It is possible to measure the noise figure of a component or DUT without a calibrated noise source by using a source capable of generated two different input noise levels to the DUT....More
RF/microwave probes and test fixtures provide invaluable measurement paths between a device to be tested and the test signal/analysis equipment....More
High-frequency measurement capabilities are moving from the laboratory to the marketplace by means of a growing number of portable RF/microwave test tools....More
The SLE900 Satellite Link Emulator series operates at satcom intermediate frequencies (IF) and features a large touchscreen display for ease of control....More
Mixed-signal and digital-sampling oscilloscopes cover bandwidths from 200 MHz to 1.5 GHz with versatile measurement functions and fast sampling rates of 2.5 GSamples/s....More
Accurate power measurement plays a crucial role in the operation of many RF/microwave-based systems. But to fully appreciate its contribution, a thorough review of measurement fundamentals is necessary....More
GaN Roundtable: The State of GaN Reliability Today
Wednesday, April 3rd, 2013, 2:00 pm ET. Gallium nitride (GaN) has come a long way over the past few years in terms of affordability, industry acceptance and, in particular, reliability. In this webcast roundtable, a panel of expert speakers will assess the current state of GaN reliability, along with offering predictions for its future.
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements Sponsored by Agilent Technologies Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
Sponsored by Agilent Technologies Download this white paper