Test & Measurement - analyzers http://mwrf.com/taxonomy/term/6891/more en Characterize Plasmonic-Resonator Spectra at Nanoscale Resolution http://mwrf.com/test-measurement-analyzers/characterize-plasmonic-resonator-spectra-nanoscale-resolution <div class="node-body article-body">Photothermal induced resonance (PTIR) can be used to characterize plasmonic nanomaterials, thanks to a passive tip that mitigates interference.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/characterize-plasmonic-resonator-spectra-nanoscale-resolution" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/characterize-plasmonic-resonator-spectra-nanoscale-resolution#comments News Test & Measurement - analyzers Wed, 24 Sep 2014 15:20:00 +0000 28691 at http://mwrf.com Cascade Microtech: Robust Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz http://mwrf.com/cascade-microtech-robust-calibrated-measurement-frequencies-140-ghz-11-thz <div class="node-body link-body">Millimeter and sub-millimeter wavelength on-wafer probes and associated accessories for metrology-grade measurement of devices and materials with frequencies from 140 GHz to 1.1 THz. The probes offer low insertion loss, as well as excellent probe tip and sample visibility. Probe stations can be configured with programmable positioners to allow automated and repeatable sub-micron positioning during TRL calibration to ensure the highest precision at the probe tip. </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/Robust-Calibrated-Measurement-at-Frequencies-from-140-GHz-to-1.png?1410960360" /> </div> <div class="field-link-target"> <span>Open In New Window:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/cascade-microtech-robust-calibrated-measurement-frequencies-140-ghz-11-thz" target="_blank">read more</a></p> Test & Measurement - analyzers Wed, 17 Sep 2014 13:25:00 +0000 28591 at http://mwrf.com Cascade Microtech: Wafer-level Measurement Solution for Device Characterization up to 110 GHz http://mwrf.com/cascade-microtech-wafer-level-measurement-solution-device-characterization-110-ghz <div class="node-body link-body">Guaranteed configuration, installation and support in a pre-validated system configuration for accurate and repeatable wafer-level device characterization. This is essential for device modeling, technology development, process development and specification, process monitoring, component specification and pilot manufacturing.</div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/Wafer-level-Measurement-Solution-for-Device-Characterization-up-to-110-GHz.png?1410960296" /> </div> <div class="field-link-target"> <span>Open In New Window:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/cascade-microtech-wafer-level-measurement-solution-device-characterization-110-ghz" target="_blank">read more</a></p> Test & Measurement - analyzers Wed, 17 Sep 2014 13:24:00 +0000 28581 at http://mwrf.com Cascade Microtech: Cost-effective Precision 150 mm Probe System for mmW http://mwrf.com/cascade-microtech-cost-effective-precision-150-mm-probe-system-mmw <div class="node-body link-body">The EPS150MMW is a dedicated manual probing solution that comes with everything you need to achieve accurate measurement results in the shortest time, with maximum confidence. The system incorporates best-known methods for probing up to sub-THz frequencies. The backlash-free, high-precision X-Y-Z movement of mmW and RF positioners, integrated planarization, and a contact separation drive with 1 μm repeatability, enable precise probe placement and contact repeatability comparable to semi-automatic systems. </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/Cost-effective-Precision-150-mm-Probe-System-for-mmW.png?1410960230" /> </div> <div class="field-link-target"> <span>Open In New Window:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/cascade-microtech-cost-effective-precision-150-mm-probe-system-mmw" target="_blank">read more</a></p> Test & Measurement - analyzers Wed, 17 Sep 2014 13:21:00 +0000 28571 at http://mwrf.com Characterization Softwares For Your RF/Microwave Devices http://mwrf.com/systems/characterization-softwares-your-rfmicrowave-devices <div class="field-deck"> Burdened by the challenge of characterizing the latest devices, engineers are looking for solutions to streamline their test processes, analysis, and data management. </div> <div class="node-body article-body">Testing RF/microwave/millimeter-wave devices under a wide operation range for characterization can be time consuming and error prone. Fortunately, companies are forging software/hardware solutions to aid and even automate this process.