Pete Hulbert

Pete
Hulbert
Articles
Use Pulse I-V Testing To Characterize RF Devices
Pulsed I-V device characterization can be performed by means of swept or single-pulse measurements, keeping in mind that the test system must be carefully selected and calibrated.
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Speed Time to Market with Consistent Measurements from R&D through Manufacturing
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2015 Back to Basics DVD-Modern Measurement Fundamentals
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The Continuing Adventures of CMOS Technology - Power and Linearity at Microwave Frequencies
August 20, 2015 @ 2 pm EST
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