John Barfuss

John
Barfuss
Articles
Eliminate Fixture Effects On Device Measurements
When performing measurements on high-frequency devices that require a test fixture, some useful techniques such as de-embedding and port extensions can improve overall VNA test accuracy.
Perfecting Pulsed RF Radar Measurements
Pulsed RF radar signals must be accurately characterized to evaluate a radar system's performance,therefore using the right test tools is vital. Modern radar test instruments,with advances in DSP measurement technology, are able to provide even ...
Perfecting Pulsed RF Radar Measurements
Pulsed RF radar signals must be accurately characterized to evaluate a radar system's performance,therefore using the right test tools is vital. Modern radar test instruments,with advances in DSP measurement technology,are able to provide even greater ...
Test Spectrum Analyzer ACP Dynamic Range
Published specifications for adjacent-channel power (ACP) are just one indication of a spectrum analyzers capabilities when making actual measurements.
Whitepapers

How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements​
Sponsored by Keysight Technologies
Download this white paper


Testing S-Parameters on Pulsed Radar Power Amplifier Modules​
Sponsored by Rohde & Schwarz
Download this white paper

 

 

 

Webcasts

Perform Power Supply Frequency Response Analysis using an Oscilloscope
May 19, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


PAM-4 Transmitter and Receiver Design Characterization Solutions
May 21, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


DisplayPort 1.3 – PHY Layer Test Requirements
May 27, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model
May 28, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

Connect With Us

Sponsored Introduction Continue on to (or wait seconds) ×