Model AVR-CD1-B is an instrument developed by Avtech Electrosystems to evaluate the reverse recovery time of diodes and other semiconductor devices. It can operate remotely under RS-232C and GPIB control and is cable of applying a forward bias pulse of +0.1 to +10.0 A to a device under test (DUT). At the end of the pulse, the current ramps downward at an adjustable rate of 100 to 200 A/microsecond until the diode stops conducting. The current waveforms generated by the instrument are suitable for MIL-STD-750E Method 4031.4 Test Condition D measurements, and custom versions are also available.
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Tester Checks Reverse Recovery Of Diodes
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GaN Roundtable: The State of GaN Reliability Today
Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.
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