FRANK GROEGER, Head of Strategic Marketing at Rohde & Schwarz's Test and Measurement Division, comments on the debate over modular versus standalone instruments:
"A combination of the two approaches can result in an optimum measurement solution: standalone instruments for RF and microwave measurements and a suitable modular system for additional measurements. Why not combine the strengths of both approaches?"
GaN Roundtable: The State of GaN Reliability Today
Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
Download this white paper
