Test & Measurement http://mwrf.com/taxonomy/term/6787/more en Speed Time to Market with Consistent Measurements from R&D Through Manufacturing http://mwrf.com/test-measurement/speed-time-market-consistent-measurements-rd-through-manufacturing <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">When multiple instrument form factors such as benchtop and PXI instruments are used in your design and manufacturing processes the challenge is to achieve reliably consistent measurement results while using the best instrument for a specific purpose.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/speed-time-market-consistent-measurements-rd-through-manufacturing" target="_blank">read more</a></p> http://mwrf.com/test-measurement/speed-time-market-consistent-measurements-rd-through-manufacturing#comments Test & Measurement Test & Measurement - analyzers White Paper Tue, 02 Jun 2015 14:13:00 +0000 34581 at http://mwrf.com Keeping Time Is Part of Measuring It http://mwrf.com/blog/keeping-time-part-measuring-it <div class="node-body blog-body">Many newer test instruments provide an input port for connection of a GPS signal, to serve as an external time/frequency standard. But what are the other options when it comes to keeping time?</div> <div class="og_rss_groups"><ul class="links"><li class="og_links first last"><a href="/blog/measuring-progress">Measuring Progress</a></li> </ul></div><p><a href="http://mwrf.com/blog/keeping-time-part-measuring-it" target="_blank">read more</a></p> http://mwrf.com/blog/keeping-time-part-measuring-it#comments Test & Measurement Test & Measurement - analyzers Test & Measurement - generators Measuring Progress Mon, 01 Jun 2015 18:50:00 +0000 34541 at http://mwrf.com Wrapping Up IMS 2015 http://mwrf.com/blog/wrapping-ims-2015 <div class="node-body blog-body">This was my sixth IMS and I was happy to attend as it is by far the best RF/wireless conferences available. </div> <div class="og_rss_groups"><ul class="links"><li class="og_links first last"><a href="/blog/line-sight">Line of Sight</a></li> </ul></div><p><a href="http://mwrf.com/blog/wrapping-ims-2015" target="_blank">read more</a></p> http://mwrf.com/blog/wrapping-ims-2015#comments Test & Measurement Line of Sight Wed, 27 May 2015 14:15:00 +0000 34371 at http://mwrf.com Signal Hound Unveils Digital Modulation Analysis Tools at IMS http://mwrf.com/test-measurement/signal-hound-unveils-digital-modulation-analysis-tools-ims <div class="field-byline"> From Staff </div> <div class="node-body article-body">Coinciding with IMS 2015 in Phoenix, Ariz., Signal Hound has rolled out an update to its free Spike Spectrum Analysis software. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/signal-hound-unveils-digital-modulation-analysis-tools-ims" target="_blank">read more</a></p> http://mwrf.com/test-measurement/signal-hound-unveils-digital-modulation-analysis-tools-ims#comments Commercial Test & Measurement Wed, 20 May 2015 19:59:00 +0000 34261 at http://mwrf.com Vaunix Flaunts New Programmable Test Solutions at IMS 2015 http://mwrf.com/test-measurement/vaunix-flaunts-new-programmable-test-solutions-ims-2015 <div class="node-body article-body">Vaunix further expanded its complement of programmable RF devices with new signal generators, attenuators, switches, and phase shifters for use in a host of test applications. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/vaunix-flaunts-new-programmable-test-solutions-ims-2015" target="_blank">read more</a></p> http://mwrf.com/test-measurement/vaunix-flaunts-new-programmable-test-solutions-ims-2015#comments Passive components Test & Measurement Test & Measurement - generators Tue, 19 May 2015 18:58:00 +0000 34171 at http://mwrf.com TTE’s Bias Tee Line Makes IMS Debut http://mwrf.com/components/tte-s-bias-tee-line-makes-ims-debut <div class="field-byline"> From Staff </div> <div class="node-body article-body">TTE Filters is introducing its new line of bias tees at IMS 2015 (Booth No. 717). The BTHF (high frequency), BTHC (high current) and BTS (standard) bias tee series are designed for use in biasing active antennas, amplifiers, and laser diodes.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/components/tte-s-bias-tee-line-makes-ims-debut" target="_blank">read more</a></p> http://mwrf.com/components/tte-s-bias-tee-line-makes-ims-debut#comments Commercial Components Defense Industrial Medical Test & Measurement Mon, 18 May 2015 18:44:00 +0000 34151 at http://mwrf.com HF MLCCs, Thin-Film Components Lead the Way for Vishay at IMS2015 http://mwrf.com/passive-components/hf-mlccs-thin-film-components-lead-way-vishay-ims2015 <div class="node-body article-body">Vishay Intertechnology will exhibit multiple product innovations at IMS2015, including high-frequency MLCCs, thin-film capacitors and resistors, and customized substrates.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/passive-components/hf-mlccs-thin-film-components-lead-way-vishay-ims2015" target="_blank">read more</a></p> http://mwrf.com/passive-components/hf-mlccs-thin-film-components-lead-way-vishay-ims2015#comments Passive components Test & Measurement Mon, 18 May 2015 16:42:00 +0000 34141 at http://mwrf.com How Not to Break your Network Analyzer http://mwrf.com/test-measurement/how-not-break-your-network-analyzer <div class="node-body article-body">Proper technique can ensure that a highly sensitive and expensive instrument is put to use making quality measurements instead of sitting on a repair bench.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/how-not-break-your-network-analyzer" target="_blank">read more</a></p> http://mwrf.com/test-measurement/how-not-break-your-network-analyzer#comments Keysight Technologies Commercial Defense Test & Measurement Thu, 14 May 2015 16:05:00 +0000 34041 at http://mwrf.com <p>High performance RF/microwave equipment is extremely expensive and sensitive. Special care must be taken to avoid test equipment damage.</p> RF Design Made Simple http://mwrf.com/test-measurement/rf-design-made-simple <div class="node-body article-body">With more industries than ever leveraging RF technologies, it is essential for many to have at least a fundamental understanding of RF design basics.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/rf-design-made-simple" target="_blank">read more</a></p> http://mwrf.com/test-measurement/rf-design-made-simple#comments Rohde & Schwarz Commercial Defense Test & Measurement Thu, 14 May 2015 15:52:00 +0000 34051 at http://mwrf.com Differential Group Delay Modules Aid Instantaneous Microwave Measurements http://mwrf.com/test-measurement/differential-group-delay-modules-aid-instantaneous-microwave-measurements <div class="field-deck"> Researchers from Singapore experimentally demonstrated a frequency range and resolution adjustable microwave measurement technique using photonic technologies. </div> <div class="node-body article-body">Researchers from Singapore experimentally demonstrated a frequency range and resolution adjustable microwave measurement technique using photonic technologies.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/differential-group-delay-modules-aid-instantaneous-microwave-measurements" target="_blank">read more</a></p> http://mwrf.com/test-measurement/differential-group-delay-modules-aid-instantaneous-microwave-measurements#comments Active components Test & Measurement Mon, 11 May 2015 14:05:00 +0000 33911 at http://mwrf.com