Among its many test setups at the 2013 IMS, Tektronix showed how to characterize devices for use in 60-GHz IEEE 802.11ad wireless-local-area-network (WLAN) applications at 60 GHz.
In addition to its IEEE 802.11ad live test demo at the 2013 IMS, Tektronix also showed test systems for checking radar and electronic-warfare (EW) components and systems as well as test gear for hunting transient interference signals in the field.
As part of Tektronix’s 60-GHz IEEE 802.11ad wireless-local-area-network (WLAN) test setup at the 2013 IMS, the firm’s model DSA 73304D digital signal analyzer (DSA) worked with the aid of the SignalVu software to show signal quality.
As part of its radar and EW test system at the 2013 IMS, Tektronix leveraged the measurement capabilities of its model AWG70001A Arbitrary Waveform Generator (AWG).
Tektronix showed its model AWG70001A Arbitrary Waveform Generator (AWG) at their 2013 IMS booth, an instrument capable of producing carriers to 20 GHz via sample rates to 50 GSamples/s.
Of the many different measurement tools at the 2013 IMS, Tektronix provided demonstrations of its model DPO73304D Digital Phosphor Oscilloscope (DPO), a four-channel oscilloscope with 33-GHz bandwidth and 100 GSamples/s sampling on two channels.
Tektronix used one of its real-time spectrum analyzers at the 2013 IMS to track down interference by scanning the spectrum in real time, and using the analyzer’s built-in data bases to simplify the classification of detected signals.
Tektronix showcased and demonstrated their latest products at the International Microwave Symposium 2013 in Seattle, WA.
Sponsored Introduction Continue on to (or wait seconds) ×