Among its many products on display at the 2013 IMS, Analog Devices supplied examples of its high-performance RF detectors, with dynamic ranges as wide as 100 dB at frequencies to 40 GHz.
Analog Devices brought application circuit examples of its high-speed digital-to-analog converters (DACs) for visitors to its booth at the 2013 IMS in Seattle, WA.
Analog Devices’ ADF 4351 EB1Z evaluation board was on display at the 2013 IMS. The clock and timer evaluation board is aimed at developers of RF/microwave fractional-N and integer-N frequency synthesizers.
Analog Devices brought plenty of test equipment to the 2013 IMS to show off the capabilities of its many integrated circuits, including this PXI-based test system from National Instruments.
With the help of test equipment from National Instruments, Analog Devices was able to show the performance of one of its synthesizer ICs at the 2013 IMS, this unit producing a low-phase-noise signal centered at 110 MHz.
At the 2013 IMS, Analog Devices touted the use of its high-speed digital-to-analog converters (ADCs) for generating low-noise output signals through 4.2 GHz.
Analog Devices boasts a wide array of integrated circuits (ICs) for RF and microwave applications, including many that incorporate several of the functions needed for receivers, such as oscillators, mixers, and amplifiers.
Analog Devices showcased and demonstrated their latest products at the International Microwave Symposium 2013 in Seattle, WA.
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