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/systems/characterization-softwares-your-rfmicrowave-devices" target="_blank">read more</a></p> http://mwrf.com/systems/characterization-softwares-your-rfmicrowave-devices#comments Commercial Defense Systems Test & Measurement - analyzers Test & Measurement - generators Wed, 10 Sep 2014 19:22:00 +0000 28331 at http://mwrf.com Palm-Sized Analyzers Scour 6-GHz Spectrum http://mwrf.com/test-measurement-analyzers/palm-sized-analyzers-scour-6-ghz-spectrum <div class="node-body article-body">This pair of handheld, portable spectrum analyzers can capture and display signals as high as 6 GHz in frequency. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/palm-sized-analyzers-scour-6-ghz-spectrum" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/palm-sized-analyzers-scour-6-ghz-spectrum#comments Commercial Industrial Test & Measurement - analyzers Tue, 09 Sep 2014 20:08:00 +0000 28301 at http://mwrf.com What Software Do You Use To Characterize Your Devices? http://mwrf.com/software/what-software-do-you-use-characterize-your-devices <div class="node-body gallery-body">The task of testing and characterizing RF/microwave/millimeter-wave devices is growing increasingly more complex and time consuming. These new devices need to be characterized so that statistical models can be developed for sophisticated system and circuit design software. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/software/what-software-do-you-use-characterize-your-devices" target="_blank">read more</a></p> http://mwrf.com/software/what-software-do-you-use-characterize-your-devices#comments Commercial Industrial Software Test & Measurement Test & Measurement - analyzers Test & Measurement - generators Tue, 09 Sep 2014 18:48:00 +0000 28291 at http://mwrf.com Measure Interference in Crowded Spectrum http://mwrf.com/test-measurement-analyzers/measure-interference-crowded-spectrum <div class="field-byline"> Robin Jackman </div> <div class="field-deck"> Understanding how to choose and use the right measurement equipment can help when attempting to zero in on interference signals in densely packed spectrum. </div> <div class="node-body article-body">Choosing the appropriate test equipment can help ease the task of isolating and identifying interference signals and their sources.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/measure-interference-crowded-spectrum" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/measure-interference-crowded-spectrum#comments Commercial Industrial Test & Measurement - analyzers Tue, 02 Sep 2014 20:48:00 +0000 28111 at http://mwrf.com Transmitter Test Solution Supports P25 Emergency Comm Standards http://mwrf.com/test-measurement/transmitter-test-solution-supports-p25-emergency-comm-standards <div class="node-body article-body">Tektronix developed test software that complies with the Project 25 (P25) standard for Land Mobile Radio (LMR) emergency services.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/transmitter-test-solution-supports-p25-emergency-comm-standards" target="_blank">read more</a></p> http://mwrf.com/test-measurement/transmitter-test-solution-supports-p25-emergency-comm-standards#comments News Software Test & Measurement Test & Measurement - analyzers Thu, 21 Aug 2014 21:34:00 +0000 27891 at http://mwrf.com <p>Adjacent Channel Power Ratio, Eye Diagram, Symbol table and scalar measurements with pass/fail results are among the tests available for verifying the compliance of a P25 Phase1 C4FM signal to the TIA-102 standard. (Courtesy of Tektronix)</p> Instrument Aims at Amp Optimization through 2.5 GHz http://mwrf.com/test-measurement-analyzers/instrument-aims-amp-optimization-through-25-ghz <div class="field-byline"> David Lester </div> <div class="field-deck"> When combined with a PC or laptop computer and an evaluation board, this instrument streamlines the optimization of a wide range of RF/microwave amplifiers. </div> <div class="node-body article-body">The RF Power Tool is a compact measurement instrument/system capable of making measurements and optimizing performance of amplifiers operating through 2.5 GHz. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/instrument-aims-amp-optimization-through-25-ghz" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/instrument-aims-amp-optimization-through-25-ghz#comments Freescale Commercial Defense Industrial Test & Measurement - analyzers Tue, 12 Aug 2014 14:39:00 +0000 27621 at http://mwrf.com