Learning Resources http://mwrf.com/taxonomy/term/6608/more en Introduction to RF Design - Part 1 http://mwrf.com/test-measurement-analyzers/introduction-rf-design-part-1 <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">RF Design or the process of transmitting information wirelessly is utilized in devices ranging from mobile phones to satellite TV to wireless Internet connections and Bluetooth devices. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/introduction-rf-design-part-1" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/introduction-rf-design-part-1#comments Analog semiconductors Passive components Test & Measurement - analyzers White Paper Tue, 18 Aug 2015 18:06:00 +0000 36321 at http://mwrf.com IMS2015 MicroApps CD – free while supplies last! http://mwrf.com/test-measurement/ims2015-microapps-cd-free-while-supplies-last <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">The MicroApps program at the IEEE MTT-S International Microwave Symposium (IMS2015) held in Phoenix, Arizona had nearly 80 presentations covering the hottest topics in RF/uW.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/ims2015-microapps-cd-free-while-supplies-last" target="_blank">read more</a></p> http://mwrf.com/test-measurement/ims2015-microapps-cd-free-while-supplies-last#comments Test & Measurement White Paper Fri, 07 Aug 2015 19:15:00 +0000 36041 at http://mwrf.com Radar and Electronic Warfare Systems Design Resources http://mwrf.com/test-measurement/radar-and-electronic-warfare-systems-design-resources <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">Electronic Warfare Fundamentals Poster. This poster contains a radar warning receiver and DRFM based jammer block diagrams, a compare and contrast of Radar versus EW, basic equations, cross-eye jamming, modern jamming techniques, three areas of EW; common acronyms and the latest hardware and software for electronic warfare test and measurement.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/radar-and-electronic-warfare-systems-design-resources" target="_blank">read more</a></p> http://mwrf.com/test-measurement/radar-and-electronic-warfare-systems-design-resources#comments Test & Measurement White Paper Fri, 07 Aug 2015 19:06:00 +0000 36031 at http://mwrf.com Find Signal Integrity Problems Faster through TDR/TDT Measurements http://mwrf.com/webinar/find-signal-integrity-problems-faster-through-tdrtdt-measurements-0 <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-08272015_1.jpg?1438870784" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, August 27, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="84"><img alt="Most" border="1" src="http://www.penton.com/webcasts/ED_Most.jpg" /></td> <td class="style3" width="256"><strong>Jeff Most</strong><br /> Product Manager<br /> <strong>Keysight Technologies, Inc.</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">On today’s high-speed digital designs, signal integrity issues such as reflections, excessive losses, and crosstalk can degrade system performance. In this webcast, we provide tips and techniques for using TDR/TDT measurements to characterize and troubleshoot these effects, including easy calibration methods that enhance measurement accuracy. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/find-signal-integrity-problems-faster-through-tdrtdt-measurements-0" target="_blank">read more</a></p> Webcasts Thu, 06 Aug 2015 14:01:00 +0000 35931 at http://mwrf.com Advanced Measurement and Analysis using InfiniiVision X-Series Oscilloscopes http://mwrf.com/webinar/advanced-measurement-and-analysis-using-infiniivision-x-series-oscilloscopes <div class="field-deck"> Sponsored by: Keysight Technologies & Newark element14 </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-newark-Webinar-09012015.jpg?1438871753" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-start">Tuesday, September 1, 2015 - 13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">Wednesday, September 30, 2015 - 14:00</span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="84"><img alt="Hoffman" border="1" src="http://www.penton.com/webcasts/EDHoffman.jpg" /></td> <td class="style3" width="256"><strong>Mike Hoffman</strong><br /> Marketing Engineer<br /> <strong>Keysight Technologies, Inc.</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Once you are able to identify and isolate a signal error in your design, what are some techniques you can employ to determine the root cause? Learn how Keysight oscilloscopes can help you analyze signals and hunt down the culprit of various common signal integrity issues in your designs. