The IEEE International Reliability Physics Symposium's (IRPS) annual conference returns to Phoenix, AZ next April 15-19, 2007 in the new Phoenix Convention Center. The three-day conference focuses on the study of failure mechanisms for microelectronic and nanoelectronic devices. The technical program chair is Dr. Ronald Lacoe of The Aerospace Corporation, currently serving as a member of the firm's technical staff and senior scientist in the Microelectronics Technology Department. Last year's conference drew more than 650 industry professionals in search of higher component reliability. For more information on the conference, visit the IRPS website at: www.irps.org/