Keithley Instruments has introduced the industry's first measurement-grade 8 x 8 multiple-input, multiple-output (MIMO) test system to support developers of next-generation wireless MIMO devices. The test system allows, for example, evolution of antennas for adaptive beamforming applications, and can test a wide range of channel configurations for as many as eight synchronized radios or radio channels at one time. It provides the performance needed for multichannel MIMO testing, including full phase and amplitude control of RF carriers with better than 1 ns synchronization among signals. The 8 x 8 MIMO test system also boasts less than 1 ns peak-to-peak signal sampler jitter and less than 1 deg. of peak-to-peak RF carrier phase jitter. The test system is based on the company's model 2820 RF vector signal analyzer (VSAs) (with frequency range of 0.4 to 6.0 GHz) and the model 2920 vector signal generator (with frequency range of 10 MHz to 6 GHz). For more information on the 8 x 8 MIMO test system, visit the Keithley web site.