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  • May 12, 2015
    blog

    Measuring Visits at IMS Booths 1

    The RF/microwave industry as a whole looks forward to the annual IEEE International Microwave Symposium (IMS) not only for its excellent collection of technical papers and workshops, but for the opportunity to see old friends and prowl the exhibition floor in search of new products and to eyeball what competitors are showing....More
Whitepapers

How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements​
Sponsored by Keysight Technologies
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Testing S-Parameters on Pulsed Radar Power Amplifier Modules​
Sponsored by Rohde & Schwarz
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Webcasts

Perform Power Supply Frequency Response Analysis using an Oscilloscope
May 19, 2015 @ 1pm EST
Sponsored by Keysight Technologies
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PAM-4 Transmitter and Receiver Design Characterization Solutions
May 21, 2015 @ 1pm EST
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DisplayPort 1.3 – PHY Layer Test Requirements
May 27, 2015 @ 1pm EST
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Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model
May 28, 2015 @ 1pm EST
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