Learning Resources http://mwrf.com/taxonomy/term/6608/more en How to Build a Super DAQ System in a PXIe Chassis using Xilinx UltraScale FPGA XMC Modules http://mwrf.com/test-measurement-analyzers/how-build-super-daq-system-pxie-chassis-using-xilinx-ultrascale-fpga-xmc- <div class="field-deck"> Sponsored by Innovative Integration </div> <div class="node-body article-body">Native PXI/PXIe modules are generally aimed at the testing market, which means they tend to have lower throughput, with less processing power than needed in high performance data acquisition systems. This concern can be addressed by XMC modules powered by Xilinx UltraScale FPGAs that provide a universe of high performance data acquisition functions, featuring higher sample rates, and greater processing power with the on board FPGA’s, than typical PXI/PXIe modules.</div> <p><a href="http://mwrf.com/test-measurement-analyzers/how-build-super-daq-system-pxie-chassis-using-xilinx-ultrascale-fpga-xmc-" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/how-build-super-daq-system-pxie-chassis-using-xilinx-ultrascale-fpga-xmc-#comments Services Software Systems Test & Measurement Test & Measurement - analyzers Test & Measurement - generators White Paper Fri, 22 Jul 2016 14:08:00 +0000 46651 at http://mwrf.com dB or not dB? Everything you ever wanted to know about decibels but were afraid to ask http://mwrf.com/analog-semiconductors/db-or-not-db-everything-you-ever-wanted-know-about-decibels-were-afraid-ask <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">True or false? 30 dBm + 30 dBm = 60 dBm? Why does 1% work out to be -40 dB one time but then 0.1 dB or 0.05 dB the next time?</div> <p><a href="http://mwrf.com/analog-semiconductors/db-or-not-db-everything-you-ever-wanted-know-about-decibels-were-afraid-ask" target="_blank">read more</a></p> http://mwrf.com/analog-semiconductors/db-or-not-db-everything-you-ever-wanted-know-about-decibels-were-afraid-ask#comments Analog semiconductors Test & Measurement - analyzers White Paper Fri, 08 Jul 2016 18:06:00 +0000 46391 at http://mwrf.com Introduction to RF Design http://mwrf.com/analog-semiconductors/introduction-rf-design <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">There are many wireless technologies that utilize RF design ranging from mobile phones to satellite TV, to wireless Internet connections and Bluetooth devices. This white paper will provide insight into how these technologies work, as well as considerations during the design, development and verification process. </div> <p><a href="http://mwrf.com/analog-semiconductors/introduction-rf-design" target="_blank">read more</a></p> http://mwrf.com/analog-semiconductors/introduction-rf-design#comments Analog semiconductors Test & Measurement - analyzers White Paper Fri, 08 Jul 2016 18:06:00 +0000 36321 at http://mwrf.com What’s the Difference Between GaN and GaAs? http://mwrf.com/materials/what-s-difference-between-gan-and-gaas <div class="field-deck"> GaN has emerged as the leading semiconductor material for high-power microwave switches and amplifiers, although GaAs is still the material of choice for low noise. </div> <div class="node-body article-body">GaN and GaAs are two of the leading semiconductor materials used for RF/microwave solid-state devices, including transistors, diodes, and MMICs. </div> <p><a href="http://mwrf.com/materials/what-s-difference-between-gan-and-gaas" target="_blank">read more</a></p> http://mwrf.com/materials/what-s-difference-between-gan-and-gaas#comments Materials Commercial Defense Industrial What's the Difference Between... Thu, 07 Jul 2016 13:09:00 +0000 46351 at http://mwrf.com Simplifying LTE-A eNB Measurements http://mwrf.com/webinar/simplifying-lte-enb-measurements <div class="field-deck"> Sponsored by: Keysight Technologies </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, July 26, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="275"> <tbody> <tr> <td width="84"><img alt="" height="103" src="http://penton.com/webcasts/Sonali.jpg" width="101" /></td> <td class="SpeakerBody" width="256"><strong>Sonali Sarpotdar </strong><br /> Business Development Engineer<br /> <strong>Keysight Technologies</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">LTE-Advanced is an emerging standard that promises to deliver true 4G speeds and support bigger wireless data payloads. In order to do so, a number of new technologies like Carrier Aggregation (CA) and higher-order MIMO are utilized.