Learning Resources http://mwrf.com/taxonomy/term/6608/more en IMD Measurements with IMDView™ - MS4640B Series Vector Network Analyzer http://mwrf.com/test-measurement-analyzers/imd-measurements-imdview-ms4640b-series-vector-network-analyzer <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">Intermodulation distortion (IMD) is an important consideration in microwave and RF component design. This application note discusses the meaning of the IMD measurement and measurement considerations.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/imd-measurements-imdview-ms4640b-series-vector-network-analyzer" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/imd-measurements-imdview-ms4640b-series-vector-network-analyzer#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Passive components Test & Measurement - analyzers Test & Measurement - generators White Paper Tue, 26 May 2015 13:30:00 +0000 34341 at http://mwrf.com Optimizing Battery Run and Charge Times of Today’s Mobile Wireless Devices http://mwrf.com/webinar/optimizing-battery-run-and-charge-times-today-s-mobile-wireless-devices <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06182015.jpg?1432241615" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, June 18, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" src="http://www.penton.com/webcasts/ED_Brorein.jpg" /></p> </td> <td width="400"><strong>Ed Brorein</strong><br /> Application Specialist<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Today’s smart mobile wireless devices have amazing capabilities enabling to perform a myriad of advanced applications. However, their power consumption has grown considerably as a result. Providing acceptable battery run-time is more important than ever, and, with much larger batteries, providing an acceptable charging time has now become another top priority.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/optimizing-battery-run-and-charge-times-today-s-mobile-wireless-devices" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34321 at http://mwrf.com MIPI – Overcome Test Challenges to Ensure Interoperability for your PHY http://mwrf.com/webinar/mipi-overcome-test-challenges-ensure-interoperability-your-phy <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06232015.jpg?1432242878" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, June 23, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" src="http://www.penton.com/webcasts/EDWoerner.jpg" /></p> </td> <td width="400"><strong>Matthew Woerner</strong><br /> Technical Program Manager<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Various physical layer standards are developed by Mobile Industry Processor Interface (MIPI) Alliance standards body to address performance and power requirements in mobile applications. With physical data rates extended to 4.5 Gb/s for D-PHY, 11.6 Gb/s for M-PHY and 2.5 GSym/s for C-PHY, signal integrity will be critical to guarantee interoperability. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/mipi-overcome-test-challenges-ensure-interoperability-your-phy" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34331 at http://mwrf.com Tips and Techniques for Making the Best Oscilloscope Measurements http://mwrf.com/webinar/tips-and-techniques-making-best-oscilloscope-measurements <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06162015.jpg?1432239306" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, June 16, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" height="100" src="http://www.penton.com/webcasts/ED_Bogdanoff.jpg" width="100" /></p> </td> <td width="400"><strong>Daniel Bogdanoff</strong><br /> Oscilloscope Product Manager<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Learn how to get the most out of your oscilloscope measurements. When debugging or validating your design, it is important to understand both the measurement capabilities of your oscilloscope and the different factors that influence the effectiveness of specific measurements.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/tips-and-techniques-making-best-oscilloscope-measurements" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34291 at http://mwrf.com Validate PCIe® Power Saving with L1 Substate Analysis http://mwrf.com/webinar/validate-pcie-power-saving-l1-substate-analysis-0 <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-06172015.jpg?1432239865" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, June 17, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" src="http://www.penton.com/webcasts/SchoeneckerDon.jpg" /></p> </td> <td width="400"><strong>Don Schoenecker</strong><br /> PCIe&reg; Protocol Test Product Manager<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Today's PCI Express designs must consider power efficiency in order to meet the low power needs of many PCIe® based computing devices. Optimizing designs for divergent applications requires complete protocol insight into the trade-off of performance versus power consumption.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/validate-pcie-power-saving-l1-substate-analysis-0" target="_blank">read more</a></p> Webcasts Thu, 21 May 2015 19:53:00 +0000 34311 at http://mwrf.com How to Select an Analog Signal Generator http://mwrf.com/test-measurement/how-select-analog-signal-generator <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Today's microwave and wireless communications market is expanding at an incredible rate, thus increasing the need for test equipment that will help verify the performance of devices and systems. A flexible tool for a broad scope of applications is the signal generator because of its wide frequency range, high output power and variety of modulations. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/how-select-analog-signal-generator" target="_blank">read more</a></p> http://mwrf.com/test-measurement/how-select-analog-signal-generator#comments Test & Measurement Test & Measurement - generators White Paper Tue, 28 Apr 2015 18:43:00 +0000 33761 at http://mwrf.com Extraction, Verification, and Usage of a Short Haul Opto VCSEL Model http://mwrf.com/webinar/extraction-verification-and-usage-short-haul-opto-vcsel-model <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-05282015.jpg?1430244768" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, May 28, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> </fieldset> <div class="node-body webinar-body">For multigigabit data links in data centers, opto-electronic links are replacing traditional copper, which has severe attenuation at high frequencies. In this webcast we present an efficient way to model such links. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/extraction-verification-and-usage-short-haul-opto-vcsel-model" target="_blank">read more</a></p> Webcasts Tue, 28 Apr 2015 18:03:00 +0000 33751 at http://mwrf.com DisplayPort 1.3 – PHY Layer Test Requirements http://mwrf.com/webinar/displayport-13-phy-layer-test-requirements <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-05272015.jpg?1430244112" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, May 27, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="84"><img alt="Kuan" border="1" src="http://www.penton.com/webcasts/ED_Fetz.jpg" /></td> <td class="style3" width="256"><strong>Brian Fetz</strong><br /> Program Manager for Digital Display Interfaces<br /> <strong>Keysight Technol</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">The Video Electronics Standards Association (VESA) has released the latest DisplayPort specification v1.3, and with it comes new capabilities and an increase in data rates. As data rates increase the margins decrease in your link and in your validation processes while the complexity in the test process increases.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/displayport-13-phy-layer-test-requirements" target="_blank">read more</a></p> Webcasts Tue, 28 Apr 2015 17:52:00 +0000 33731 at http://mwrf.com Flexible RF Test Solutions Deliver Reliable Internet of Things (IoT) http://mwrf.com/test-measurement/flexible-rf-test-solutions-deliver-reliable-internet-things-iot <div class="field-deck"> Sponsored by: Keysight Technology </div> <div class="node-body article-body">The Internet of Things (IoT) refers to the use of smart and connected electronic devices to enable greater efficiency and productivity in our daily lives. These devices permeate homes, vehicles, buildings, manage security, safety, energy, and inventories, and many other areas. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/flexible-rf-test-solutions-deliver-reliable-internet-things-iot" target="_blank">read more</a></p> http://mwrf.com/test-measurement/flexible-rf-test-solutions-deliver-reliable-internet-things-iot#comments Test & Measurement White Paper Thu, 23 Apr 2015 19:10:00 +0000 33611 at http://mwrf.com How to Do Fixture De-Embedding to Match Signal Integrity Simulations to Measurements http://mwrf.com/test-measurement/how-do-fixture-de-embedding-match-signal-integrity-simulations-measurements <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">Are fixtures ruining your signal integrity simulation? This video provides a 4-step process showing how to de-embed a fixture from measurements to validate a PCB channel model. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/how-do-fixture-de-embedding-match-signal-integrity-simulations-measurements" target="_blank">read more</a></p> http://mwrf.com/test-measurement/how-do-fixture-de-embedding-match-signal-integrity-simulations-measurements#comments Test & Measurement White Paper Thu, 23 Apr 2015 15:10:00 +0000 33531 at http://mwrf.com