Contributors

Optimize Time Gating in Spectrum Analysis

Wed, 20 Mar 2013 19:44:00 +0000

Although various types of time gating exist, some applications are more appropriate for certain time-gating methods. Beyond making this determination, designers should know the latest techniques for gate triggering and measuring wide-bandwidth signals.

The Effect of Moore’s Law on RF Instruments

Fri, 01 Mar 2013 14:48:00 +0000

Moore’s Law has revolutionized the modern RF instrument by enabling new advancements in intermediate-frequency and baseband circuitry, as well as signal processing.

Faster processing technology brings substantial benefits to the RF instrument, which can be seen in how the field-programmable gate array (FPGA) is transforming the way we design RF instruments.

The Network of Tomorrow Takes Shape

Mon, 04 Feb 2013 16:13:00 +0000

In this follow-on to the article, “Cellular Networks Get Primed for Tomorrow,” the author provides insight into the technical and business issues that will shape near-future networks.

Enhance Packet Microwave Performance Through Fragmentation and FER Improvements

Fri, 18 Jan 2013 19:03:00 +0000

By leveraging data awareness, packet microwave technology can provide time-division-multiplex services with a performance that rivals former TDM microwave solutions.

Cellular Networks Get Primed For Tomorrow

Thu, 18 Oct 2012 14:23:00 +0000

Providers are pushing toward higher-efficiency 4G protocols, such as LTE, in order to provide the data services that will generate revenue growth for years to come.

As the cellular industry transitions from providing basic voice service and text messages to supporting high-data-rate digital services, the migration toward newer cellular protocols continues to accelerate.

Demystify Integrated-Phase-Deviation Results In Phase-Noise Measurements

Tue, 02 Oct 2012 20:55:00 +0000

Most modern spectrum analyzers have an automatic measurement for determining the integrated phase deviation of a mostly sinusoidal signal across a range of offset frequencies. The results can be expressed in units of dBc or rads.

Optimize Signal/Spectrum Analyzer Throughput For High-Volume Manufacturing Test

Mon, 20 Aug 2012 18:02:00 +0000

To obtain the highest throughput for the analyzers used in manufacturing test, one should create a test plan that accounts for speed, repeatability, and dynamic range.

Find Out Why PXI Is Being Used For RF Instruments

Mon, 30 Jul 2012 18:35:00 +0000

David A. Hall

Today, several instrument vendors are offering high-performance PXI RF test equipment. In a world that was once dominated by traditional-rack-and-stack instruments, this industry shift begs the question: “Why?” More specifically, we should ask, Why are engineers using PXI for their RF test needs, and Why did this change occur? I would like to take a stab at answering these questions while providing the context for why PXI has become a de-facto standard for RF instrumentation.

Create An LTE Field Environment In The Lab

Mon, 02 Jul 2012 18:55:00 +0000

Paul Collins, Madhusudhan Gurumurthy

Many see drive testing–the process of testing cellular systems and equipment by literally driving around with live mobile devices in a car or van—as the ultimate test of a cell phone or base station. However, drive testing incurs significant costs and liabilities while offering very little in terms of repeatability. For many years, testing and R&D labs have dreamed of “virtual drive testing” or the laboratory-based repeatable replication of live field environments.

Introducing Wireless Standards of the Future: IEEE 802.11ac and LTE-Advanced

Mon, 02 Jul 2012 18:48:00 +0000

In this article, we’ll take a look the physical layer characteristics of the hottest wireless standards and explain how higher data rates are achieved. More specifically, we’ll look at how features such as more spatial streams, carrier aggregation, and higher-order modulation schemes directly correspond to higher data throughput. Finally, we’ll look at how evolutions in the physical layer for each standard create new test challenges for today’s RF engineer.