Pete Hulbert

Pete
Hulbert
Articles
Use Pulse I-V Testing To Characterize RF Devices
Pulsed I-V device characterization can be performed by means of swept or single-pulse measurements, keeping in mind that the test system must be carefully selected and calibrated.
Whitepapers

Adding EMI Pre-compliance Testing to the Product Development Process is Cost-effective Insurance
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New! Wi-Fi Standards Poster
Sponsored by Tektronix
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Reducing Life Cycle Costs with Reliable Airframe Microwave Assemblies
Sponsored by WL Gore
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Webcasts

Power Integrity Measurements – Choosing the Right Tools
February 26, 2015 @ 1pm EST
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USB 3.1 - Gen2 10Gbps Receiver Test Challenges
March 11, 2015 @ 1pm EST
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