Keithley Instruments has partnered with the French Mesatronic Group to develop probe cards for semiconductor parametric testing at RF and for low-current DC applications. The new probe cards will work with Keithley parametric testers for simultaneous on-wafer RF and low-level DC testing on any combination of probe pins. The new probe card design will allow higher test throughput since both RF and DC tests can be made with a single wafer insertion. A key to the new probe card is a spatial transformer that interfaces the probe card with a flexible membrane circuit structure in the center of the wafer prober where the probe contact needles are attached. For more on Keithley, visit their web site at http://www.keithley.com/
For more on Mesastronic, go to
http://www.mesatronic.com/