Learning Resources http://mwrf.com/taxonomy/term/6608/more en Perform Power Supply Frequency Response Analysis using an Oscilloscope http://mwrf.com/webinar/perform-power-supply-frequency-response-analysis-using-oscilloscope <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-05192015.jpg?1429124240" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, May 19, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="speaker" src="http://www.penton.com/webcasts/JohnniePic.jpg" /></p> </td> <td> <p><strong>Johnnie Hancock</strong><br /> Product Applications Manager<br /> <strong>Keysight Technologies, Inc.</strong></p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Today’s power supplies are much more than full-wave rectifiers with filtered outputs. DC-to-DC converters such as switch mode power supplies (SMPS), step-down linear regulators, and LDOs, include negative feedback networks and amplifiers for precise regulation. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/perform-power-supply-frequency-response-analysis-using-oscilloscope" target="_blank">read more</a></p> Webcasts Wed, 15 Apr 2015 18:49:00 +0000 33221 at http://mwrf.com MIPI Physical Layer Standards and Receiver Test Solutions http://mwrf.com/webinar/mipi-physical-layer-standards-and-receiver-test-solutions <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-05132015.jpg?1429123678" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, May 13, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0"> <tbody> <tr> <td width="110"> <p><img alt="MFR" height="132" src="http://www.penton.com/webcasts/MFRED.jpg" width="100" /></p> </td> <td> <p><strong>Michael Fleischer-Reumann</strong><br /> Strategic Product Planner<br /> Digital &amp; Photonic Test Division<br /> Keysight Technologies</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">The MIPI Alliance supports the mobile industry by establishing standard interfaces for mobile devices. Demand for higher aggregate bandwidth is satisfied with increased data rate ranges of existing D- and M-PHY interfaces, as well as the new C-PHY interface, that offers multiple bit transmission per unit interval.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/mipi-physical-layer-standards-and-receiver-test-solutions" target="_blank">read more</a></p> Webcasts Wed, 15 Apr 2015 18:39:00 +0000 33211 at http://mwrf.com Phase Noise Measurement Techniques http://mwrf.com/webinar/phase-noise-measurement-techniques <div class="field-deck"> Sponsored By: Rohde & Schwarz </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-RohdeSchwarz-Webinar-04292015.jpg?1428517206" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, April 29, 2015 - <span class="date-display-start">14:00</span><span class="date-display-separator"> - </span><span class="date-display-end">15:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="106"><img alt="Speaker" border="1" src="http://www.penton.com/webcasts/MWRFDaniel.jpg" width="100" /></td> <td width="234"><span class="style3"><strong>Rick Daniel</strong><br /> Applications Engineer<br /> <em><strong>Rohde &amp; Schwarz</strong></em></span></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">Phase noise can be a limiting parameter on system performance of many types of systems. As radar precision and communication data rates (and correspondingly, modulation complexity) have increased, low phase noise oscillators and instrumentation to accurately measure has never been more important.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/phase-noise-measurement-techniques" target="_blank">read more</a></p> Webcasts Wed, 08 Apr 2015 18:15:00 +0000 33061 at http://mwrf.com Integration and Operational Guidelines for MEMS-Based Inertial Systems: Applications that include magnetometers http://mwrf.com/active-components/integration-and-operational-guidelines-mems-based-inertial-systems-applications-in <div class="field-deck"> Sponsored by: Sparton </div> <div class="node-body article-body">High-performance inertial systems provide accurate platform heading information in a variety of applications and operational environments. However, the magnetometers used are susceptible to measurement distortion in the presence of any magnetic material. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/integration-and-operational-guidelines-mems-based-inertial-systems-applications-in" target="_blank">read more</a></p> http://mwrf.com/active-components/integration-and-operational-guidelines-mems-based-inertial-systems-applications-in#comments Active components Systems White Paper Mon, 30 Mar 2015 21:46:00 +0000 32891 at http://mwrf.com SWaP-C and Why Your Component Partner Matters http://mwrf.com/active-components/swap-c-and-why-your-component-partner-matters <div class="field-deck"> Sponsored by: Sparton </div> <div class="node-body article-body">How can you get maximum SWaP-C benefit with minimal fuss? By choosing the right contract manufacturer. Read our white paper to learn why SWaP-C matters, the challenges involved, and techniques for ensuring that you choose the right partner for your project.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/swap-c-and-why-your-component-partner-matters" target="_blank">read more</a></p> http://mwrf.com/active-components/swap-c-and-why-your-component-partner-matters#comments Active components Systems White Paper Mon, 30 Mar 2015 21:46:00 +0000 32901 at http://mwrf.com Envelope Tracking and Digital Pre-Distortion Test Solution for RF Amplifiers http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">An increasing number of power amplifiers (PA) support the envelope tracking (ET) technology in order to reduce power consumption and improve efficiency. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers" target="_blank">read more</a></p> http://mwrf.com/active-components/envelope-tracking-and-digital-pre-distortion-test-solution-rf-amplifiers#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32781 at http://mwrf.com Power Added Efficiency Measurement http://mwrf.com/active-components/power-added-efficiency-measurement <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Besides the four s-parameters, hot-s22 and stability, the Power Added Efficiency (PAE) is a key parameter for amplifier which represents how efficient the amplifier converts DC energy to RF energy.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/power-added-efficiency-measurement" target="_blank">read more</a></p> http://mwrf.com/active-components/power-added-efficiency-measurement#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32791 at http://mwrf.com Testing S-Parameters on Pulsed Radar Power Amplifier Modules http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">In many cases, devices need to be characterized using pulsed instead of CW signals. Be it for on-wafer measurement of power amplifiers, where heat sinks are difficult or even impossible to implement, for power amplifier modules for pulsed radar systems or other applications. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules" target="_blank">read more</a></p> http://mwrf.com/active-components/testing-s-parameters-pulsed-radar-power-amplifier-modules#comments Active components Analog semiconductors Digital semiconductors Mixed-signal semiconductors Test & Measurement - analyzers White Paper Fri, 27 Mar 2015 14:17:00 +0000 32801 at http://mwrf.com Design FAQ: GaN Reaches into a Spectrum of Markets http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets <div class="field-deck"> Sponsored by: Qorvo </div> <div class="node-body article-body">What types of GaN devices are available in the RF market today? With any semiconductor technology, proper thermal management is important to the overall reliability of the device.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets" target="_blank">read more</a></p> http://mwrf.com/white-paper/design-faq-gan-reaches-spectrum-markets#comments White Paper Fri, 13 Mar 2015 16:32:00 +0000 32581 at http://mwrf.com Fundamentals of Low Current and Ultra-High Resistance Measurement http://mwrf.com/webinar/fundamentals-low-current-and-ultra-high-resistance-measurement <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-04142015.jpg?1426104607" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, April 14, 2015 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td width="84"> <img alt="Wadsworth" border="0" src="http://www.penton.com/webcasts/EDWadsworth.jpg" /></td> <td class="style3" width="256"> <strong>Alan Wadsworth</strong><br /> Market Development Manager<br /> <strong>Keysight Technologies, Inc.</strong></td> </tr> </tbody> </table> <p>&nbsp;</p> </div> </fieldset> <div class="node-body webinar-body">Performing current vs. voltage characterization on devices and materials at very low current levels presents a unique set of measurement challenges.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/fundamentals-low-current-and-ultra-high-resistance-measurement" target="_blank">read more</a></p> Webcasts Wed, 11 Mar 2015 20:04:00 +0000 32511 at http://mwrf.com