Larry Dangremond

Larry
Dangremond
Articles
Tracking Advances In Probing Mixed-Mode RF Circuitry
Refinements in both the measurement probes and the calibration standard structures used with them makes it possible to perform more accurate microwave VNA S-parameter measurements on differential devices.
Whitepapers

Speed Time to Market with Consistent Measurements from R&D through Manufacturing
Sponsored by Keysight Technologies
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2015 Back to Basics DVD-Modern Measurement Fundamentals
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Webcasts

The Continuing Adventures of CMOS Technology - Power and Linearity at Microwave Frequencies
August 20, 2015 @ 2 pm EST
Sponsored by Peregrine Semiconductor
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