Learning Resources http://mwrf.com/taxonomy/term/6608/more en Envelope Tracking and Digital Pre-Distortion Test Solution for RF Amplifiers http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">An increasing number of power amplifiers (PA) support the envelope tracking (ET) technology in order to reduce power consumption and improve efficiency. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers" target="_blank">read more</a></p> http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32781 at http://mwrf.com Power Added Efficiency Measurement http://mwrf.com/active-components/power-added-efficiency-measurement <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Besides the four s-parameters, hot-s22 and stability, the Power Added Efficiency (PAE) is a key parameter for amplifier which represents how efficient the amplifier converts DC energy to RF energy.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/power-added-efficiency-measurement" target="_blank">read more</a></p> http://mwrf.com/active-components/power-added-efficiency-measurement#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32791 at http://mwrf.com Testing S-Parameters on Pulsed Radar Power Amplifier Modules http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">In many cases, devices need to be characterized using pulsed instead of CW signals. Be it for on-wafer measurement of power amplifiers, where heat sinks are difficult or even impossible to implement, for power amplifier modules for pulsed radar systems or other applications. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules" target="_blank">read more</a></p> http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32801 at http://mwrf.com Design FAQ: GaN Reaches into a Spectrum of Markets http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets <div class="field-deck"> Sponsored by: Qorvo </div> <div class="node-body article-body">What types of GaN devices are available in the RF market today? With any semiconductor technology, proper thermal management is important to the overall reliability of the device.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets" target="_blank">read more</a></p> http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets#comments White Paper Fri, 13 Mar 2015 16:32:00 +0000 32581 at http://mwrf.com Fundamentals of Low Current and Ultra-High Resistance Measurement http://mwrf.com/webinar/fundamentals-low-current-and-ultra-high-resistance-measurement <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-04142015.jpg?1426104607" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, April 14, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="84"> <img alt="Wadsworth" border="0" src="http://www.penton.com/webcasts/EDWadsworth.jpg" /></td> <td class="style3" width="256"> <strong>Alan Wadsworth</strong><br /> Market Development Manager<br /> <strong>Keysight Technologies, Inc.</strong></td> </tr> </tbody> </table> <p>&nbsp;</p> </div> </fieldset> <div class="node-body webinar-body">Performing current vs. voltage characterization on devices and materials at very low current levels presents a unique set of measurement challenges.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/fundamentals-low-current-and-ultra-high-resistance-measurement" target="_blank">read more</a></p> Webcasts Wed, 11 Mar 2015 20:04:00 +0000 32511 at http://mwrf.com Advanced Triggering and Signal Isolation using InfiniiVision X-Series Oscilloscopes http://mwrf.com/webinar/advanced-triggering-and-signal-isolation-using-infiniivision-x-series-oscilloscopes <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-04072015.jpg?1426102565" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, April 7, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="84"> <img alt="Hoffman" height="100" src="http://www.penton.com/webcasts/EDHoffman.jpg" width="100" /></td> <td class="style3" width="256"> <strong>Mike Hoffman</strong><br /> Marketing Engineer<br /> <strong>Keysight Technologies, Inc.</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Learn industry leading techniques to trigger and capture even the most difficult waveform abnormalities, and how the latest oscilloscope technology can give you fast insight into possible design issues, thus accelerating the debug process.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/advanced-triggering-and-signal-isolation-using-infiniivision-x-series-oscilloscopes" target="_blank">read more</a></p> Webcasts Wed, 11 Mar 2015 19:22:00 +0000 32491 at http://mwrf.com Simulating Radar System Performance http://mwrf.com/defense/simulating-radar-system-performance <div class="field-deck"> Sponsored by: National Instruments </div> <div class="node-body article-body">As radar technology continues to evolve and expand, radar design requires effective simulation of a myriad of waveform modifications needed for different systems.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/defense/simulating-radar-system-performance" target="_blank">read more</a></p> http://mwrf.com/defense/simulating-radar-system-performance#comments Components Defense White Paper Thu, 26 Feb 2015 19:36:00 +0000 31911 at http://mwrf.com Lowering the Cost of Wireless Manufacturing Test http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">This white paper covers the basics of non-signaling test from 10 MHz to 6 GHz, the technology models of implementing a non-signaling test setup, approaches to lowering the overall test cost, as well as turnkey chipset-specific calibration and verification solution.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31861 at http://mwrf.com Neighbor Cell Detection Test http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">With more and more radio technologies introduced, as well as the concept of HetNet, the testing for mobile devices becomes ever increasingly complex. A cellular phone’s neighbor cell detection capability is important to its overall performance, not only for mobility behavior such as re-selection and handover but also for cellular-assisted location estimation.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31871 at http://mwrf.com Understanding Carrier Aggregation http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">This paper discusses Carrier Aggregation (CA) evolution in HSPA and LTE Networks, the implication on the architecture and the User Equipment. It also discusses the testing method to </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31881 at http://mwrf.com