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    Practical Guide to Making Advanced Jitter Measurements

    To characterize high-speed digital links, jitter measurements are key to ascertain the quality of the signal being transmitted, and yieds a quick view of the Bit Error Ration that can be supported by the link. The measurement of jitter, even if the user is provided a one-button interface...More
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    GaN Roundtable

    View our GaN Roundtable from June 6, 2012, where industry experts debated various claims about gallium nitride. They revealed its true strengths and weaknesses while explaining how this semiconductor material is changing microwave and RF design. Register now to view this event!...More
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    Conquering USB 3.0 Physical Layer Test Challenges

    USB 3.0 is hitting the mainstream market in a big way in 2012. With native Windows 8 support for USB 3.0 and Intel’s integrated chipset shipping this year, SuperSpeed USB 3.0 adoption rates will really take off...More
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    Accelerating USB 3.0 Protocol Development

    SuperSpeed USB presents a new set of challenges for design verification and debug of the protocol layer. To take advantage of the new USB SuperSpeed data rate of 5 Gbps, devices must do much more than simply run at a higher data rate...More
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    Top 5 sources of noise problems when using precision SAR ADCS

    Precision Successive-Approximation-Register (SAR) Analog-to-Digital-Converters (ADC) are the preferred converters for fast reacting systems requiring zero or close to zero conversion cycle latency...More
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    UL1449 Surge Protection Solutions—Lighting Surge Protection Tutorial

    Sponsored by TTI & Littelfuse...More
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    See the Future of High-Performance Real-Time Oscilloscopes

    High-performance oscilloscopes are taking the next leap into the future. See how in this webcast from Agilent Technologies. You’ll want to attend if you make high-speed signal integrity measurements or validate leading-edge designs...More

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Webcasts

GaN Roundtable: The State of GaN Reliability Today

Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.

Click here to register!

Whitepapers

New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
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Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
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