Testing RF/microwave/millimeter-wave devices under a wide operation range for characterization can be time consuming and error prone. Fortunately, companies are forging software/hardware solutions to aid and even automate this process....More
The task of testing and characterizing RF/microwave/millimeter-wave devices is growing increasingly more complex and time consuming. These new devices need to be characterized so that statistical models can be developed for sophisticated system and circuit design software.
Modern Vector Network Analyzer (VNA) architectures such as those based on Nonlinear Transmission Line (NLTL) samplers and distributed harmonic generators now offer a beneficial alternative to traditional sampling VNAs....More
This year’s IMS showcased everything from digital-to-analog converters to gallium nitride power amplifiers and everything in between. Click through the gallery to see the latest devices on display for use across microwave and RF markets.
The flagship symposium of this year’s Microwave Week, IMS 2014, will feature over 575 companies and include a full schedule with 160 technical sessions. Click through the gallery to preview some of the new devices that will be on display.
New App Note: Best Practices for Making the Most Accurate Radar Pulse Measurements Sponsored by Agilent Technologies Download this app note
Agilent Technologies Complex Modulation Generation with Low Cost Arbitrary Waveform Generators - Agilent's Trueform Architecture for Wireless Applications
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