Test & Measurement - analyzers http://mwrf.com/taxonomy/term/6891/more en PXI/PXIe VNAs Reach 26.5 GHz http://mwrf.com/test-measurement-analyzers/pxipxie-vnas-reach-265-ghz <div class="field-deck"> Built into compact modules, these VNAs make it possible to add two ports of amplitude/phase measurement capabilities at a time, spanning a total measurement range of 300 kHz to 26.5 GHz. </div> <div class="node-body article-body">This new line of PXI/PXIe RF/microwave vector network analyzers packs two ports of measurement power into each module, with available test frequencies to 26.5 GHz</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/pxipxie-vnas-reach-265-ghz" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/pxipxie-vnas-reach-265-ghz#comments Commercial Defense Industrial Test & Measurement - analyzers Mon, 13 Oct 2014 18:57:00 +0000 29171 at http://mwrf.com Effectively Maintaining and Troubleshooting Military Communication Systems Application Note http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">This application note focuses on the “what” and “how” of effective testing in pursuit of optimum performance in military communication systems. Two examples will highlight what’s possible: field test and verification of radar systems; and testing of VHF/UHF radios. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat" target="_blank">read more</a></p> http://mwrf.com/test-measurement/effectively-maintaining-and-troubleshooting-military-communication-systems-applicat#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 20:03:00 +0000 29081 at http://mwrf.com Radar Fundamentals Poster http://mwrf.com/test-measurement/radar-fundamentals-poster <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">Check out the core elements of radar test; radar block diagram, basic equations, military nomenclature, pulse compression techniques, radar-frequency letter bands and the latest Keysight radar equipment. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/radar-fundamentals-poster" target="_blank">read more</a></p> http://mwrf.com/test-measurement/radar-fundamentals-poster#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 19:59:00 +0000 29071 at http://mwrf.com Satellite Test Essentials Poster http://mwrf.com/test-measurement/satellite-test-essentials-poster <div class="field-deck"> Sponsored by: Keysight Technologies </div> <div class="node-body article-body">This colorful and informative poster graphs atmospheric absorption of mm waves, shows frequency allocations, noise power ratio and calculations for link budget along with the latest satellite test solutions from Keysight. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/satellite-test-essentials-poster" target="_blank">read more</a></p> http://mwrf.com/test-measurement/satellite-test-essentials-poster#comments Test & Measurement Test & Measurement - analyzers White Paper Thu, 09 Oct 2014 19:00:00 +0000 29061 at http://mwrf.com VNA Adds Behavioral Modeling For Nonlinear-Characterization Functionality http://mwrf.com/test-measurement-analyzers/vna-adds-behavioral-modeling-nonlinear-characterization-functionality <div class="node-body article-body">The Cardiff Model Lite test solution combines a vector network analyzer (VNA) and phase-reference technology to test the interactions between different circuit elements.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/vna-adds-behavioral-modeling-nonlinear-characterization-functionality" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/vna-adds-behavioral-modeling-nonlinear-characterization-functionality#comments News Software Test & Measurement - analyzers Fri, 03 Oct 2014 15:20:00 +0000 28871 at http://mwrf.com Oscilloscope Option Offers Automatic Glitch Rejection http://mwrf.com/test-measurement-analyzers/oscilloscope-option-offers-automatic-glitch-rejection <div class="node-body article-body">Rohde & Schwarz’s RTO-K40 option for the R&S RTO high-performance oscilloscopes simplifies analysis and testing of RF front-end interfaces.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/oscilloscope-option-offers-automatic-glitch-rejection" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/oscilloscope-option-offers-automatic-glitch-rejection#comments News Test & Measurement - analyzers Fri, 03 Oct 2014 15:11:00 +0000 28851 at http://mwrf.com 12G-SDI Chipset Enables 4K Monitoring http://mwrf.com/test-measurement-analyzers/12g-sdi-chipset-enables-4k-monitoring <div class="node-body article-body">PHABRIX will incorporate MACOM’s 12G-SDI chipset in its 4K monitoring instruments.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/12g-sdi-chipset-enables-4k-monitoring" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/12g-sdi-chipset-enables-4k-monitoring#comments News Active components Test & Measurement Test & Measurement - analyzers Fri, 03 Oct 2014 14:44:00 +0000 28801 at http://mwrf.com Characterize Plasmonic-Resonator Spectra at Nanoscale Resolution http://mwrf.com/test-measurement-analyzers/characterize-plasmonic-resonator-spectra-nanoscale-resolution <div class="node-body article-body">Photothermal induced resonance (PTIR) can be used to characterize plasmonic nanomaterials, thanks to a passive tip that mitigates interference.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/characterize-plasmonic-resonator-spectra-nanoscale-resolution" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/characterize-plasmonic-resonator-spectra-nanoscale-resolution#comments News Test & Measurement - analyzers Wed, 24 Sep 2014 15:20:00 +0000 28691 at http://mwrf.com Cascade Microtech: Robust Calibrated Measurement at Frequencies from 140 GHz to 1.1 THz http://mwrf.com/cascade-microtech-robust-calibrated-measurement-frequencies-140-ghz-11-thz <div class="node-body link-body">Millimeter and sub-millimeter wavelength on-wafer probes and associated accessories for metrology-grade measurement of devices and materials with frequencies from 140 GHz to 1.1 THz. The probes offer low insertion loss, as well as excellent probe tip and sample visibility. Probe stations can be configured with programmable positioners to allow automated and repeatable sub-micron positioning during TRL calibration to ensure the highest precision at the probe tip. </div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/Robust-Calibrated-Measurement-at-Frequencies-from-140-GHz-to-1.png?1410960360" /> </div> <div class="field-link-target"> <span>Open In New Window:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/cascade-microtech-robust-calibrated-measurement-frequencies-140-ghz-11-thz" target="_blank">read more</a></p> Test & Measurement - analyzers Wed, 17 Sep 2014 13:25:00 +0000 28591 at http://mwrf.com Cascade Microtech: Wafer-level Measurement Solution for Device Characterization up to 110 GHz http://mwrf.com/cascade-microtech-wafer-level-measurement-solution-device-characterization-110-ghz <div class="node-body link-body">Guaranteed configuration, installation and support in a pre-validated system configuration for accurate and repeatable wafer-level device characterization. This is essential for device modeling, technology development, process development and specification, process monitoring, component specification and pilot manufacturing.</div> <div class="field-image-promo"> <img class="imagefield imagefield-field_image_promo" width="595" height="335" alt="" src="http://mwrf.com/site-files/mwrf.com/files/Wafer-level-Measurement-Solution-for-Device-Characterization-up-to-110-GHz.png?1410960296" /> </div> <div class="field-link-target"> <span>Open In New Window:&nbsp;</span> No </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/cascade-microtech-wafer-level-measurement-solution-device-characterization-110-ghz" target="_blank">read more</a></p> Test & Measurement - analyzers Wed, 17 Sep 2014 13:24:00 +0000 28581 at http://mwrf.com