John Barfuss

John
Barfuss
Articles
Eliminate Fixture Effects On Device Measurements
When performing measurements on high-frequency devices that require a test fixture, some useful techniques such as de-embedding and port extensions can improve overall VNA test accuracy.
Perfecting Pulsed RF Radar Measurements
Pulsed RF radar signals must be accurately characterized to evaluate a radar system's performance,therefore using the right test tools is vital. Modern radar test instruments,with advances in DSP measurement technology, are able to provide even ...
Perfecting Pulsed RF Radar Measurements
Pulsed RF radar signals must be accurately characterized to evaluate a radar system's performance,therefore using the right test tools is vital. Modern radar test instruments,with advances in DSP measurement technology,are able to provide even greater ...
Test Spectrum Analyzer ACP Dynamic Range
Published specifications for adjacent-channel power (ACP) are just one indication of a spectrum analyzers capabilities when making actual measurements.
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Poster Worldwide Spectrum Allocations
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Achieving Excellent Spectrum Analysis Results Using Innovative Noise, Image and Spur Suppression Techniques
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