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  • Jan 23, 2014
    webinar

    Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements

    Live Webinar: January 23, 2014 at 1 p.m. ET/10am PT | Gone are the days when IC pins were accessible and when bit rates were low enough that the probe loading was negligible. Today’s high density BGA packages and multi-gigabit/s data rates present twin challenges to signal integrity engineers who want to measure the eye diagram at the IC solder bump....More
  • Jan 9, 2014
    webinar

    The Fundamentals of Fast Pulsed IV Measurement

    Live Webinar: January 9, 2014 at 1 p.m. ET | In this webcast Agilent Technologies will cover all of the basics of fast pulsed IV measurement including: • An overview of pulsed measurement solution options • The pros and cons of DC probes versus RF probes for on-wafer measurement • Proper structure design practices to optimize on-wafer measurements • General tips and tricks to improve high-speed measurement results • Examples of high-speed IV measurement applications (NBTI/PBTI, RTS noise, etc....More
  • Dec 17, 2013
    webinar

    GaN Roundtable: Doherty Amplifiers and GaN Device Technology

    Featuring presenters from some of the leading GaN manufacturers in the microwave industry, this webcast roundtable will provide the latest information on GaN power transistors and ICs and how they are driving Doherty-amplifier performance for wireless communications and many other applications. Learn about the state of the art in today’s Doherty amplifiers and the GaN devices that are making these enhanced performance levels possible. This roundtable also will give you a chance to find out what lies ahead for both Doherty amplifiers and GaN device technology....More
  • Dec 17, 2013
    webinar

    Using Logic Analysis to Find Root Cause of Digital Design Errors

    This Webcast will explore how the root-cause of functional and timing errors can be easily found by using a logic analyzer early in the debug process. Learn how to observe bus-level signal integrity to get a quick overview of possible design violations involving wide parallel buses. Different techniques will be shown to help you accelerate your digital system debug and validation process....More
  • Dec 4, 2013
    webinar

    Extreme Oscilloscope Probing: Extreme Challenges Call for Extreme Solutions

    The demands placed on today's electronic products tend to far exceed what was expected from electronics just a few years ago. Mobile products are expected to operate and survive a wide range of environmental conditions all the while preserving battery life. Similarly, automotive or industrial applications are expected to function reliably over a wide range of potential harsh conditions....More
  • White Paper

    Redefining Instrumentation Through Open Software and Reconfigurable Hardware

    The way you interact with devices is changing. Single-purpose, hardware-centric user interfaces with limited functionality are giving way to multipurpose, software-centric systems with endless capability. National Instruments is at the forefront of redefining instrumentation to meet today’s test challenges while reducing the total cost of test. Read the white paper to learn more....More

Webcasts

True Differential S-Parameter Measurements

Tue, November 5, 2:00pm EST

Sponsored by: Rohde & Schwarz

Click here to register!

Whitepapers

New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements
Sponsored by Agilent Technologies
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Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies
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