Learning Resources http://mwrf.com/taxonomy/term/6608/more en How to Use a SERDES Channel Simulator for PAM-4 Simulations and Analysis http://mwrf.com/webinar/how-use-serdes-channel-simulator-pam-4-simulations-and-analysis <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-07232015.jpg?1435159880" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, July 23, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> </fieldset> <div class="node-body webinar-body">As people use more and more apps on their phones, tablets, computers, and IoT devices, the network needed to deliver the data is constantly being upgraded. PAM-4 signaling is a leading contender for implementing the 56G lane data rate which will enable 400G links and fuel the next upgrade in network bandwidth.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/how-use-serdes-channel-simulator-pam-4-simulations-and-analysis" target="_blank">read more</a></p> Webcasts Wed, 24 Jun 2015 15:25:00 +0000 34961 at http://mwrf.com Automating Semiconductor and Power Semiconductor Device Testing http://mwrf.com/webinar/automating-semiconductor-and-power-semiconductor-device-testing <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06242015.jpg?1434031344" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, June 24, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p align="left" class="style3"><strong>Speakers: </strong></p> <table border="0" width="300"> <tbody> <tr> <td width="84"><img alt="Olsen" height="100" src="http://www.penton.com/webcasts/ED_Olsen.jpg" width="100" /></td> <td class="style3" width="256"><strong>Jeff Olsen </strong><br /> President, Sales -<br /> <strong>Hiller Measurements</strong></td> </tr> </tbody> </table> <table border="0" width="300"> <tbody> <tr> <td width="84">&nbsp;</td> <td class="style3" width="256"><strong>Derek Gordon</strong><br /> Test and Measurement Manager -<br /> <strong>GAP Wireless</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Automating semiconductor and power semiconductor (including wide band gap) device testing presents a number of measurement challenges. In addition to hardware issues such as cabling, fixturing and instrument synchronization, developing the necessary software to integrate everything together can be a daunting task. Keysight and its solution partners can help you meet these unique test challenges, from the development of a turnkey solution to the re-engineering of an existing platform. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/automating-semiconductor-and-power-semiconductor-device-testing" target="_blank">read more</a></p> Webcasts Thu, 11 Jun 2015 13:50:00 +0000 34831 at http://mwrf.com Successfully Make Power and AC Line Disturbance Measurements http://mwrf.com/webinar/successfully-make-power-and-ac-line-disturbance-measurements <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06252015.jpg?1434031650" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, June 25, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="101"><img alt="Raposa" height="118" src="http://www.penton.com/webcasts/ED_Raposa.jpg" width="100" /></td> <td class="style3" width="239"> <p><strong>Gary Raposa</strong><br /> <strong class="style3">Application Specialist</strong><br /> <strong>Keysight Technologies</strong></p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">If you are developing or evaluating products or devices that use AC or DC power conversion technology, there are a variety of power measurements of interest. In addition to measuring the standard power parameters such as watts, VA, VAR, power factor, crest factor, and efficiency, evaluating the response of your device to AC line disturbances such as surges, sags, brownouts, cycle dropouts, and transients is critical. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/successfully-make-power-and-ac-line-disturbance-measurements" target="_blank">read more</a></p> Webcasts Thu, 11 Jun 2015 13:50:00 +0000 34841 at http://mwrf.com Speed Time to Market with Consistent Measurements from R&D Through Manufacturing http://mwrf.com/test-measurement/speed-time-market-consistent-measurements-rd-through-manufacturing <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">When multiple instrument form factors such as benchtop and PXI instruments are used in your design and manufacturing processes the challenge is to achieve reliably consistent measurement results while using the best instrument for a specific purpose.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/speed-time-market-consistent-measurements-rd-through-manufacturing" target="_blank">read more</a></p> http://mwrf.com/test-measurement/speed-time-market-consistent-measurements-rd-through-manufacturing#comments Test & Measurement Test & Measurement - analyzers White Paper Tue, 02 Jun 2015 14:13:00 +0000 34581 at http://mwrf.com IMD Measurements with IMDView™ - MS4640B Series Vector Network Analyzer http://mwrf.com/test-measurement-analyzers/imd-measurements-imdview-ms4640b-series-vector-network-analyzer <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">Intermodulation distortion (IMD) is an important consideration in microwave and RF component design. This application note discusses the meaning of the IMD measurement and measurement considerations.