Test & Measurement - generators http://mwrf.com/taxonomy/term/6901/more en Lowering the Cost of Wireless Manufacturing Test http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">This white paper covers the basics of non-signaling test from 10 MHz to 6 GHz, the technology models of implementing a non-signaling test setup, approaches to lowering the overall test cost, as well as turnkey chipset-specific calibration and verification solution.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/lowering-cost-wireless-manufacturing-test#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31861 at http://mwrf.com Neighbor Cell Detection Test http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">With more and more radio technologies introduced, as well as the concept of HetNet, the testing for mobile devices becomes ever increasingly complex. A cellular phone’s neighbor cell detection capability is important to its overall performance, not only for mobility behavior such as re-selection and handover but also for cellular-assisted location estimation.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/neighbor-cell-detection-test#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31871 at http://mwrf.com Understanding Carrier Aggregation http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation <div class="field-deck"> Sponsored by: Anritsu </div> <div class="node-body article-body">This paper discusses Carrier Aggregation (CA) evolution in HSPA and LTE Networks, the implication on the architecture and the User Equipment. It also discusses the testing method to </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/understanding-carrier-aggregation#comments Digital semiconductors Test & Measurement - analyzers Test & Measurement - generators White Paper Mon, 23 Feb 2015 16:57:00 +0000 31881 at http://mwrf.com LTE Device Testing: from Theory to Measurement http://mwrf.com/test-measurement-analyzers/lte-device-testing-theory-measurement <div class="node-body article-body">As more mobile devices are being equipped with LTE technology, understanding both theory and practical measurement techniques is necessary for everyone from troubleshooting technicians to design engineers.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/lte-device-testing-theory-measurement" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/lte-device-testing-theory-measurement#comments National Instruments Commercial Industrial Test & Measurement - analyzers Test & Measurement - generators Thu, 22 Jan 2015 16:02:00 +0000 31231 at http://mwrf.com Enhance Active Load-Pull and Doherty PAs http://mwrf.com/test-measurement-analyzers/enhance-active-load-pull-and-doherty-pas <div class="node-body article-body">Doherty PAs are becoming more common as modulation schemes increase in peak-to-average-power ratio. Using load-pull to optimize a Doherty PA design can lower device power levels and increase the PA design’s efficiency.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/enhance-active-load-pull-and-doherty-pas" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/enhance-active-load-pull-and-doherty-pas#comments Commercial Industrial Test & Measurement - analyzers Test & Measurement - generators Thu, 22 Jan 2015 15:31:00 +0000 31241 at http://mwrf.com Generator Spans 25 to 6000 MHz http://mwrf.com/test-measurement-generators/generator-spans-25-6000-mhz <div class="node-body article-body">This simple, low-cost signal generator is available for fundamental-frequency outputs from 25 MHz to 6 GHz and doubled-frequency outputs from 50 MHz to 12 GHz. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-generators/generator-spans-25-6000-mhz" target="_blank">read more</a></p> http://mwrf.com/test-measurement-generators/generator-spans-25-6000-mhz#comments Commercial Industrial Test & Measurement - generators Wed, 21 Jan 2015 19:04:00 +0000 30851 at http://mwrf.com Man and Machine: Bonded Together with RF Glue http://mwrf.com/test-measurement-generators/man-and-machine-bonded-together-rf-glue <div class="field-deck"> By embracing cost-sensitive and integrated approaches, unmanned systems, COTS, DASs/small cells, and test are opening doors to technology previously only seen in science fiction. </div> <div class="node-body article-body">By embracing cost-sensitive and integrated approaches, unmanned systems, COTS, DASs/small cells, and test are opening doors to technology previously only seen in science fiction.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-generators/man-and-machine-bonded-together-rf-glue" target="_blank">read more</a></p> http://mwrf.com/test-measurement-generators/man-and-machine-bonded-together-rf-glue#comments Active components Automotive Commercial Defense Passive components Test & Measurement - analyzers Test & Measurement - generators Thu, 15 Jan 2015 16:34:00 +0000 31061 at http://mwrf.com Signal-Generation Advances Support Electronic Warfare’s Evolution http://mwrf.com/test-measurement-generators/signal-generation-advances-support-electronic-warfare-s-evolution <div class="field-deck"> As electronic threats grow and the electronic-warfare environment becomes more complex, new methods of generating and controlling EW signals are needed to maintain a modern war-force. </div> <div class="node-body article-body">As technology barriers are torn down to enable complex digital, analog, and RF integrated systems, software-defined radios and intelligently controlled radios are entering the battlespace as the next generation of EW technologies.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-generators/signal-generation-advances-support-electronic-warfare-s-evolution" target="_blank">read more</a></p> http://mwrf.com/test-measurement-generators/signal-generation-advances-support-electronic-warfare-s-evolution#comments Active components Defense Systems Test & Measurement - generators Thu, 18 Dec 2014 19:54:00 +0000 30411 at http://mwrf.com MIMO Testing: The Good and the Bad http://mwrf.com/test-measurement/mimo-testing-good-and-bad <div class="field-byline"> Alessandro Scannavini, RF Engineer, Microwave Vision </div> <div class="field-deck"> The growing demand for bandwidth is increasing the requirements for MIMO technology, and thus the testing of MIMO devices. </div> <div class="node-body article-body">As MIMO devices are increasingly sought to solve throughput demand problem, more antennas are being included in the device design. This complexity is augmenting the value of automated methods for performing MIMO test.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/mimo-testing-good-and-bad" target="_blank">read more</a></p> http://mwrf.com/test-measurement/mimo-testing-good-and-bad#comments Commercial Test & Measurement Test & Measurement - analyzers Test & Measurement - generators Wed, 17 Dec 2014 16:48:00 +0000 30541 at http://mwrf.com PC-Driven Test Instruments Pick Up Speed http://mwrf.com/test-measurement-analyzers/pc-driven-test-instruments-pick-speed <div class="field-deck"> The trend toward more integrated test instruments has improved performance at the high end while spawning a market for low-cost, portable, and PC-driven instruments. </div> <div class="node-body article-body">As more markets and industries embrace RF/microwave and wireless technologies, there is a growing need for low-cost, low-complexity, and easily incorporated test and measurement equipment. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/pc-driven-test-instruments-pick-speed" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/pc-driven-test-instruments-pick-speed#comments Commercial Industrial Test & Measurement - analyzers Test & Measurement - generators Thu, 11 Dec 2014 16:25:00 +0000 30371 at http://mwrf.com