Control Systems Design, Mixed-Signal IC Design, and RF Design. His research focus was in smart-sensor platform design for RF connector applications for the telecommunications industry. During his research, Jean-Jacques developed a passion for the field of RF/microwaves and expanded his knowledge by doing R&D for the telecommunications industry. Journalism was always a passion of Jean-Jacques’ as well. He enjoyed writing for RIT’s university publication in addition to working on white papers, patents, and technical articles.

Jean-Jacques is excited to cover the latest trends in research, technology, and products. He is also determined to help engineers gain access to information services, which will aid in the design process while preventing many engineers from having to "reinvent the wheel"--a problem that is so common to the field.

LTE Device Testing: from Theory to Measurement
As more mobile devices are being equipped with LTE technology, understanding both theory and practical measurement techniques is necessary for everyone from troubleshooting technicians to design engineers.
Enhance Active Load-Pull and Doherty PAs
Doherty PAs are becoming more common as modulation schemes increase in peak-to-average-power ratio. Using load-pull to optimize a Doherty PA design can lower device power levels and increase the PA design’s efficiency.
How to EM Simulate Large and Complex Objects
To reduce costly trial and error troubleshooting and speed design cycles, EM simulators are using specialized methods, software, and hardware techniques. These features enable them to provide significant details into the EM behavior of massive objects and simulation environments.
Inside Track with Aaron Partridge, SiTime
SiTime's founder and chief scientist discusses how MEMS timing solutions are opening the doors to low-cost RF and a plethora of Internet of Things devices.
Man and Machine: Bonded Together with RF Glue
By embracing cost-sensitive and integrated approaches, unmanned systems, COTS, DASs/small cells, and test are opening doors to technology previously only seen in science fiction.
A Closer Look at RF Power Measurements
Because measuring RF/microwave power is one of the most commonly used methods of understanding system performance, detailed knowledge of how power measurements are made is key to successfully interpreting measurement results.
Signal-Generation Advances Support Electronic Warfare’s Evolution
As technology barriers are torn down to enable complex digital, analog, and RF integrated systems, software-defined radios and intelligently controlled radios are entering the battlespace as the next generation of EW technologies.
InP Resonant Tunneling Diodes Drop LNA Noise Figure
By using resonant tunneling diodes in a negative-differential-conductance-style LNA, researchers from the Korea Advanced Institute of Science and Technology (KAIST) were able to reach a high gain-to-DC power ratio with a very low noise figure.
MIMO Radar Could Outperform Phased-Array Radar
In Sweden, researchers studied the potential benefits of spatially diverse MIMO radar compared to standard phased-array radar.
De-Embed Parasitics from Millimeter-Wave ICs
Using a half-thru transmission-line method, researchers from Grenoble, France, were able to accurately de-embed pad-interconnect and parasitic effects at millimeter-wave frequencies.
Cascade-distributed amplifier
Tips for Biasing MMIC Amplifiers
Not all applications can be served by pre-biased MMIC amplifiers. As a result, knowing the proper techniques to bias a variety of amplifier types could ease the transition to using MMIC components.
Multi-test mainframe
Cut the Cost of Wireless Manufacturing Test
With the increase in electronic devices that incorporate wireless technology, reducing the time and cost of test is of ever greater importance and an even more significant challenge.
PC-Driven Test Instruments Pick Up Speed
As more markets and industries embrace RF/microwave and wireless technologies, there is a growing need for low-cost, low-complexity, and easily incorporated test and measurement equipment.
Top Products of 2014
The top products of 2014 universally combine advances in technology with tremendous values in performance for the price.
Fun and Knowledge: A Holiday Gift Guide for Engineers - Splitting Signals
We’ve got even more great gift ideas for engineers – of any age! Whether you’re looking for something fun or something educational, Jean-Jacques DeLisle shares some ideas for this holiday season.

How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements​
Sponsored by Keysight Technologies
Download this white paper

Testing S-Parameters on Pulsed Radar Power Amplifier Modules​
Sponsored by Rohde & Schwarz
Download this white paper





Perform Power Supply Frequency Response Analysis using an Oscilloscope
May 19, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

PAM-4 Transmitter and Receiver Design Characterization Solutions
May 21, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

DisplayPort 1.3 – PHY Layer Test Requirements
May 27, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model
May 28, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

Connect With Us

Sponsored Introduction Continue on to (or wait seconds) ×