Learning Resources http://mwrf.com/taxonomy/term/6608/more en Simplifying LTE-A eNB Measurements http://mwrf.com/webinar/simplifying-lte-enb-measurements <div class="field-deck"> Sponsored by: Keysight Technologies </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Tuesday, July 26, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="275"> <tbody> <tr> <td width="84"><img alt="" height="103" src="http://penton.com/webcasts/Sonali.jpg" width="101" /></td> <td class="SpeakerBody" width="256"><strong>Sonali Sarpotdar </strong><br /> Business Development Engineer<br /> <strong>Keysight Technologies</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">LTE-Advanced is an emerging standard that promises to deliver true 4G speeds and support bigger wireless data payloads. In order to do so, a number of new technologies like Carrier Aggregation (CA) and higher-order MIMO are utilized.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela"> http://pages.electronicdesign.com/SimplifyingLTE-AeNB </div> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 900pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <p><a href="http://mwrf.com/webinar/simplifying-lte-enb-measurements" target="_blank">read more</a></p> Webcasts Fri, 17 Jun 2016 19:09:00 +0000 45871 at http://mwrf.com Reducing Uncertainty with Calibration for Angle of Arrival Testing http://mwrf.com/webinar/reducing-uncertainty-calibration-angle-arrival-testing <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/Keysight_ED-MWRF_713webinar_595x335.jpg?1465914592" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, July 13, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="275"> <tbody> <tr> <td width="84"><img alt="McKinley" border="1" src="https://event.on24.com/event/11/96/14/3/rt/1/logo/register/diezerik_smaller.jpg" /></td> <td class="SpeakerBody" width="256"><strong>Erik Diez</strong><br /> Senior Product Manager<br /> <strong>Keysight Technologies</strong></td> </tr> <tr> <td width="84"><img alt="McKinley" border="1" src="https://event.on24.com/event/11/96/14/3/rt/1/logo/register/brooks_hanley_smaller.jpg" /></td> <td class="SpeakerBody" width="256"><strong>Brooks Hanley</strong><br /> Solutions Marketing Engineer<br /> <strong>Keysight Technologies</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">EW receivers often use angle of arrival (AoA) as a primary sorting parameter in dense signal environments. Reducing the uncertainty in direction-finding (DF) receiver measurements leads to better accuracy in AoA estimation. Prior to AoA accuracy testing in a lab setting, calibration -- process, application and verification -- can be performed at the interface to the system under test. </div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela"> http://pages.electronicdesign.com/ReducingUncertainty/LP=1216 </div> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 650pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <p><a href="http://mwrf.com/webinar/reducing-uncertainty-calibration-angle-arrival-testing" target="_blank">read more</a></p> Webcasts Tue, 14 Jun 2016 14:20:00 +0000 45811 at http://mwrf.com Meeting Measurement Challenges of Agile Complex Wireless Signals http://mwrf.com/webinar/meeting-measurement-challenges-agile-complex-wireless-signals <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/ED-MWRF_Keysight_629webinar_595x335.jpg?1465221860" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Wednesday, June 29, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="275"> <tbody> <tr> <td width="84"><img alt="McKinley" border="1" src="https://event.on24.com/event/11/94/29/9/rt/1/logo/register/ed_scottleithem.jpg" /></td> <td class="SpeakerBody" width="256"><strong>Scott Leithem</strong><br /> Application Development Engineer<br /> <strong>Keysight Technologies</strong></td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">The design process of wireless systems, subsystems and components necessitates a comprehensive test strategy that includes both optimization and validation. The most productive approach that is cost efficient and will minimize the time-to-market must combine quick and easy standard-compliance tests with more thorough analysis and troubleshooting.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <p><a href="http://mwrf.com/webinar/meeting-measurement-challenges-agile-complex-wireless-signals" target="_blank">read more</a></p> Webcasts Mon, 06 Jun 2016 13:55:00 +0000 45641 at http://mwrf.com What are the Differences Between Coaxial Connectors?, Part 2 http://mwrf.com/cables-connectors/what-are-differences-between-coaxial-connectors-part-2 <div class="field-deck"> A wide array of coaxial connectors is available from a large number of suppliers to satisfy high-frequency requirements. </div> <div class="node-body article-body">A wide array of coaxial connectors is available from a large number of suppliers to satisfy high-frequency requirements.</div> <p><a href="http://mwrf.com/cables-connectors/what-are-differences-between-coaxial-connectors-part-2" target="_blank">read more</a></p> http://mwrf.com/cables-connectors/what-are-differences-between-coaxial-connectors-part-2#comments Cables & Connectors Commercial Defense Industrial What's the Difference Between... Fri, 20 May 2016 16:27:00 +0000 45071 at http://mwrf.com A Simple Approach to Signal Via Stubs for Coaxial PCB Connector Launches http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches <div class="field-deck"> Sponsored by: Molex </div> <div class="node-body article-body">Designing printed circuit board (PCB) launches for coaxial test connectors requires asking the right questions. To maximize bandwidth and best understand the device under test, you must consider how signals will be routed, the stub length and whether the via is a through-hole, back-drilled or blind. </div> <p><a href="http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches" target="_blank">read