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  • Jun 18, 2014
    webinar

    GaN Roundtable: Keeping It Cool With GaN Thermal Management

    Gallium Nitride (GaN) based technologies are experiencing a wide adoption throughout the high-frequency and high-power RF/Microwave industries. As higher frequency and higher power signals are passed through devices, heat becomes an intrinsic limiting factor that also raises costs. There are many creative solutions for decreasing the thermal stresses on GaN semiconductors....More
  • Apr 8, 2014
    webinar

    Tips for Successfully Integrating and Passing WLAN Regulatory Tests

    Live Webinar: April 8, 2014 at 2 p.m. ET / 11 a.m. PT | If you’re integrating a WLAN radio into your design, you probably have questions on how to pass compliance tests for FCC regulations. Surprisingly, only 1 in 10 engineers pass the first time. And failing is expensive and translates to project delays....More
  • Apr 2, 2014
    webinar

    MIPI Physical Layer Transmitter Test Solutions

    Live Webinar: April 2, 2014 at 1 p.m. ET / 10 a.m. PT | New physical standards are being developed by Mobile Industry Processor Interface (MIPI) Alliance standards body, which standardizes interfaces for mobile applications and designs. Additional capabilities and data rate extensions will be added to the existing D-PHY and M-PHY specifications to push the performance envelope. A new C-PHY specification will also be created, which is based on a new 3-wire multi-level signaling scheme to achieve higher performance through higher bits/symbol. If you are developing or validating the transmitters of these new MIPI physical layers, you'll want to attend this webcast to understand the new test challenges as well as the solutions....More
  • Mar 27, 2014
    webinar

    Simulation-Measurement Workflow for DDR Compliance

    Live Webinar: March 27, 2014 at 1 p.m. ET / 10 a.m. PT | This webcast discusses Agilent DDR3 and DDR4 compliance test applications using both pre-silicon simulated waveforms and post-silicon measured waveforms, with emphasis on correlating simulation with measurement. We will describe a methodology for simulating the full path from memory controller to DRAM solder ball. A simulation-measurement correlation methodology called “Waveform Bridge” is discussed where DQ and DQS waveforms in both pre-layout and post-layout simulations are used to feed a DDR compliance test app....More
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