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela"> http://pages.electronicdesign.com/SimplifyingLTE-AeNB </div> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 900pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <p><a href="http://mwrf.com/webinar/simplifying-lte-enb-measurements" target="_blank">read more</a></p> Webcasts Fri, 17 Jun 2016 19:09:00 +0000 45871 at http://mwrf.com Reducing Uncertainty with Calibration for Angle of Arrival Testing http://mwrf.com/webinar/reducing-uncertainty-calibration-angle-arrival-testing <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/Keysight_ED-MWRF_713webinar_595x335.jpg?1465914592" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, July 13, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="275"> <tbody> <tr> <td width="84"><img alt="McKinley" border="1" src="https://event.on24.com/event/11/96/14/3/rt/1/logo/register/diezerik_smaller.jpg" /></td> <td class="SpeakerBody" width="256"><strong>Erik Diez</strong><br /> Senior Product Manager<br /> <strong>Keysight Technologies</strong></td> </tr> <tr> <td width="84"><img alt="McKinley" border="1" src="https://event.on24.com/event/11/96/14/3/rt/1/logo/register/brooks_hanley_smaller.jpg" /></td> <td class="SpeakerBody" width="256"><strong>Brooks Hanley</strong><br /> Solutions Marketing Engineer<br /> <strong>Keysight Technologies</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">EW receivers often use angle of arrival (AoA) as a primary sorting parameter in dense signal environments. Reducing the uncertainty in direction-finding (DF) receiver measurements leads to better accuracy in AoA estimation. Prior to AoA accuracy testing in a lab setting, calibration -- process, application and verification -- can be performed at the interface to the system under test. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela"> http://pages.electronicdesign.com/ReducingUncertainty/LP=1216 </div> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 650pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <p><a href="http://mwrf.com/webinar/reducing-uncertainty-calibration-angle-arrival-testing" target="_blank">read more</a></p> Webcasts Tue, 14 Jun 2016 14:20:00 +0000 45811 at http://mwrf.com Meeting Measurement Challenges of Agile Complex Wireless Signals http://mwrf.com/webinar/meeting-measurement-challenges-agile-complex-wireless-signals <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/ED-MWRF_Keysight_629webinar_595x335.jpg?1465221860" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, June 29, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="275"> <tbody> <tr> <td width="84"><img alt="McKinley" border="1" src="https://event.on24.com/event/11/94/29/9/rt/1/logo/register/ed_scottleithem.jpg" /></td> <td class="SpeakerBody" width="256"><strong>Scott Leithem</strong><br /> Application Development Engineer<br /> <strong>Keysight Technologies</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">The design process of wireless systems, subsystems and components necessitates a comprehensive test strategy that includes both optimization and validation. The most productive approach that is cost efficient and will minimize the time-to-market must combine quick and easy standard-compliance tests with more thorough analysis and troubleshooting.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <p><a href="http://mwrf.com/webinar/meeting-measurement-challenges-agile-complex-wireless-signals" target="_blank">read more</a></p> Webcasts Mon, 06 Jun 2016 13:55:00 +0000 45641 at http://mwrf.com What are the Differences Between Coaxial Connectors?, Part 2 http://mwrf.com/cables-connectors/what-are-differences-between-coaxial-connectors-part-2 <div class="field-deck"> A wide array of coaxial connectors is available from a large number of suppliers to satisfy high-frequency requirements. </div> <div class="node-body article-body">A wide array of coaxial connectors is available from a large number of suppliers to satisfy high-frequency requirements.</div> <p><a href="http://mwrf.com/cables-connectors/what-are-differences-between-coaxial-connectors-part-2" target="_blank">read more</a></p> http://mwrf.com/cables-connectors/what-are-differences-between-coaxial-connectors-part-2#comments Cables & Connectors Commercial Defense Industrial What's the Difference Between... Fri, 20 May 2016 16:27:00 +0000 45071 at http://mwrf.com Constraints and Trade-Offs in Designing Filters and Deriving Specifications http://mwrf.com/passive-components/constraints-and-trade-offs-designing-filters-and-deriving-specifications <div class="field-deck"> Sponsored by: Molex </div> <div class="node-body article-body">Designing printed circuit board (PCB) launches for coaxial test connectors requires asking the right questions. To maximize bandwidth and best understand the device under test, you must consider how signals will be routed, the stub length and whether the via is a through-hole, back-drilled or blind. </div> <p><a href="http://mwrf.com/passive-components/constraints-and-trade-offs-designing-filters-and-deriving-specifications" target="_blank">read more</a></p> http://mwrf.com/passive-components/constraints-and-trade-offs-designing-filters-and-deriving-specifications#comments Passive components White Paper Thu, 19 May 2016 17:18:00 +0000 44961 at http://mwrf.com A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches <div class="field-deck"> Sponsored by: Molex </div> <div class="node-body article-body">Designing printed circuit board (PCB) launches for coaxial test connectors requires asking the right questions. To maximize bandwidth and best understand the device under test, you must consider how signals will be routed, the stub length and whether the via is a through-hole, back-drilled or blind. </div> <p><a href="http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches" target="_blank">read more</a></p> http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches#comments Passive components White Paper Thu, 19 May 2016 17:18:00 +0000 29441 at http://mwrf.com