John Barfuss

John
Barfuss
Articles
Eliminate Fixture Effects On Device Measurements
When performing measurements on high-frequency devices that require a test fixture, some useful techniques such as de-embedding and port extensions can improve overall VNA test accuracy.
Perfecting Pulsed RF Radar Measurements
Pulsed RF radar signals must be accurately characterized to evaluate a radar system's performance,therefore using the right test tools is vital. Modern radar test instruments,with advances in DSP measurement technology, are able to provide even ...
Perfecting Pulsed RF Radar Measurements
Pulsed RF radar signals must be accurately characterized to evaluate a radar system's performance,therefore using the right test tools is vital. Modern radar test instruments,with advances in DSP measurement technology,are able to provide even greater ...
Test Spectrum Analyzer ACP Dynamic Range
Published specifications for adjacent-channel power (ACP) are just one indication of a spectrum analyzers capabilities when making actual measurements.
Whitepapers

IMD Measurements with IMDView: MS4640B Series Vector Network Analyzer
Sponsored by Anritsu
‚Äč
Download this white paper


How to Select an Analog Signal Generator
Sponsored by Rohde & Schwarz
Download this white paper

Webcasts

MIPI - Overcome Test Challenges to Ensure Interoperability for your PHY
June 23, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


Automating Semiconductor and Power Semiconductor Device Testing
June 24, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!


Successfully Make Power and AC Line Disturbance Measurements
June 25, 2015 @ 1pm EST
Sponsored by Keysight Technologies
Register Now!

 

Connect With Us

Sponsored Introduction Continue on to (or wait seconds) ×