Jack Browne, Technical Contributor, has worked in technical publishing for over 30 years. He managed the content and production of three technical journals while at the American Institute of Physics, including Medical Physics and the Journal of Vacuum Science & Technology. He has been a Publisher and Editor for Penton Media, started the firm’s Wireless Symposium & Exhibition trade show in 1993, and currently serves as Technical Contributor for that company's Microwaves & RF magazine. Browne, who holds a BS in Mathematics from City College of New York and BA degrees in English and Philosophy from Fordham University, is a member of the IEEE.

Posts by Jack Browne

in Measuring Progress Sep 07, 2016

Getting Started with Antenna Measurements

Constructing an antenna test system involves an educated choice of instruments, subsystems, and shielding materials....More
in Measuring Progress Aug 11, 2016

Scopes Are Essential at Any Frequency

RF/microwave engineers have been spoiled somewhat by the modern test bench, with highly accurate and programmable test signal sources....More
Step attenuator
in Measuring Progress Jul 21, 2016

Accessories Add Up to Better Measurements

Test accessories, usually in the form of active and passive components, may seem insignificant compared to the importance of a signal analyzer, but....More
in Measuring Progress Jun 30, 2016

Calibration Can Make All the Difference

Calibrating RF/microwave test instruments may seem unnecessary, but it can make a huge difference in the quality of a company’s products as well as....More
in Measuring Progress Apr 26, 2016

Making the Rounds for New Test Gear at IMS

The 2016 IMS in San Francisco’s Moscone Center is a wonderful opportunity to “go shopping” for new test equipment....More
in Measuring Progress Apr 08, 2016

In Sharing, There is Learning: The 87th ARFTG Conference

Attendees of the 2016 IMS involved with test are encouraged not to miss the 87th ARFTG Measurement Conference....More
in Measuring Progress Mar 15, 2016

Modular Test Gear Can Tame Wireless IoT Environments

Modular instruments provide the flexibility to adapt to the changing test needs of IoT operating environments....More
in Measuring Progress Feb 16, 2016

How Can You Test Something That’s “Black Magic”?

Millimeter-wave frequencies were once thought as being on “the realm of possibility”—which is to say, at frequencies where no sane engineer would....More
in Measuring Progress Dec 29, 2015

What’s Noise Got to Do With It?

Noise may be part of celebrating a New Year, but it is usually not a welcome element in a high-frequency test system. That is, unless it is....More
in Measuring Progress Nov 04, 2015

Is Modular Really More For Less?

Older engineers may fondly remember an early job and that first stroll past a test bench. Those impressive 19-in. instrument racks were filled....More

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