White Paper http://mwrf.com/taxonomy/term/6611/more en Your guide to 5G physical layer modeling http://mwrf.com/test-measurement/your-guide-5g-physical-layer-modeling <div class="field-deck"> Sponosred by: Keysight Technologies </div> <div class="node-body article-body">Keysight wireless design and test tools enable the exploration of new technologies needed for next-generation 5G communications. Accelerate 5G design and test with these wireless resources from Keysight Technologies. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/your-guide-5g-physical-layer-modeling" target="_blank">read more</a></p> http://mwrf.com/test-measurement/your-guide-5g-physical-layer-modeling#comments Test & Measurement White Paper Wed, 20 Jan 2016 21:38:00 +0000 40041 at http://mwrf.com Modern Architecture Advances Vector Network Analyzer Performance http://mwrf.com/test-measurement/modern-architecture-advances-vector-network-analyzer-performance <div class="field-deck"> Sponsored by Anritsu </div> <div class="node-body article-body">Learn why Nonlinear Transmission Line (NLTL) sampling is a better solution for your vector network analysis (VNA) applications and how Anritsu’s VNA portfolio delivers NLTL across the board.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/modern-architecture-advances-vector-network-analyzer-performance" target="_blank">read more</a></p> http://mwrf.com/test-measurement/modern-architecture-advances-vector-network-analyzer-performance#comments Test & Measurement White Paper Fri, 13 Nov 2015 18:40:00 +0000 38151 at http://mwrf.com Introducing ShockLine™ Economy 2-port Model http://mwrf.com/test-measurement/introducing-shockline-economy-2-port-model <div class="field-deck"> Sponsored by Anritsu </div> <div class="node-body article-body">This video introduces the new ShockLine 2-port Economy vector network analyzers. These VNAs offer frequency range from 1 MHz to 4/8/14/20/30/40 GHz. They are based on patented shockline VNA-on-chip technology, which simplifies the internal VNA architecture at high frequencies, reduces instrument cost, and enhances accuracy and measurement repeatability.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/introducing-shockline-economy-2-port-model" target="_blank">read more</a></p> http://mwrf.com/test-measurement/introducing-shockline-economy-2-port-model#comments Test & Measurement White Paper Fri, 13 Nov 2015 18:40:00 +0000 38161 at http://mwrf.com VNA Fundamentals http://mwrf.com/test-measurement/vna-fundamentals <div class="field-deck"> Sponsored by Anritsu </div> <div class="node-body article-body">This new poster provides a comprehensive reference source for all VNA data, including Circuits and Waves, S-parameters, Reflection Coefficient, Phase and Group Delay, Non Linear Transmission Lines, VNA Architecture, Superposition/True Mode Stimulus, Pulse Measurements, Time Domain and Reflection Coefficient Table.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/vna-fundamentals" target="_blank">read more</a></p> http://mwrf.com/test-measurement/vna-fundamentals#comments Test & Measurement Test & Measurement - analyzers White Paper Fri, 13 Nov 2015 18:40:00 +0000 38171 at http://mwrf.com Achieving Fast and Accurate Multi-Channel Power Measurements Over a Wide Dynamic Range for Wireless Manufacturing http://mwrf.com/test-measurement/achieving-fast-and-accurate-multi-channel-power-measurements-over-wide-dynamic-rang <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="node-body article-body">Today, new chipsets are designed to handle wider power ranges to support higher data throughput and a wider coverage area. In addition to good repeatability, fast measurement speed and high accuracy, obtaining a wide power measurement range is now a key requirement in RF power measurements for wireless chipset or power amplifier manufacturing.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/achieving-fast-and-accurate-multi-channel-power-measurements-over-wide-dynamic-rang" target="_blank">read more</a></p> http://mwrf.com/test-measurement/achieving-fast-and-accurate-multi-channel-power-measurements-over-wide-dynamic-rang#comments Test & Measurement White Paper Thu, 12 Nov 2015 22:01:00 +0000 38131 at http://mwrf.com Accelerate 5G design and test with these wireless resources http://mwrf.com/test-measurement/accelerate-5g-design-and-test-these-wireless-resources <div class="field-deck"> Sponsored by Keysight Technologies </div> <div class="node-body article-body">Keysight provides the insight you need to keep up with the evolution of 5G. Download new content on topics such as: </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/accelerate-5g-design-and-test-these-wireless-resources" target="_blank">read more</a></p> http://mwrf.com/test-measurement/accelerate-5g-design-and-test-these-wireless-resources#comments Test & Measurement White Paper Tue, 10 Nov 2015 17:37:00 +0000 38101 at http://mwrf.com Accurately Characterize Your High Speed Interconnects and Devices http://mwrf.com/passive-components/accurately-characterize-your-high-speed-interconnects-and-devices <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Signal integrity problems from interconnects, transmitters and receivers affect product reliability and system performance, and have become a major challenge for designers of high speed systems. The importance of effectively and accurately using Vector Network Analyzers (VNAs) for both time domain and frequency domain measurements has increased.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/passive-components/accurately-characterize-your-high-speed-interconnects-and-devices" target="_blank">read more</a></p> http://mwrf.com/passive-components/accurately-characterize-your-high-speed-interconnects-and-devices#comments Active components Passive components Test & Measurement - analyzers White Paper Thu, 22 Oct 2015 18:23:00 +0000 37661 at http://mwrf.com Intermodulation Measurements Made Simple http://mwrf.com/active-components/intermodulation-measurements-made-simple <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">For a typical RF or microwave amplifier handling multiple carriers simultaneously, it is essential to know the limits of operation resulting from nonlinear effects in order to avoid degraded system level performance. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/intermodulation-measurements-made-simple" target="_blank">read more</a></p> http://mwrf.com/active-components/intermodulation-measurements-made-simple#comments Active components Analog semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Thu, 22 Oct 2015 18:23:00 +0000 37671 at http://mwrf.com Power Added Efficiency Measurements http://mwrf.com/active-components/power-added-efficiency-measurements <div class="field-deck"> Sponsored by: Rohde & Schwarz </div> <div class="node-body article-body">Power Added Efficiency (PAE) is a key parameter for the characterization of an amplifier. The objective is to find the point where an amplifier has its best efficiency. At that point, the ratio of the converted RF power with respect to the DC power is maximum.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/active-components/power-added-efficiency-measurements" target="_blank">read more</a></p> http://mwrf.com/active-components/power-added-efficiency-measurements#comments Active components Analog semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Thu, 22 Oct 2015 18:23:00 +0000 37681 at http://mwrf.com Integration and Operational Guidelines for MEMS-Based Inertial Systems: Applications that include magnetometers http://mwrf.com/test-measurement/integration-and-operational-guidelines-mems-based-inertial-systems-applications-inc <div class="field-deck"> Sponsored by Sparton </div> <div class="node-body article-body">High-performance inertial systems provide accurate platform heading information in a variety of applications and operational environments. However, the magnetometers used are susceptible to measurement distortion in the presence of any magnetic material.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/integration-and-operational-guidelines-mems-based-inertial-systems-applications-inc" target="_blank">read more</a></p> http://mwrf.com/test-measurement/integration-and-operational-guidelines-mems-based-inertial-systems-applications-inc#comments Materials Components Semiconductors Systems Test & Measurement White Paper Wed, 21 Oct 2015 14:54:00 +0000 37631 at http://mwrf.com