Resources

May 14, 2013

White Paper

Microwaves and RF

Measuring Agile Signals and Dynamic Signal Environments

For the capable RF engineer, continuous-wave (CW) and predictably-repeating signals are no great challenge—but today’s complex and agile signals and multi-signal environments are proving to be another matter. To keep up with evolving analysis needs, new types of signal analyzers and application software have emerged in recent years. Unfortunately, though, the relative benefits of these approaches are not yet widely understood....More
Apr. 19, 2013

Datasheet

Microwaves and RF

Top 5 RF Essentials Vol. III (PDF download)

Download your copy of the Top 5 RF Essentials report below. We hope you enjoy the report and archive it for future reference...More
Mar. 11, 2013

Article

Microwaves and RF

Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications

Today, almost all wireless services use a plethora of complex carrier modulation schemes. Additionally, more products and services rely on the capability of one or more wireless technologies to operate properly...More
Feb. 21, 2013

White Paper

Microwaves and RF

Learn how to accelerate test throughput for antenna arrays while providing increased bandwidth

It can be difficult to align the antennas in an array in phase and amplitude so they can be used together effectively...More
Feb. 21, 2013

White Paper

Microwaves and RF

Achieve channel to channel coherency while accelerating test throughput for radar, satellite beam forming, MIMO and high energy applications

This application note describes the measurement and analysis of cross channel skew in multichannel high speed digitizers over short and long durations to sub-picosecond scales...More
White Paper

How to Make Precise Measurements in the Field with Microwave Analyzers

These informative application notes cover a range of measurements using FieldFox analyzers...More
White Paper

Application Note: Secondary Radar Transponder Testing Using the 8990B Peak Power Analyzer

Learn more about the background of radar systems and the role of transponders in these systems, and why periodic maintenance and calibration of transponder test sets are important for ensuring aviation safety...More
White Paper

Two New “Power of X” app notes on LTE-Advanced Physical Layer Design & Test and Testing DigRF Interfaces

Agilent's X Platforms let engineers bring innovative, higher-performing designs to market faster. Agilent has two new "Power of X" application notes "Solutions for LTE-Advanced Physical Layer Design and Test" and "Solutions for Testing DigRF Interfaces"...More
White Paper

Read White Paper: Redefining RF and Microwave Instrumentation Through Open Software and Modular Hardware

If you are an engineer making measurements or performing automated tests on electronic devices, you either work with or will work with RF and microwave measurements. When the time comes to add RF to a test system, it may prove significantly more challenging than adding other measurements of the past...More
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Practical Guide to Making Advanced Jitter Measurements

To characterize high-speed digital links, jitter measurements are key to ascertain the quality of the signal being transmitted, and yieds a quick view of the Bit Error Ration that can be supported by the link. The measurement of jitter, even if the user is provided a one-button interface...More

Measuring Agile Signals and Dynamic Signal Environments

Top 5 RF Essentials Vol. III (PDF download)

Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications

Learn how to accelerate test throughput for antenna arrays while providing increased bandwidth

Achieve channel to channel coherency while accelerating test throughput for radar, satellite beam forming, MIMO and high energy applications

How to Make Precise Measurements in the Field with Microwave Analyzers

Application Note: Secondary Radar Transponder Testing Using the 8990B Peak Power Analyzer

Two New “Power of X” app notes on LTE-Advanced Physical Layer Design & Test and Testing DigRF Interfaces

Read White Paper: Redefining RF and Microwave Instrumentation Through Open Software and Modular Hardware

Practical Guide to Making Advanced Jitter Measurements

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