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  • Jan 23, 2014
    webinar

    Fixture De-embedding Techniques for 28 Gb/s Transmitter Measurements

    Live Webinar: January 23, 2014 at 1 p.m. ET/10am PT | Gone are the days when IC pins were accessible and when bit rates were low enough that the probe loading was negligible. Today’s high density BGA packages and multi-gigabit/s data rates present twin challenges to signal integrity engineers who want to measure the eye diagram at the IC solder bump....More
  • Jan 9, 2014
    webinar

    The Fundamentals of Fast Pulsed IV Measurement

    Live Webinar: January 9, 2014 at 1 p.m. ET | In this webcast Agilent Technologies will cover all of the basics of fast pulsed IV measurement including: • An overview of pulsed measurement solution options • The pros and cons of DC probes versus RF probes for on-wafer measurement • Proper structure design practices to optimize on-wafer measurements • General tips and tricks to improve high-speed measurement results • Examples of high-speed IV measurement applications (NBTI/PBTI, RTS noise, etc....More
  • Dec 17, 2013
    webinar

    GaN Roundtable: Doherty Amplifiers and GaN Device Technology

    Featuring presenters from some of the leading GaN manufacturers in the microwave industry, this webcast roundtable will provide the latest information on GaN power transistors and ICs and how they are driving Doherty-amplifier performance for wireless communications and many other applications. Learn about the state of the art in today’s Doherty amplifiers and the GaN devices that are making these enhanced performance levels possible. This roundtable also will give you a chance to find out what lies ahead for both Doherty amplifiers and GaN device technology....More
  • Dec 17, 2013
    webinar

    Using Logic Analysis to Find Root Cause of Digital Design Errors

    This Webcast will explore how the root-cause of functional and timing errors can be easily found by using a logic analyzer early in the debug process. Learn how to observe bus-level signal integrity to get a quick overview of possible design violations involving wide parallel buses. Different techniques will be shown to help you accelerate your digital system debug and validation process....More
  • Dec 4, 2013
    webinar

    Extreme Oscilloscope Probing: Extreme Challenges Call for Extreme Solutions

    The demands placed on today's electronic products tend to far exceed what was expected from electronics just a few years ago. Mobile products are expected to operate and survive a wide range of environmental conditions all the while preserving battery life. Similarly, automotive or industrial applications are expected to function reliably over a wide range of potential harsh conditions....More
  • White Paper

    Redefining Instrumentation Through Open Software and Reconfigurable Hardware

    The way you interact with devices is changing. Single-purpose, hardware-centric user interfaces with limited functionality are giving way to multipurpose, software-centric systems with endless capability. National Instruments is at the forefront of redefining instrumentation to meet today’s test challenges while reducing the total cost of test. Read the white paper to learn more....More
  • Nov 5, 2013
    webinar

    True Differential S-Parameter Measurements

    Differential structures such as backplanes and cables are the primary means for transmitting high speed serial data signals. Signal integrity of these systems is determined by the characteristics of the media such as insertion loss, crosstalk, and differential to common mode conversion....More
  • Oct 9, 2013
    webinar

    Webcast: Phase Noise & Jitter Measurements

    This session will cover the theory and practice for making phase noise measurements on clock signals as well as the relationship between phase noise and total jitter, random jitter and deterministic jitter. Measurements on a typical clock signal will be presented....More
Whitepapers

Adding EMI Pre-compliance Testing to the Product Development Process is Cost-effective Insurance
Sponsored by Keysight Technologies
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New! Wi-Fi Standards Poster
Sponsored by Tektronix
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Reducing Life Cycle Costs with Reliable Airframe Microwave Assemblies
Sponsored by WL Gore
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Webcasts

Power Integrity Measurements – Choosing the Right Tools
February 26, 2015 @ 1pm EST
Sponsored by Keysight Technologies
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USB 3.1 - Gen2 10Gbps Receiver Test Challenges
March 11, 2015 @ 1pm EST
Sponsored by Keysight Technologies
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