Test & Measurement - generators http://mwrf.com/taxonomy/term/6901/more en MIMO Testing: The Good and the Bad http://mwrf.com/test-measurement/mimo-testing-good-and-bad <div class="field-byline"> Alessandro Scannavini, RF Engineer, Microwave Vision </div> <div class="field-deck"> The growing demand for bandwidth is increasing the requirements for MIMO technology, and thus the testing of MIMO devices. </div> <div class="node-body article-body">As MIMO devices are increasingly sought to solve throughput demand problem, more antennas are being included in the device design. This complexity is augmenting the value of automated methods for performing MIMO test.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement/mimo-testing-good-and-bad" target="_blank">read more</a></p> http://mwrf.com/test-measurement/mimo-testing-good-and-bad#comments Commercial Test & Measurement Test & Measurement - analyzers Test & Measurement - generators Wed, 17 Dec 2014 16:48:00 +0000 30541 at http://mwrf.com PC-Driven Test Instruments Pick Up Speed http://mwrf.com/test-measurement-analyzers/pc-driven-test-instruments-pick-speed <div class="field-deck"> The trend toward more integrated test instruments has improved performance at the high end while spawning a market for low-cost, portable, and PC-driven instruments. </div> <div class="node-body article-body">As more markets and industries embrace RF/microwave and wireless technologies, there is a growing need for low-cost, low-complexity, and easily incorporated test and measurement equipment. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/pc-driven-test-instruments-pick-speed" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/pc-driven-test-instruments-pick-speed#comments Commercial Industrial Test & Measurement - analyzers Test & Measurement - generators Thu, 11 Dec 2014 16:25:00 +0000 30371 at http://mwrf.com AWG Delivers 20 GHz With 65 GSamples/s http://mwrf.com/test-measurement-generators/awg-delivers-20-ghz-65-gsampless <div class="field-deck"> Packed within a compact AXIe module, this arbitrary waveform generator offers 8-b vertical resolution and as many as four synchronized channels to produce complex modulated signals. </div> <div class="node-body article-body">This compact modular AXIe format arbitrary waveform generator (AWG) delivers a 20-GHz analog bandwidth by merit of its 65 GSamples/s sampling rate. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-generators/awg-delivers-20-ghz-65-gsampless" target="_blank">read more</a></p> http://mwrf.com/test-measurement-generators/awg-delivers-20-ghz-65-gsampless#comments Keysight Technologies Commercial Defense Industrial Test & Measurement - generators Wed, 03 Dec 2014 21:49:00 +0000 30051 at http://mwrf.com Mitigate Distortions in Software-Defined Wideband Receivers http://mwrf.com/test-measurement-analyzers/mitigate-distortions-software-defined-wideband-receivers <div class="node-body article-body">To limit the effects of wideband nonlinear distortion on direct-conversion receivers, researchers in Finland and Germany have developed a method using a digital feed-forward algorithm for distortion mitigation. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/mitigate-distortions-software-defined-wideband-receivers" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/mitigate-distortions-software-defined-wideband-receivers#comments Commercial Test & Measurement - analyzers Test & Measurement - generators Fri, 21 Nov 2014 16:00:00 +0000 29841 at http://mwrf.com Why Measure a Microwave Device at Low Frequencies? http://mwrf.com/test-measurement-analyzers/why-measure-microwave-device-low-frequencies <div class="node-body article-body">Characterizing a microwave power amplifier or oscillator at low frequency can enable the modeling of nonlinear and noise parameters, which would be masked in traditional characterization measurements.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/why-measure-microwave-device-low-frequencies" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/why-measure-microwave-device-low-frequencies#comments Commercial Test & Measurement - analyzers Test & Measurement - generators Fri, 21 Nov 2014 15:46:00 +0000 29821 at http://mwrf.com GaN Drives Advances in Computer-Aided Design http://mwrf.com/test-measurement-analyzers/gan-drives-advances-computer-aided-design <div class="field-deck"> The increased complexity of gallium-nitride-based RF devices is creating a demand for even greater modeling and model-extraction tools to power computer-aided-design techniques. </div> <div class="node-body article-body">As gallium-nitride devices serve a growing number of applications ranging from wireless infrastructure to military arrays, the need to rapidly and efficiently design these high-frequency/high-power devices is driving computer-aided design tools to the next level.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-analyzers/gan-drives-advances-computer-aided-design" target="_blank">read more</a></p> http://mwrf.com/test-measurement-analyzers/gan-drives-advances-computer-aided-design#comments Active components Commercial Defense Industrial Test & Measurement - analyzers Test & Measurement - generators Mon, 10 Nov 2014 15:27:00 +0000 29601 at http://mwrf.com DDR Bus Simulator Eliminates Bit-Pattern Generation http://mwrf.com/test-measurement-generators/ddr-bus-simulator-eliminates-bit-pattern-generation <div class="node-body article-body">The DDR Bus Simulator quickly generates accurate bit-error-rate (BER) contours using statistical simulation.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-generators/ddr-bus-simulator-eliminates-bit-pattern-generation" target="_blank">read more</a></p> http://mwrf.com/test-measurement-generators/ddr-bus-simulator-eliminates-bit-pattern-generation#comments News Test & Measurement - generators Fri, 03 Oct 2014 15:36:00 +0000 28901 at http://mwrf.com Agile Signal Generator Delivers Reliable Switching in Complex Simulations http://mwrf.com/test-measurement-generators/agile-signal-generator-delivers-reliable-switching-complex-simulations <div class="node-body article-body">Keysight’s latest UXG agile signal generator can switch frequency, amplitude, and phase settings in as little as 250 ns, creating realistic multi-threat simulations.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/test-measurement-generators/agile-signal-generator-delivers-reliable-switching-complex-simulations" target="_blank">read more</a></p> http://mwrf.com/test-measurement-generators/agile-signal-generator-delivers-reliable-switching-complex-simulations#comments News Test & Measurement - generators Fri, 03 Oct 2014 15:03:00 +0000 28831 at http://mwrf.com Characterization Softwares For Your RF/Microwave Devices http://mwrf.com/systems/characterization-softwares-your-rfmicrowave-devices <div class="field-deck"> Burdened by the challenge of characterizing the latest devices, engineers are looking for solutions to streamline their test processes, analysis, and data management. </div> <div class="node-body article-body">Testing RF/microwave/millimeter-wave devices under a wide operation range for characterization can be time consuming and error prone. Fortunately, companies are forging software/hardware solutions to aid and even automate this process.</div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/systems/characterization-softwares-your-rfmicrowave-devices" target="_blank">read more</a></p> http://mwrf.com/systems/characterization-softwares-your-rfmicrowave-devices#comments Commercial Defense Systems Test & Measurement - analyzers Test & Measurement - generators Wed, 10 Sep 2014 19:22:00 +0000 28331 at http://mwrf.com What Software Do You Use To Characterize Your Devices? http://mwrf.com/software/what-software-do-you-use-characterize-your-devices <div class="node-body gallery-body">The task of testing and characterizing RF/microwave/millimeter-wave devices is growing increasingly more complex and time consuming. These new devices need to be characterized so that statistical models can be developed for sophisticated system and circuit design software. </div> <div class="og_rss_groups"></div><p><a href="http://mwrf.com/software/what-software-do-you-use-characterize-your-devices" target="_blank">read more</a></p> http://mwrf.com/software/what-software-do-you-use-characterize-your-devices#comments Commercial Industrial Software Test & Measurement Test & Measurement - analyzers Test & Measurement - generators Tue, 09 Sep 2014 18:48:00 +0000 28291 at http://mwrf.com