Michael Schnecker

Articles by Michael Schnecker
Measure Impedance And Insertion Loss In USB 3.0 Cables And Connectors
The very high bit rates employed by next-generation serial data standards extend well into the microwave region. For example, the upcoming highspeed Universal Serial Bus (USB3.0) supports transfer rates to 5 Gb/s over twisted-pair cables. ...

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GaN Roundtable: The State of GaN Reliability Today

Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.

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New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
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Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
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