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/advanced-measurement-and-analysis-using-infiniivision-x-series-oscilloscopes" target="_blank">read more</a></p> Webcasts Thu, 06 Aug 2015 14:01:00 +0000 35941 at http://mwrf.com The Continuing Adventures of CMOS Technology - Power and Linearity at Microwave Frequencies http://mwrf.com/webinar/continuing-adventures-cmos-technology-power-and-linearity-microwave-frequencies <div class="field-deck"> Sponsored by: Peregrine Semiconductor </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-PeregrineSemiconductor-Webinar-08202015.jpg?1438364989" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, August 20, 2015 - <span class="date-display-start">14:00</span><span class="date-display-separator"> - </span><span class="date-display-end">15:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p align="left" class="style11"><strong>Presented by: </strong></p> <table border="0" width="300"> <tbody> <tr> <td width="102"><img alt="Bacon" border="1" src="https://event.on24.com/event/10/29/98/7/rt/1/logo/register/mwrf_bacon.jpg" /></td> <td class="style3" width="175"><strong>Peter Bacon</strong><br /> Director,<br /> System Integration<br /> <strong>Peregrine Semiconductor </strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Since its invention in 1963, complementary metal–oxide–semiconductor (CMOS) technology has been the underdog of technologies and has had to prove itself against incumbent technologies. Leveraging the simple, yet capital-intensive concept of gate length scaling, CMOS has continued to take over markets once thought owned by the entrenched technologies.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/continuing-adventures-cmos-technology-power-and-linearity-microwave-frequencies" target="_blank">read more</a></p> Webcasts Fri, 31 Jul 2015 17:38:00 +0000 35661 at http://mwrf.com Software Defined Radio Handbook http://mwrf.com/test-measurement/software-defined-radio-handbook <div class="field-deck"> Sponsored by Pentek </div> <div class="node-body article-body"><p>Software Defined Radio has revolutionized electronic systems for a variety of applications that include communications, data acquisition and signal processing. Recently updated, this handbook shows how DDCs (Digital Downconverters), the fundamental building block of software radio, can replace legacy analog receiver designs while offering significant performance, density, and cost benefits. Pentek SDR products and some of their applications are also presented.</p> <p>Register here to download your free copy.</p></div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/software-defined-radio-handbook" target="_blank">read more</a></p> http://mwrf.com/test-measurement/software-defined-radio-handbook#comments Test & Measurement White Paper Wed, 22 Jul 2015 14:27:00 +0000 35571 at http://mwrf.com Accelerate 5G design and test resources from Keysight http://mwrf.com/white-paper/accelerate-5g-design-and-test-resources-keysight <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="node-body article-body">Keysight wireless design and test tools enable the exploration of new technologies needed for next-generation 5G communications. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/accelerate-5g-design-and-test-resources-keysight" target="_blank">read more</a></p> http://mwrf.com/white-paper/accelerate-5g-design-and-test-resources-keysight#comments Services Test & Measurement White Paper Tue, 14 Jul 2015 18:11:00 +0000 35511 at http://mwrf.com How to Use a SERDES Channel Simulator for PAM-4 Simulations and Analysis http://mwrf.com/webinar/how-use-serdes-channel-simulator-pam-4-simulations-and-analysis <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-07232015.jpg?1435159880" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, July 23, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> </fieldset> <div class="node-body webinar-body">As people use more and more apps on their phones, tablets, computers, and IoT devices, the network needed to deliver the data is constantly being upgraded. PAM-4 signaling is a leading contender for implementing the 56G lane data rate which will enable 400G links and fuel the next upgrade in network bandwidth.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/how-use-serdes-channel-simulator-pam-4-simulations-and-analysis" target="_blank">read more</a></p> Webcasts Wed, 24 Jun 2015 15:25:00 +0000 34961 at http://mwrf.com Automating Semiconductor and Power Semiconductor Device Testing http://mwrf.com/webinar/automating-semiconductor-and-power-semiconductor-device-testing <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06242015.jpg?1434031344" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, June 24, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p align="left" class="style3"><strong>Speakers: </strong></p> <table border="0" width="300"> <tbody> <tr> <td width="84"><img alt="Olsen" height="100" src="http://www.penton.com/webcasts/ED_Olsen.jpg" width="100" /></td> <td class="style3" width="256"><strong>Jeff Olsen </strong><br /> President, Sales -<br /> <strong>Hiller Measurements</strong></td> </tr> </tbody> </table> <table border="0" width="300"> <tbody> <tr> <td width="84">&nbsp;</td> <td class="style3" width="256"><strong>Derek Gordon</strong><br /> Test and Measurement Manager -<br /> <strong>GAP Wireless</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Automating semiconductor and power semiconductor (including wide band gap) device testing presents a number of measurement challenges. In addition to hardware issues such as cabling, fixturing and instrument synchronization, developing the necessary software to integrate everything together can be a daunting task. Keysight and its solution partners can help you meet these unique test challenges, from the development of a turnkey solution to the re-engineering of an existing platform. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/automating-semiconductor-and-power-semiconductor-device-testing" target="_blank">read more</a></p> Webcasts Thu, 11 Jun 2015 13:50:00 +0000 34831 at http://mwrf.com