more</a></p> http://mwrf.com/passive-components/simple-approach-signal-stubs-coaxial-pcb-connector-launches#comments Passive components White Paper Thu, 19 May 2016 17:18:00 +0000 29441 at http://mwrf.com Constraints and Trade-Offs in Designing Filters and Deriving Specifications http://mwrf.com/passive-components/constraints-and-trade-offs-designing-filters-and-deriving-specifications <div class="field-deck"> Sponsored by: Molex </div> <div class="node-body article-body">Designing printed circuit board (PCB) launches for coaxial test connectors requires asking the right questions. To maximize bandwidth and best understand the device under test, you must consider how signals will be routed, the stub length and whether the via is a through-hole, back-drilled or blind. </div> <p><a href="http://mwrf.com/passive-components/constraints-and-trade-offs-designing-filters-and-deriving-specifications" target="_blank">read more</a></p> http://mwrf.com/passive-components/constraints-and-trade-offs-designing-filters-and-deriving-specifications#comments Passive components White Paper Thu, 19 May 2016 17:18:00 +0000 44961 at http://mwrf.com Understanding the Programming Interfaces of PXI Instruments http://mwrf.com/test-measurement-analyzers/understanding-programming-interfaces-pxi-instruments <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="node-body article-body">Integrating RF PXI with benchtop rack-and-stack systems? This application note describes the differences between benchtop and PXI system architectures and programming interfaces to help you select the right programming interface for your application. Tips are included to make your integration job easier.</div> <p><a href="http://mwrf.com/test-measurement-analyzers/understanding-programming-interfaces-pxi-instruments" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/understanding-programming-interfaces-pxi-instruments#comments Software Test & Measurement Test & Measurement - analyzers White Paper Mon, 16 May 2016 17:40:00 +0000 44861 at http://mwrf.com How to achieve PXI multi-vendor Interoperability http://mwrf.com/test-measurement-analyzers/how-achieve-pxi-multi-vendor-interoperability <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="node-body article-body">Engineers often source instruments from different suppliers. Ideally, mechanical, electrical and software aspects are compatible for successful system operation. Get the application note which provides tips on how to select PXI modules, chassis, controllers and software to ensure compatibility.</div> <p><a href="http://mwrf.com/test-measurement-analyzers/how-achieve-pxi-multi-vendor-interoperability" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/how-achieve-pxi-multi-vendor-interoperability#comments Software Test & Measurement Test & Measurement - analyzers White Paper Mon, 16 May 2016 17:40:00 +0000 44871 at http://mwrf.com Speed PXI RF test solutions with effective software selection http://mwrf.com/test-measurement-analyzers/speed-pxi-rf-test-solutions-effective-software-selection <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="node-body article-body">RF test systems must efficiently handle complex signals and address a variety of standards. This application note will help you match your test priorities with the most efficient PXI software tools available, from instrument drivers to standard-specific measurement applications, to advanced modulation analysis and resource optimization tools.</div> <p><a href="http://mwrf.com/test-measurement-analyzers/speed-pxi-rf-test-solutions-effective-software-selection" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/speed-pxi-rf-test-solutions-effective-software-selection#comments Software Test & Measurement Test & Measurement - analyzers White Paper Mon, 16 May 2016 17:40:00 +0000 44881 at http://mwrf.com Debugging DC Voltage Lines Using an Oscilloscope http://mwrf.com/webinar/debugging-dc-voltage-lines-using-oscilloscope <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/ED-MWRF_Keysight_62webinar_595x335.gif?1463145949" /> </div> <fieldset class="fieldgroup group-webinar-details"><legend>Webinar Details</legend> <div class="field-webinar-date"> <span>Date &amp; Time:&nbsp;</span> <span class="date-display-single">Thursday, June 2, 2016 - <span class="date-display-start">13:00</span><span class="date-display-separator"> - </span><span class="date-display-end">14:00</span></span> </div> <div class="field-webinar-type"> <span>Event Type:&nbsp;</span> Live Webinar </div> <div class="field-webinar-speakers"> <span>Speakers:&nbsp;</span> <table border="0" width="500"> <tbody> <tr> <td width="110"><img height="100" src="http://images.link.pentondes.com/EloquaImages/clients/PentonDES/%7be7635a25-82e1-454a-be41-c20586959e03%7d_ED_KennyJohnson_20151230081335_923797.gif" style="padding-bottom:10px;" /></td> <td width="390"><strong>Kenny Johnson</strong><br /> Product Manager<br /> <strong>Keysight Technologies, Inc.</strong> <p>&nbsp;</p> </td> </tr> </tbody> </table> </div> </fieldset> <div class="node-body webinar-body">The prosaic DC power supply is receiving more and more scrutiny as supply voltages continue to get smaller. Supply tolerances are getting tighter as users try to decrease power, increase yield and minimize supply induced signal noise. This webcast will discuss tools and techniques for making power integrity measurements such as ripple, noise, spikes, compression, static/dynamic load response and supply induced signal noise and signal jitter.</div><fieldset class="fieldgroup group-registration-form"><legend>Registration Form</legend> <div class="field-accela-form-length"> <span>Embedded Form Length:&nbsp;</span> 550pixels </div> </fieldset> <div class="field-display-promo-image"> <span>Display Promo Image:&nbsp;</span> No </div> <p><a href="http://mwrf.com/webinar/debugging-dc-voltage-lines-using-oscilloscope" target="_blank">read more</a></p> Webcasts Fri, 13 May 2016 13:14:00 +0000 44761 at http://mwrf.com