Learning Resources http://mwrf.com/taxonomy/term/6608/more en Poster: Worldwide Spectrum Allocations http://mwrf.com/test-measurement/poster-worldwide-spectrum-allocations <div class="field-deck"> Sponsored by: Tektronix </div> <div class="node-body article-body">Keeping track and updated on the latest frequency allocations isn’t easy, so we’ve compiled the information into an easy-to-view poster.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/poster-worldwide-spectrum-allocations" target="_blank">read more</a></p> http://mwrf.com/test-measurement/poster-worldwide-spectrum-allocations#comments Test & Measurement Test & Measurement - analyzers White Paper Fri, 21 Nov 2014 16:41:00 +0000 29861 at http://mwrf.com High Speed Interconnects, Signal Integrity, S-parameters and how to accurately characterize your Device http://mwrf.com/webinar/high-speed-interconnects-signal-integrity-s-parameters-and-how-accurately-characterize-your- <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-RohdeSchwarz-Webinar-20141119.jpg?1415284508" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, November 19, 2014 - <span class="date-display-start">14:00</span><span class="date-display-separator"> - </span><span class="date-display-end">15:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <p><img alt="Jarvis" border="1" src="http://www.penton.com/webcasts/MWRFjarvis.jpg" /><br /> <strong>Neil Jarvis</strong><br /> RF and Microwave Applications Engineer<br /> <em><strong>Rohde &amp; Schwarz</strong></em></p> </div> </fieldset> <div class="node-body webinar-body">Signal integrity through connectors, interconnects, transmitters and receivers affect product reliability and system performance and has become a major challenge for designers of high speed systems. During this hour we will review signal integrity from several angles. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/high-speed-interconnects-signal-integrity-s-parameters-and-how-accurately-characterize-your-" target="_blank">read more</a></p> Webcasts Thu, 06 Nov 2014 14:32:00 +0000 29471 at http://mwrf.com Optimizing 100G Ethernet Electrical Measurements http://mwrf.com/webinar/optimizing-100g-ethernet-electrical-measurements <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/MWRF-Keysight-Webinar-12102014.jpg?1415283662" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, December 10, 2014 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="350"> <tbody> <tr> <td> <img alt="Bailes" src="http://www.penton.com/webcasts/ED_AlexBailes.jpg" /></td> <td class="style3"> <strong>Alex Bailes</strong><br /> Product Manager<br /> Ethernet and Wireline Applications<br /> <strong>Keysight Technologies, Inc.</strong></td> </tr> <tr> <td width="84"> <img alt="Sleigh" src="http://www.penton.com/webcasts/EDSleigh.jpg" /></td> <td class="style3" width="256"> <strong>Rob Sleigh</strong><br /> Product Manager<br /> TDR/TDT Solutions<br /> <strong>Keysight Technologies, Inc</strong></td> </tr> </tbody> </table> <p>&nbsp;</p> </div> </fieldset> <div class="node-body webinar-body">Characterizing signal and multi-lane 100G Ethernet digital links can be daunting and time consuming, driven by a wide range of test parameters and conditions. After carefully setting up the device, clock recovery, error detection, and test parameters, the user is still faced with understanding standards documents like IEEE 802.3-2012/bj/bm, and interpreting the results. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/webinar/optimizing-100g-ethernet-electrical-measurements" target="_blank">read more</a></p> Webcasts Thu, 06 Nov 2014 14:15:00 +0000 29461 at http://mwrf.com A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches <div class="field-deck"> Sponsored by: Molex </div> <div class="node-body article-body">When designing printed circuit boards launches for coaxial test connectors, there are a number of aspects to consider in order to get the clearest picture of the intended device under test.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches" target="_blank">read more</a></p> http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches#comments Passive components White Paper Tue, 04 Nov 2014 18:18:00 +0000 29441 at http://mwrf.com The Ultimate Guide to GaN http://mwrf.com/white-paper/ultimate-guide-gan <div class="node-body article-body">As more companies and industries are embracing gallium-nitride (GaN) technology for use in wide-bandwidth and high-power applications, the cost of using GaN circuity is decreasing. As a result, GaN technology is becoming more accessible</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/ultimate-guide-gan" target="_blank">read more</a></p> http://mwrf.com/white-paper/ultimate-guide-gan#comments White Paper Thu, 30 Oct 2014 20:04:00 +0000 29431 at http://mwrf.com Selecting PCB Materials for RF/MW http://mwrf.com/materials/selecting-pcb-materials-rfmw <div class="field-deck"> Sponsored by: isola </div> <div class="node-body article-body">How do you know what type of copper you should specify on a laminate? There are two major mechanisms that contribute to signal loss in the PCB.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/materials/selecting-pcb-materials-rfmw" target="_blank">read more</a></p> http://mwrf.com/materials/selecting-pcb-materials-rfmw#comments Materials White Paper Tue, 28 Oct 2014 13:30:00 +0000 29391 at http://mwrf.com Modern VNA Test Solutions Improve On-Wafer Measurement Efficiency http://mwrf.com/test-measurement-analyzers/modern-vna-test-solutions-improve-wafer-measurement-efficiency <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">Semiconductor manufacturing test engineers face challenges related to broadband millimeter wave (MMW) on-wafer testing. Achieving accurate, stable measurements, typically performed using vector network analyzers, over extended time periods is a challenge for foundries and fab-less semiconductor companies that require extensive on-wafer devices testing.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/modern-vna-test-solutions-improve-wafer-measurement-efficiency" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/modern-vna-test-solutions-improve-wafer-measurement-efficiency#comments Test & Measurement - analyzers White Paper Tue, 21 Oct 2014 14:12:00 +0000 29361 at http://mwrf.com Does Your Design Match Your Test? http://mwrf.com/white-paper/does-your-design-match-your-test <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Characterizing passive and active RF components, while matching the test results to the design simulations, is a challenge throughout the industry. Matching test results to design values requires a very high degree of accuracy, repeatability, and usability all leading to absolute confidence in the performed measurements and their results. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/white-paper/does-your-design-match-your-test" target="_blank">read more</a></p> http://mwrf.com/white-paper/does-your-design-match-your-test#comments White Paper Wed, 15 Oct 2014 14:25:00 +0000 29221 at http://mwrf.com Effectively Maintaining and Troubleshooting Military Communication Systems Application Note http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">This application note focuses on the “what” and “how” of effective testing in pursuit of optimum performance in military communication systems. Two examples will highlight what’s possible: field test and verification of radar systems; and testing of VHF/UHF radios. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat" target="_blank">read more</a></p> http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 20:03:00 +0000 29081 at http://mwrf.com Radar Fundamentals Poster http://mwrf.com/test-measurement/radar-fundamentals-poster <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">Check out the core elements of radar test; radar block diagram, basic equations, military nomenclature, pulse compression techniques, radar-frequency letter bands and the latest Keysight radar equipment. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/radar-fundamentals-poster" target="_blank">read more</a></p> http://mwrf.com/test-measurement/radar-fundamentals-poster#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 19:59:00 +0000 29071 at http://mwrf.com