Rather than having to buy and cable together two separate test instruments, engineers working on fourth-generation (4G) Long Term Evolution (LTE) handsets can now rely on a onebox test system for cell-phone signal fading simulation. This fading simulator option is integrated within the 7100 series digital-radio test set. That signal generator and analyzer covers 70 MHz to 6 GHz continuously with resolution of 1 Hz to 3 GHz and 2 Hz above 3 GHz. To accommodate future LTE needs, the 7100 series fading simulator supports all LTE bandwidths to 20 MHz. It supports both LTE frequency and time division duplexing (FDD and TDD). An integrated 3GPP Rel-8 LTE-compliant physical layer and protocol stack are included. The system offers a comprehensive suite of RF parametric measurements and protocol logging and analysis. It also includes inter-Radio Access Technology (RAT) handover support, automatic network simulation, functional testing, and end-to-end IP packet data test. The 7100 series test platform also provides flexibility in allocating cells and fading taps for LTE user equipment (UE) without the need for manual reconfiguration. Among the repeatable test scenarios presented by the 7100 series with the fading simulator are the emulation of dynamic environments and the realistic and accurate testing of multiple-input multiple-output (MIMO) scenarios. With the LTE future in mind, the 7100 series fading simulator supports all LTE bandwidths to 20 MHz with a frequency range up to 6 GHz. The fading simulator supports all 3GPP fading profiles, allowing users to determine if their device conforms to 3GPP test specifications. P&A: A typical system with two RF carriers and 2x2 MIMO is approximately $100,000. The Fading Simulator (Option 101) software is priced at $10,000.
Aeroflex, Inc., 35 South Service Rd., P.O. Box 6022, Plainview, NY 11803-0622; (800) 835-2352, Internet: www.aeroflex.com.