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/imd-measurements-imdview-ms4640b-series-vector-network-analyzer" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/imd-measurements-imdview-ms4640b-series-vector-network-analyzer#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Passive components Test & Measurement - analyzers Test & Measurement - generators White Paper Tue, 26 May 2015 13:30:00 +0000 34341 at http://mwrf.com Validate PCIe® Power Saving with L1 Substate Analysis http://mwrf.com/webinar/validate-pcie-power-saving-l1-substate-analysis-0 <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06172015.jpg?1432239865" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, June 17, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" src="http://www.penton.com/webcasts/SchoeneckerDon.jpg" /></p> </td> <td width="400"><strong>Don Schoenecker</strong><br /> PCIe&reg; Protocol Test Product Manager<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Today's PCI Express designs must consider power efficiency in order to meet the low power needs of many PCIe® based computing devices. Optimizing designs for divergent applications requires complete protocol insight into the trade-off of performance versus power consumption.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/validate-pcie-power-saving-l1-substate-analysis-0" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34311 at http://mwrf.com Optimizing Battery Run and Charge Times of Today’s Mobile Wireless Devices http://mwrf.com/webinar/optimizing-battery-run-and-charge-times-today-s-mobile-wireless-devices <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06182015.jpg?1432241615" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, June 18, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" src="http://www.penton.com/webcasts/ED_Brorein.jpg" /></p> </td> <td width="400"><strong>Ed Brorein</strong><br /> Application Specialist<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Today’s smart mobile wireless devices have amazing capabilities enabling to perform a myriad of advanced applications. However, their power consumption has grown considerably as a result. Providing acceptable battery run-time is more important than ever, and, with much larger batteries, providing an acceptable charging time has now become another top priority.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/optimizing-battery-run-and-charge-times-today-s-mobile-wireless-devices" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34321 at http://mwrf.com MIPI – Overcome Test Challenges to Ensure Interoperability for your PHY http://mwrf.com/webinar/mipi-overcome-test-challenges-ensure-interoperability-your-phy <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06232015.jpg?1432242878" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, June 23, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" src="http://www.penton.com/webcasts/EDWoerner.jpg" /></p> </td> <td width="400"><strong>Matthew Woerner</strong><br /> Technical Program Manager<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Various physical layer standards are developed by Mobile Industry Processor Interface (MIPI) Alliance standards body to address performance and power requirements in mobile applications. With physical data rates extended to 4.5 Gb/s for D-PHY, 11.6 Gb/s for M-PHY and 2.5 GSym/s for C-PHY, signal integrity will be critical to guarantee interoperability. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/mipi-overcome-test-challenges-ensure-interoperability-your-phy" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34331 at http://mwrf.com Tips and Techniques for Making the Best Oscilloscope Measurements http://mwrf.com/webinar/tips-and-techniques-making-best-oscilloscope-measurements <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06162015.jpg?1432239306" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, June 16, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" height="100" src="http://www.penton.com/webcasts/ED_Bogdanoff.jpg" width="100" /></p> </td> <td width="400"><strong>Daniel Bogdanoff</strong><br /> Oscilloscope Product Manager<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Learn how to get the most out of your oscilloscope measurements. When debugging or validating your design, it is important to understand both the measurement capabilities of your oscilloscope and the different factors that influence the effectiveness of specific measurements.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/tips-and-techniques-making-best-oscilloscope-measurements" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34291 at http://mwrf.com How to Select an Analog Signal Generator http://mwrf.com/test-measurement/how-select-analog-signal-generator <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Today's microwave and wireless communications market is expanding at an incredible rate, thus increasing the need for test equipment that will help verify the performance of devices and systems. A flexible tool for a broad scope of applications is the signal generator because of its wide frequency range, high output power and variety of modulations. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/how-select-analog-signal-generator" target="_blank">read more</a></p> http://mwrf.com/test-measurement/how-select-analog-signal-generator#comments Test & Measurement Test & Measurement - generators White Paper Tue, 28 Apr 2015 18:43:00 +0000 33761 at http://mwrf.com